Regarding to a fiber-reinforced material formed by deforming a reinforcing material composed of a plurality of fiber layers from an initial shape and molding into a predetermined shape, an identification device, an identification method, and an identification program generate a first data in which a physical quantity distribution inside the fiber-reinforced material is mapped to the initial shape, perform binarization of the first data to generate a second data in which a label identifying the fiber layer is mapped to the initial shape, and map the second data to a predetermined shape, based on a deformation data.

Provided are a moisture detection sensor, a defect detection sensor, and a sensor array using the same that make use of moisture-sensitive compounds reversibly reacting to water (moisture) to emit fluorescence, thereby reversibly sensing the moisture within a short period of time and also providing a high degree of sensitivity even to an extremely small quantity of moisture. The moisture detection sensor includes one or more moisture-sensitive compounds selected from the group consisting of Calcein, Calcein-AM (Calcein acetoxymethyl ester), and Calcein blue.

A strain inspection device of a printed circuit board (PCB) which is easily cracked or damaged by external pressure (force) applied to the PCB while the PCB is being assembled, and an attaching method thereof. The strain inspection device of a printed circuit board (PCB) includes a fixing member; and a damage indicator fixed to the PCB by the fixing member, having a crack guide through hole, and cracked or damaged along a corner of the crack guide through hole due to deformation of the PCB.

The present invention provides a method for evaluating a semiconductor wafer concerning a breaking strength of a notch portion of the semiconductor wafer, comprising: applying a load to a notch portion of the semiconductor wafer to be evaluated toward the center of the wafer such that the notch portion of the semiconductor wafer is broken; and evaluating the breaking strength of the notch portion. The present invention provides a method and an apparatus for evaluating a semiconductor wafer that can evaluate the breaking strength of a notch portion of a semiconductor wafer with higher precision and higher sensitivity.

A method for predicting the electrical functionality of a semiconductor package, the method includes performing a first stiffness test for a first semiconductor package, receiving failure data for the first semiconductor package, the failure data includes results of an electrical test performed after the first semiconductor package is assembled on a printed circuit board, generating a database comprising results of the first stiffness test as a function of the failure data for the first semiconductor package, performing a second stiffness test for a second semiconductor package, identifying a unique result from the results of the first stiffness test in the database, the unique result aligns with a result of the second stiffness test, and predicting a failure data for the second semiconductor package based on the failure data for the first semiconductor package which corresponds to the unique result of the first stiffness test identified in the database.

Embodiments are generally directed to air bladder based mechanical testing for stretchable electronics. An embodiment of a system includes an inflatable bladder to apply mechanical force to a stretchable electronics device by the inflation and deflation of the inflatable bladder; a valve unit to control fluid pressure applied to the inflatable bladder; and a control unit to control inflation and deflation of the inflatable bladder.

A fluorescent liquid penetrant is provided which includes a liquid medium having a plurality of fluorophores disposed therein. Upon excitation with a suitable light source, the penetrant exhibits a quantum yield greater than 40% (or in some embodiments, greater than 90%). In some embodiments, the fluorophore is a low-toxicity quantum dot. In some embodiments, the fluorophore has significantly reduced self-absorption, which allows for surface discontinuity depth measurement. Also disclosed are apparatuses for using these fluorescent liquid penetrants for non-destructive testing purposes. In some embodiments, these tests include measuring the depth of a discontinuity by analyzing photoluminescence intensity and/or photoluminescence peak position shift.

A measurement system is presented configured for integration with a processing equipment for applying optical measurements to a structure. The measurement system comprises: a support assembly for holding a structure under measurements in a measurement plane, configured and operable for rotation in a plane parallel to the measurement plane and for movement along a first lateral axis in said measurement plane; an optical system defining illumination and collection light channels of normal and oblique optical schemes and comprising an optical head comprising at least three lens units located in the illumination and collection channels; a holder assembly comprising: a support unit for carrying the optical head, and a guiding unit for guiding a sliding movement of the support unit along a path extending along a second lateral axis perpendicular to said first lateral axis; and an optical window arrangement comprising at least three optical windows made in a faceplate located between the optical head at a certain distance from the measurement plane. The optical windows are aligned with the illumination and collection channels for, respectively, propagation of illuminating light from the optical head and propagation of light returned from an illuminated region to the optical head, in accordance with the normal and oblique optical schemes.

A valence of a target element of a sample and crystallinity of a sample can be detected with a small device. The analysis device 100 includes: a placement holder 110 for placing a sample S; an X-ray source 11 for irradiating the sample S with X-rays; a first detector 141 for detecting characteristic X-rays generated from the sample S by the irradiation of the X-rays; a second detector 142 for detecting X-rays diffracted by the sample; and a signal processing device 20. The signal processing device 20 detects the valence of the target element of the sample based on the characteristic X-rays detected by the first detector 141, and detects the crystallographic data of the sample based on the X-rays detected by the second detector 142.

A centrifugation approach used to accelerate current empirical methods used to investigate silicone drainage in syringes is disclosed. A siliconized syringe is placed into a holder of a centrifuge in a predefined orientation. Centrifugation of the syringe is activated at a predetermined G rate and for a period of intended simulation time and is ended as that time elapses. The time can be a function of intended simulation time, acceleration due to gravity, square of centrifuge revolution rate, and distance from center of rotor hub to matching point on the syringe barrel. One or more injection functionality parameters of the syringe is assessed after the elapsed period of time. A bucket fixture for retaining one or more syringes in the predefined orientation is also disclosed.