Patent classifications
G01N2033/0078
PRODUCT INDEX MECHANISM AND PRODUCT INSPECTION SYSTEM
A product index mechanism for a product inspection system includes a material strip driving wheel and an index structure driving wheel. The material strip driving wheel engages with a material strip carrying a plurality of products to be inspected by an inspection device of the product inspection system. The driving wheel drives the material strip to move. The index structure driving wheel rotates synchronously with the material strip driving wheel and includes a plurality of product index structures thereon. As a product on the material strip is moved by the material strip driving wheel to an inspection position of the inspection device, one product index structure on the index structure driving wheel is rotated to a trigger position corresponding to a trigger of the inspection system. Activation of the trigger transmits a trigger signal to the inspection device to inspect the product.
DEFECT INSPECTION DEVICE
Disclosed is a defect inspection device according to an embodiment of the present disclosure. The defect inspection device includes: a robot arm including a hold unit for holding an object and a driving unit for moving the object; a first camera unit photographing an exterior of the object; an illumination unit irradiating light to the exterior of the object; and a control unit determining whether there is a defect in the object based on an image of the object photographed by the first camera unit.
ABNORMALITY SCORE CALCULATION APPARATUS, METHOD, AND MEDIUM
An abnormality score calculation apparatus according to an embodiment includes a processing circuit configured to: acquire first data concerning a status of a product or a manufacturing process; calculate based on the first data an abnormality score for a respective one of a plurality of abnormality modes or for a respective one of a plurality of pieces of the first data of various types; and convert a scale of a respective one of a plurality of abnormality scores including the abnormality score in such a manner that the abnormality scores become substantially equal in occurrence degree.
Comolded non-destructive inspection standard functioning as a bond bump
An inspection feature for an adhesive bond portion between parts of a component comprising the inspection feature extending from a surface of the part of the component a predetermined bond line thickness, the inspection feature having a density configured to imitate a defect of the adhesive bond portion responsive to a non-destructive inspection scan.
EVAPORATION CLOSED CHAMBER FOR DETECTING HAZARDOUS SUBSTANCE
An evaporation closed chamber for detecting hazardous substance, having a closed chamber, an orifice plate, a pressure plate, a drive device and an elastic film, the orifice plate is mounted on any surface(s) of the closed chamber, the elastic film is arranged on the outer side of the orifice plate, the pressure plate is arranged on the outer side of the elastic film, and the drive device is in transmission connection with the pressure plate to drive the pressure plate to move forwards and backwards to press the elastic film against the orifice plate. The elastic film expands with the increase of internal temperature of the closed chamber and shrinks with the temperature decrease of the closed chamber such that the gas in the closed chamber can be timely compensated; the orifice plate prevents hazardous substance from leaving on the gas compensation device to influence test accuracy.
BENDING TEST DEVICE OF FLEXIBLE DISPLAY PANEL
This disclosure relates to flexible display screen testing technology. A bending test device for a flexible display panel is provided. The bending test device includes a first bracket, a second bracket disposed in parallel to a side of the first bracket, and at least two first carriers laminated between the first bracket and the second bracket. Each of the first carriers is configured for bending and carrying a flexible display panel. The bending test for a plurality of flexible display panels can be simultaneously performed by laminating the first carrier.
Apparatus and method for performing an impact excitation technique
The invention pertains to an apparatus for analyzing a mechanical vibratory response of a solid material sample, the apparatus comprising: an array of impactors arranged to impart an impact on respective well-defined points on the surface of said solid material sample; a sensor configured to capture said mechanical vibratory response as a time-varying signal, subsequent to an impact of said at least one impactor; and processing means configured to analyze said time-varying signal to determine the frequencies and decay constants of sinusoids making up said time-varying signal. The invention also pertains to a corresponding method of characterizing a solid material sample.
SYSTEM AND METHOD FOR CALIBRATING INSPECTION OF A FEATURE ON A PART
Methods and systems for calibrating inspection of a feature on a part are described. The method comprises acquiring, at a plurality of point cloud densities, measurement data from a reference part having a known defect associated with the feature; assessing the measurement data at the plurality of point cloud densities to detect the known defect; determining a lowest point cloud density from the plurality of point cloud densities at which the known defect is detectable; and setting an inspection point cloud density for inspection of the feature to the lowest point cloud density.
COMOLDED NON-DESTRUCTIVE INSPECTION STANDARD FUNCTIONING AS A BOND BUMP
An inspection feature for an adhesive bond portion between parts of a component comprising the inspection feature extending from a surface of the part of the component a predetermined bond line thickness, the inspection feature having a density configured to imitate a defect of the adhesive bond portion responsive to a non-destructive inspection scan.
APPARATUS AND METHOD FOR PERFORMING AN IMPACT EXCITATION TECHNIQUE
The invention pertains to an apparatus for analyzing a mechanical vibratory response of a solid material sample, the apparatus comprising: an array of impactors arranged to impart an impact on respective well-defined points on the surface of said solid material sample; a sensor configured to capture said mechanical vibratory response as a time-varying signal, subsequent to an impact of said at least one impactor; and processing means configured to analyze said time-varying signal to determine the frequencies and decay constants of sinusoids making up said time-varying signal. The invention also pertains to a corresponding method of characterizing a solid material sample.