Patent classifications
B22F12/45
Radiation method for additive manufacturing
A method for manufacturing a three-dimensional object by solidifying selected areas of consecutive powder layers is provided. At least one electron beam successively irradiates predetermined sections of each powder layer by moving an interaction region in which the electron beam interacts with the powder layer. Electromagnetic radiation from a radiation source is directed onto the powder layer to reduce local electrostatic charging in the interaction region. In this way, levitation and scattering of charged powder will be avoided.
Melt pool monitoring system and method for detecting errors in a multi-laser additive manufacturing process
A system and method of monitoring a powder-bed additive manufacturing process using a plurality of energy sources is provided. A layer of additive powder is deposited on a powder bed and is fused using a first energy source, a second energy source, or any other suitable number of energy sources. The electromagnetic energy emissions at a first melt pool are monitored by a melt pool monitoring system and recorded as raw emission signals. The melt pool monitoring system may also monitor emissions from the powder bed using off-axis sensors or from a second melt pool using on-axis sensors, and these emissions may be used to modify the raw emission signals to generate compensated emission signals. The compensated emission signals are analyzed to identify outlier emissions and an alert may be provided or a process adjustment may be made when outlier emissions exceed a predetermined signal threshold.
METHOD OF APPLYING A PLURALITY OF ENERGY BEAMS IN ADDITIVE MANUFACTURING
A method of applying a plurality of energy beams in the additive manufacture of a component includes a) providing a first and a second energy beam, each set up for the irradiation of a layer of a powder bed, wherein the first beam scans over a first irradiation area and the second beam scans over a second irradiation area, wherein the first and second irradiation areas are substantially arranged adjacent to each other and form part of a manufacturing plane, and b) assigning a scan vector to be scanned in the first irradiation area by the second energy beam, when a melt pool generated by the second energy beam during the scan of the vector is expected to cause less overlap with a powder bed outside of the component's geometry than a melt pool generated by the first energy beam would cause during the scan of the vector.
METHOD OF APPLYING A PLURALITY OF ENERGY BEAMS IN ADDITIVE MANUFACTURING
A method of applying a plurality of energy beams in the additive manufacture of a component includes a) providing a first and a second energy beam, each set up for the irradiation of a layer of a powder bed, wherein the first beam scans over a first irradiation area and the second beam scans over a second irradiation area, wherein the first and second irradiation areas are substantially arranged adjacent to each other and form part of a manufacturing plane, and b) assigning a scan vector to be scanned in the first irradiation area by the second energy beam, when a melt pool generated by the second energy beam during the scan of the vector is expected to cause less overlap with a powder bed outside of the component's geometry than a melt pool generated by the first energy beam would cause during the scan of the vector.
METHOD OF APPLYING A PLURALITY OF ENERGY BEAMS IN ADDITIVE MANUFACTURING
A method of applying a plurality of energy beams in the additive manufacture of a component includes a) providing a first and a second energy beam, each set up for the irradiation of a layer of a powder bed, wherein the first beam scans over a first irradiation area and the second beam scans over a second irradiation area, wherein the first and second irradiation areas are substantially arranged adjacent to each other and form part of a manufacturing plane, and b) assigning a scan vector to be scanned in the first irradiation area by the second energy beam, when a melt pool generated by the second energy beam during the scan of the vector is expected to cause less overlap with a powder bed outside of the component's geometry than a melt pool generated by the first energy beam would cause during the scan of the vector.
ADDITIVE MANUFACTURING WITH UNIFORM PROPERTY DISTRIBUTIONS
In one example in accordance with the present disclosure, an additive manufacturing device is described. The additive manufacturing device includes a build material distributor to deposit layers of powdered build material onto a bed. At least one energy source selectively fuses portions of the layer of powdered build material to form a slice of a three-dimensional (3D) printed object. A detailing agent distributor of the additive manufacturing device generates a uniform property distribution across a portion of the layer of powdered build material by depositing a detailing agent.
DEVICES, SYSTEMS, AND METHODS FOR USING AN IMAGING DEVICE TO CALIBRATE AND OPERATE A PLURALITY OF ELECTRON BEAM GUNS IN AN ADDITIVE MANUFACTURING SYSTEM
Calibration systems, additive manufacturing systems employing the same, and methods of calibrating include a plurality of electron beam guns. One calibration system includes an imaging device positioned to capture one or more images of an impingement of electron beams emitted from the plurality of electron beam guns on a surface within a build chamber of the electron beam additive manufacturing system and an analysis component communicatively coupled to the imaging device. The analysis component is programmed to receive image data corresponding to the one or more images, determine one or more calibration parameters from the image data, and transmit one or more instructions to the plurality of electron beam guns in accordance with the one or more calibration parameters.
DEVICES, SYSTEMS, AND METHODS FOR USING AN IMAGING DEVICE TO CALIBRATE AND OPERATE A PLURALITY OF ELECTRON BEAM GUNS IN AN ADDITIVE MANUFACTURING SYSTEM
Calibration systems, additive manufacturing systems employing the same, and methods of calibrating include a plurality of electron beam guns. One calibration system includes an imaging device positioned to capture one or more images of an impingement of electron beams emitted from the plurality of electron beam guns on a surface within a build chamber of the electron beam additive manufacturing system and an analysis component communicatively coupled to the imaging device. The analysis component is programmed to receive image data corresponding to the one or more images, determine one or more calibration parameters from the image data, and transmit one or more instructions to the plurality of electron beam guns in accordance with the one or more calibration parameters.
DEVICES, SYSTEMS, AND METHODS FOR CALIBRATING AND OPERATING AN ADDITIVE MANUFACTURING SYSTEM HAVING A PLURALITY OF ELECTRON BEAM GUNS
Devices, systems and methods for calibrating and operating an additive manufacturing system are disclosed. A calibration system for an electron beam additive manufacturing system having a plurality of electron beam guns includes a calibration probe positioned in a build chamber of the electron beam additive manufacturing system, a sensing device positioned to measure and acquire a response generated as a result of impingement of electron beams emitted from the plurality of electron beam guns on the calibration probe, the sensing device generating a response signal as a result of the measured and acquired response, and an analysis component communicatively coupled to the sensing device and programmed to analyze and evaluate the response signal.
DEVICES, SYSTEMS, AND METHODS FOR CALIBRATING AND OPERATING AN ADDITIVE MANUFACTURING SYSTEM HAVING A PLURALITY OF ELECTRON BEAM GUNS
Devices, systems and methods for calibrating and operating an additive manufacturing system are disclosed. A calibration system for an electron beam additive manufacturing system having a plurality of electron beam guns includes a calibration probe positioned in a build chamber of the electron beam additive manufacturing system, a sensing device positioned to measure and acquire a response generated as a result of impingement of electron beams emitted from the plurality of electron beam guns on the calibration probe, the sensing device generating a response signal as a result of the measured and acquired response, and an analysis component communicatively coupled to the sensing device and programmed to analyze and evaluate the response signal.