A semiconductor device fabrication method includes forming a substrate having first and second regions therein, with different densities of active regions in the first and second regions. A cell trench is formed, which defines cell active regions in the first region, and a peripheral trench is formed, which defines peripheral active regions in the second region. A first insulating layer is formed in the cell trench and the peripheral trench. A mask is selectively formed, which covers the first insulating layer in the first region and exposes the first insulating layer in the second region. A second insulating layer is formed on the first insulating layer in the second region exposed by the mask, using a selective dielectric-on-dielectric deposition process. The first insulating layer is exposed in the first region by removing the mask. A third insulating layer is formed on the first insulating layer in the first region and on the second insulating layer in the second region.

A chip package includes a semiconductor substrate, a conductive pad, an isolation layer, and a redistribution layer. The semiconductor substrate has a first surface, a second surface facing away from the first surface, a through hole through the first and second surfaces, and a recess in the first surface. The conductive pad is located on the second surface of the semiconductor substrate and in the through hole. The isolation layer is located on the second surface of the semiconductor substrate and surrounds the conductive pad. The redistribution layer is located on the first surface of the semiconductor substrate, and extends into the recess, and extends onto the conductive pad in the through hole.

Semiconductor devices and corresponding methods of manufacture are disclosed. The method may include forming a first hardmask layer over a substrate. The method may include forming a second hardmask layer over the first hardmask layer. The method may include transferring a pattern from the second hardmask layer to the first hardmask layer, wherein the pattern in the first hardmask layer comprises a plurality of protruding structures, and each of the plurality of protruding structures has respective portions of its two sidewalls extending toward each other. The method may include depositing a modification layer extending along at least the respective portions of the sidewalls of each of the protruding structures. The method may include etching the substrate with the protruding structures and the modification layer both serving as a mask.

First lithography and etching are carried out on a semiconductor structure to provide a first intermediate semiconductor structure having a first set of surface features corresponding to a first portion of desired fin formation mandrels. Second lithography and etching are carried out on the first intermediate structure, using a second mask, to provide a second intermediate semiconductor structure having a second set of surface features corresponding to a second portion of the mandrels. The second set of surface features are unequally spaced from the first set of surface features and/or the features have different pitch. The fin formation mandrels are formed in the second intermediate semiconductor structure using the first and second sets of surface features; spacer material is deposited over the mandrels and is etched back to form a third intermediate semiconductor structure having a fin pattern. Etching is carried out on same to produce the fin pattern.

A material for forming an organic film, containing: (A) compound represented by formula (1A); and (B) organic solvent, where W.sub.1 represents n1-valent organic group, n1 represents integer of 2 to 4, X.sub.1 represents group represented by formula (1B), n2 represents 1 or 2, and R.sub.1 represents any group represented by formulae (1C). A compound for forming organic film that cures under film formation conditions in inert gas as well as in air, and makes it possible to form organic film that has heat resistance, properties of filling and planarizing pattern formed in substrate, and favorable film-formability on and adhesiveness to substrate; material for forming organic film, containing compound; substrate for manufacturing semiconductor device including material; method for forming organic film, using material; patterning process using material; and aromatic carboxylic anhydride having crosslinkable moiety, expected to be an industrially useful raw material such as electronic materials and aerospace materials.

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A method includes forming a mask over a semiconductor layer. The method includes first patterning the mask to form a first opening that exposes a first portion of the semiconductor layer. The method includes performing a plasma treatment to form a surface modification layer over the exposed first portion. The method includes second patterning the mask to form a second opening that exposes a second portion of the semiconductor layer, thereby forming a patterned mask that defines the first and second openings. The method includes performing an etching process to the semiconductor layer through the patterned mask to form a first trench extending from the first opening and a second trench extending from the second opening. The etching process removes the first portion at a first rate and the second portion at a second rate that is greater than the first rate.

A method for manufacturing a semiconductor structure is provided. A first mask layer and a photoresist layer are formed over a substrate, wherein photosensitivities of the photoresist layer and the first mask layer are different. A first and a second opening are formed, wherein the first mask layer overlapped by the second opening is degraded to form a second mask layer. The substrate exposed by the first opening is partially removed to form a first recess of the substrate. The second mask layer is removed to form a third opening through the first mask layer. A first dielectric layer is formed, wherein the first dielectric layer fills the first recess and the third opening and covers the substrate overlapped by the third opening. A patterning operation is performed on the substrate using the first dielectric layer as a mask, and a second recess of the substrate is thereby formed.

The disclosure provides a method of patterning a semiconductor structure. A first composite substrate including first spacers on a first substrate and a second composite substrate including second spacers on a second substrate are received. The second composite substrate is disposed on the first composite substrate, in which at least one of the first spacers is in direct contact with at least one of the second spacers. Spaces between the first spacers and the second spacers are filled with a directed self-assembly material, in which the directed self-assembly material includes first portions between the first spacers and the second substrate, second portions between the second spacers and the first substrate, and third portions being remaining portions. The second composite substrate, the first spacers, and the first portions and the second portions are removed. Oxide layers are filled between the third portions. The third portions are removed.

A method includes providing a semiconductor substrate and forming a dielectric layer over the semiconductor substrate. The method includes forming a metal layer over the dielectric layer. The method includes forming a patterned mask over the metal layer. The method includes performing a first etching process using a first etchant to form metal patterns separated by trenches in the metal layer. The method further includes performing a second etching process using a second etchant and a passivant to extend the trenches in the dielectric layer, resulting in a passivation layer formed along sidewalls of the metal patterns.

A manufacturing method of a semiconductor device includes depositing a first bilayer structure over a substrate, in which the first bilayer structure includes a silicon oxide layer and a silicon nitride layer over the silicon nitride layer; forming a first carbonaceous hard mask on the first bilayer structure; forming a second bilayer structure on the first carbonaceous hard mask; forming a mask stack of alternating anti-reflecting coating (ARC) hard masks and second carbonaceous hard masks on the second bilayer structure; and coating a photoresist on the mask stack.