An electronic device includes a substrate having first and second conductive traces, a semiconductor die having a transistor with a first terminal and a second terminal, and first and second metal clips. The first metal clip has a first end portion coupled to the first terminal of the transistor, and a second end portion coupled to the first conductive trace of the substrate. The second metal clip has a first end portion coupled to the second terminal of the transistor and a second end portion coupled to the second conductive trace of the substrate, and a middle portion of the second metal clip is spaced apart from and at least partially overlying a portion of the first metal clip.

A transistor package includes a transistor chip having opposing first and second main sides, and a first load electrode and a second load electrode on the first main side, with a carrier facing the second main side. A first terminal post is arranged laterally beside the transistor chip. A second terminal post is arranged laterally beside the transistor chip on an opposite side. A first clip connects the first load electrode to the first terminal post. A second clip connects the second load electrode to the second terminal post. At least one of the clips includes a first contact element which projects from a first side wall of the clip and is bent downwards in a direction towards the transistor chip to electrically contact the first or second load electrode of the chip, a bending axis being in a longitudinal direction of the clip.

A semiconductor device includes a first lead including a base portion, a semiconductor element mounted on one side in a thickness direction of the base portion and having a first electrode disposed on the one side in the thickness direction and a second electrode disposed on the other side in the thickness direction, a second lead spaced apart from the base portion in a first direction orthogonal to the thickness direction, a first conductive member including a first portion bonded to the first electrode and a second portion bonded to the second lead and electrically connected to the first electrode and the second lead, a first bonding layer interposed between, and bonded to the base portion and the second electrode, and a second bonding layer interposed between, and bonded to the first electrode and the first portion. The first bonding layer includes a sintered metal.

According to one embodiment, a semiconductor device includes the following structure. The semiconductor chip is provided between first and second conductors. A joint component is provided between the chip and the second conductor. The thin film is provided on the second conductor and contains a material different from a material of the joint component. The second conductor includes first, second and third plates. The first plate extends in a first direction along a first surface of the chip and is connected to the chip via the joint component. The second plate extends from the first plate obliquely with respect to the first direction. The third plate extends from the second plate in the first direction. The thin film is arranged on a surface of the second plate continuous from a surface on which the joint component is provided.

A semiconductor device includes a semiconductor element having a first electrode and a second electrode, a first conductive member being located on a first side in a thickness direction with respect to the first electrode and having a first reverse surface to face a second side in the thickness direction, a second conductive member being located on the first side in the thickness direction with respect to the second electrode and having a second reverse surface to face the second side in the thickness direction, a first conductive bonding material interposed between the first electrode and the first reverse surface and bonded to the first electrode and the first conductive member, and a second conductive bonding material interposed between the second electrode and the second reverse surface and bonded to the second electrode and the second conductive member. An area of the second reverse surface is smaller than an area of the first reverse surface. A distance between the second electrode and the second reverse surface in the thickness direction is smaller than a distance between the first electrode and the first reverse surface in the thickness direction.