An integrated circuit has fuses that are selectively configurable by laser light having a wavelength incident on the fuses. A substrate of the integrated circuit has circuitry thereon. Fuses are disposed vertically above at least a portion of the circuitry. A dielectric reflector is disposed vertically above and laterally covers at least a portion of the circuitry. The dielectric reflector has a plurality of alternating dielectric layers of different refractive indices and is disposed adjacent to the fuses. The dielectric reflector is configured to reflect at least a portion of the laser light at the wavelength incident thereto.

A semiconductor device includes a device under test, and a protection circuit electrically connected to the device under test, the protection circuit including: a protective diode, and a laser fuse configured to, upon receiving a laser pulse via an opening, break an electrical path of the protective diode and he device under test.