An operation method of a heater device with a memory unit, wherein the heater device includes a plurality of heater circuits, each of the plurality of heater circuits includes a first transistor and a second transistor. In a burning mode, selectively turning on at least one of the first transistors according to a first signal, so that a first current generated by voltage signals coupled to two terminals of the first transistor passes through the memory unit. In a reading mode, sequentially turning on the first transistors to determine states of the memory units. In a heating mode, selectively turning on at least one of the second transistors according to a second signal, so that a second current generated by voltage signals coupled to two terminals of the second transistor passes through a heater.

Provided is a recording element substrate, including: an ejection module including a heat generating resistive element; a current detection circuit including a current detection resistor connected in series between the heat generating resistive element and a voltage application terminal for applying voltage from a power supply to the heat generating resistive element, and a voltage detector for detecting a differential voltage at each end of the current detection resistor; an ejection circuit provided between the voltage application terminal and the heat generating resistive element, for applying voltage for causing the heat generating resistive element to generate heat from the voltage application terminal to the heat generating resistive element; and a control circuit for selecting any one of the current detection circuit and the ejection circuit.

A technique by which deterioration of a heat resistor can be detected more accurately is provided. There are included a printing head configured to eject an ink from a nozzle provided so that the nozzle corresponds to a heat resistor and perform printing by applying a pulse voltage to the heat resistor; an obtaining unit configured to obtain a prediction resistance value of the heat resistor according to a unique value of the heat resistor and a setting value to drive the heat resistor; a measurement unit configured to measure the resistance value of the heat resistor; and a determination unit configured to determine based on the prediction resistance value and the resistance value whether deterioration arises in the heat resistor.