Patent classifications
C09D127/22
FLUORINATED COPOLYMER HAVING SULFONYL PENDANT GROUPS AND COMPOSITIONS AND ARTICLES INCLUDING THE SAME
The copolymer includes divalent units represented by formula [CF.sub.2CF.sub.2], divalent units represented by formula: and one or more divalent units independently represented by formula: The copolymer has an SO.sub.2X equivalent weight in a range from 300 to 2000. A polymer electrolyte membrane that includes the copolymer and a membrane electrode assembly that includes such a polymer electrolyte membrane are also provided.
FLUORINATED COPOLYMER HAVING SULFONYL PENDANT GROUPS AND COMPOSITIONS AND ARTICLES INCLUDING THE SAME
The copolymer includes divalent units represented by formula [CF.sub.2CF.sub.2], divalent units represented by formula: and one or more divalent units independently represented by formula: The copolymer has an SO.sub.2X equivalent weight in a range from 300 to 2000. A polymer electrolyte membrane that includes the copolymer and a membrane electrode assembly that includes such a polymer electrolyte membrane are also provided.
LOW STRESS MOISTURE RESISTANT STRUCTURE OF SEMICONDUCTOR DEVICE
A low stress moisture resistant structure of semiconductor device comprises a low stress moisture resistant layer, wherein a semiconductor device is formed on a semiconductor wafer, the semiconductor device comprises at least one pad, the low stress moisture resistant layer is coated on the semiconductor device and the semiconductor wafer so that a pad top center surface of the pad is exposed. The low stress moisture resistant layer comprises a material comprising crosslinked fluoropolymer. A before-coated stress measured on the semiconductor wafer before the low stress moisture resistant layer is coated and an after-cured stress measured on the semiconductor wafer after the low stress moisture resistant layer is coated and cured define a stress difference, the stress difference is greater than or equal to 510.sup.7 dyne/cm.sup.2 and less than or equal to 510.sup.7 dyne/cm.sup.2.
LOW STRESS MOISTURE RESISTANT STRUCTURE OF SEMICONDUCTOR DEVICE
A low stress moisture resistant structure of semiconductor device comprises a low stress moisture resistant layer, wherein a semiconductor device is formed on a semiconductor wafer, the semiconductor device comprises at least one pad, the low stress moisture resistant layer is coated on the semiconductor device and the semiconductor wafer so that a pad top center surface of the pad is exposed. The low stress moisture resistant layer comprises a material comprising crosslinked fluoropolymer. A before-coated stress measured on the semiconductor wafer before the low stress moisture resistant layer is coated and an after-cured stress measured on the semiconductor wafer after the low stress moisture resistant layer is coated and cured define a stress difference, the stress difference is greater than or equal to 510.sup.7 dyne/cm.sup.2 and less than or equal to 510.sup.7 dyne/cm.sup.2.
Functionalised fluorinated copolymers
The invention relates to a fluorinated copolymers which are particularly based on vinylidene fluoride (VDF) or trifluoroethylene (TrFE) and particularly functionalized by functional and/or functionizable vinyl ethers. The invention also relates to methods for producing said copolymers, and to the applications thereof.
Functionalised fluorinated copolymers
The invention relates to a fluorinated copolymers which are particularly based on vinylidene fluoride (VDF) or trifluoroethylene (TrFE) and particularly functionalized by functional and/or functionizable vinyl ethers. The invention also relates to methods for producing said copolymers, and to the applications thereof.
FLUOROPOLYMER DISPERSION, METHOD FOR MAKING THE FLUOROPOLYMER DISPERSION, CATALYST INK AND POLYMER ELECTROLYTE MEMBRANE
The fluoropolymer dispersion includes a copolymer having divalent units represented by formula [CF.sub.2CF.sub.2], divalent units represented by formula: [Formula should be inserted here], and one or more divalent units independently represented by formula: [Formula should be inserted here] dispersed in at least one of water or organic solvent. Methods of making the fluoropolymer dispersion and methods of using the fluoropolymer to make a at least one of a catalyst ink or polymer electrolyte membrane are also provided.
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FLUOROPOLYMER DISPERSION, METHOD FOR MAKING THE FLUOROPOLYMER DISPERSION, CATALYST INK AND POLYMER ELECTROLYTE MEMBRANE
The fluoropolymer dispersion includes a copolymer having divalent units represented by formula [CF.sub.2CF.sub.2], divalent units represented by formula: [Formula should be inserted here], and one or more divalent units independently represented by formula: [Formula should be inserted here] dispersed in at least one of water or organic solvent. Methods of making the fluoropolymer dispersion and methods of using the fluoropolymer to make a at least one of a catalyst ink or polymer electrolyte membrane are also provided.
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Fluoropolymer film
The present invention pertains to a fluoropolymer film comprising at least one fluoropolymer hybrid organic/inorganic composite [polymer (FH)], to a process for the manufacture of said fluoropolymer film and to uses of said fluoropolymer film in various applications, in particular in electrochemical applications.
Fluoropolymer film
The present invention pertains to a fluoropolymer film comprising at least one fluoropolymer hybrid organic/inorganic composite [polymer (FH)], to a process for the manufacture of said fluoropolymer film and to uses of said fluoropolymer film in various applications, in particular in electrochemical applications.