Patent classifications
C09D161/34
Benzoxazine low temperature curable composition
The present disclosure provides an organic sulfur acid-free composition containing a benzoxazine, phenolic compound and nitrogen-containing heterocyclic compound. The organic sulfur acid-free composition, upon curing at temperatures as low as 130-140 C., renders void free cured articles having well balanced thermal, chemical and mechanical properties. The organic sulfur acid-free composition may be used in a variety of applications, such as in coatings, structural and non-structural composites and encapsulating systems for electronic and electrical components.
Benzoxazine low temperature curable composition
The present disclosure provides an organic sulfur acid-free composition containing a benzoxazine, phenolic compound and nitrogen-containing heterocyclic compound. The organic sulfur acid-free composition, upon curing at temperatures as low as 130-140 C., renders void free cured articles having well balanced thermal, chemical and mechanical properties. The organic sulfur acid-free composition may be used in a variety of applications, such as in coatings, structural and non-structural composites and encapsulating systems for electronic and electrical components.
Benzoxazine low temperature curable composition
The present disclosure provides an organic sulfur acid-free composition containing a benzoxazine, phenolic compound and nitrogen-containing heterocyclic compound. The organic sulfur acid-free composition, upon curing at temperatures as low as 130-140 C., renders void free cured articles having well balanced thermal, chemical and mechanical properties. The organic sulfur acid-free composition may be used in a variety of applications, such as in coatings, structural and non-structural composites and encapsulating systems for electronic and electrical components.
ANTI-REFLECTIVE HARDMASK COMPOSITION
An anti-reflective hardmask composition contains: (a) an arylcarbazole derivative polymer represented by the following Chemical Formula 1 or a polymer blend containing the same; and (b) an organic solvent.
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ANTI-REFLECTIVE HARDMASK COMPOSITION
An anti-reflective hardmask composition contains: (a) an arylcarbazole derivative polymer represented by the following Chemical Formula 1 or a polymer blend containing the same; and (b) an organic solvent.
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THERMALLY CURABLE COMPOSITION, VARNISH THEREOF, AND THERMALLY CURED OBJECT
Provided are: a thermally curable composition which contains benzoxazine-based compounds obtained by condensing aromatic diamines, a phenol compound, and an aldehyde compound, the aromatic diamines being a mixture comprising 4,4-oxydianiline and 3,4-oxydianiline, the mass ratio of the 4,4-oxydianiline to the 3,4-oxydianiline being 50:50 to 80:20; a varnish of the thermally curable composition; and a thermally cured object.
THERMALLY CURABLE COMPOSITION, VARNISH THEREOF, AND THERMALLY CURED OBJECT
Provided are: a thermally curable composition which contains benzoxazine-based compounds obtained by condensing aromatic diamines, a phenol compound, and an aldehyde compound, the aromatic diamines being a mixture comprising 4,4-oxydianiline and 3,4-oxydianiline, the mass ratio of the 4,4-oxydianiline to the 3,4-oxydianiline being 50:50 to 80:20; a varnish of the thermally curable composition; and a thermally cured object.
SEMICONDUCTOR SUBSTRATE TREATMENT AGENT AND SUBSTRATE-TREATING METHOD
A substrate-treating method includes applying a treatment agent directly or indirectly on one face of a substrate to form a substrate pattern collapse-inhibitory film. The substrate includes a pattern on the one face. The substrate pattern collapse-inhibitory film is removed by dry etching after forming the substrate pattern collapse-inhibitory film. The treatment agent includes a compound including an aromatic ring, and a hetero atom-containing group that bonds to the aromatic ring; and a solvent.
SEMICONDUCTOR SUBSTRATE TREATMENT AGENT AND SUBSTRATE-TREATING METHOD
A substrate-treating method includes applying a treatment agent directly or indirectly on one face of a substrate to form a substrate pattern collapse-inhibitory film. The substrate includes a pattern on the one face. The substrate pattern collapse-inhibitory film is removed by dry etching after forming the substrate pattern collapse-inhibitory film. The treatment agent includes a compound including an aromatic ring, and a hetero atom-containing group that bonds to the aromatic ring; and a solvent.
POLYMER, ORGANIC LAYER COMPOSITION, AND METHOD OF FORMING PATTERNS
Disclosed are a polymer including a structural unit represented by Chemical Formula 1 and a structural unit represented by Chemical Formula 2, an organic layer composition including the polymer, and a method of forming patterns using the organic layer composition.
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The Chemical Formulae 1 and 2 are the same as defined in the specification.