C30B33/04

SiC SUBSTRATE PRODUCTION METHOD
20220290324 · 2022-09-15 ·

The present invention addresses the problem of providing a novel SiC substrate production method. The SiC substrate production method according to the present invention comprises an etching step S10 of etching a SiC base substrate 10, a crystal growth step S20 of growing a SiC substrate layer 13 on the SiC base substrate 10 to produce a SiC substrate body 20, and a peeling step S30 of peeling at least a portion of the SiC substrate body 20 to produce a SiC substrate 30, the method being characterized in that each of the etching step S10 and the crystal growth step S20 is a step of arranging the SiC base substrate 10 and a SiC material 40 so as to face each other and heating the SiC base substrate 10 and the SiC material 40 so as to form a temperature gradient between the SiC base substrate 10 and the SiC material 40.

SiC SUBSTRATE PRODUCTION METHOD
20220290324 · 2022-09-15 ·

The present invention addresses the problem of providing a novel SiC substrate production method. The SiC substrate production method according to the present invention comprises an etching step S10 of etching a SiC base substrate 10, a crystal growth step S20 of growing a SiC substrate layer 13 on the SiC base substrate 10 to produce a SiC substrate body 20, and a peeling step S30 of peeling at least a portion of the SiC substrate body 20 to produce a SiC substrate 30, the method being characterized in that each of the etching step S10 and the crystal growth step S20 is a step of arranging the SiC base substrate 10 and a SiC material 40 so as to face each other and heating the SiC base substrate 10 and the SiC material 40 so as to form a temperature gradient between the SiC base substrate 10 and the SiC material 40.

DIAMOND CUTTING TOOL AND METHOD FOR MANUFACTURING THE SAME
20220274186 · 2022-09-01 ·

There is provided a diamond cutting tool including a cutting edge portion containing single crystal diamond or binderless polycrystalline diamond and graphite, wherein when Raman spectroscopy is performed on a surface of the cutting edge portion, a ratio R1 of Ig1 to a sum of Id1 and the Ig1 is equal to or more than 0.5 and equal to or less than 1, where the Idi represents a peak intensity of first carbon in the surface, the Ig1 represents a peak intensity of second carbon in the surface, the first carbon represents carbon that forms the single crystal diamond or the binderless polycrystalline diamond.

Large scale production of oxidized graphene

Embodiments described herein relate generally to the large scale production of functionalized graphene. In some embodiments, a method for producing functionalized graphene includes combining a crystalline graphite with a first electrolyte solution that includes at least one of a metal hydroxide salt, an oxidizer, and a surfactant. The crystalline graphite is then milled in the presence of the first electrolyte solution for a first time period to produce a thinned intermediate material. The thinned intermediate material is combined with a second electrolyte solution that includes a strong oxidizer and at least one of a metal hydroxide salt, a weak oxidizer, and a surfactant. The thinned intermediate material is then milled in the presence of the second electrolyte solution for a second time period to produce functionalized graphene.

Large scale production of oxidized graphene

Embodiments described herein relate generally to the large scale production of functionalized graphene. In some embodiments, a method for producing functionalized graphene includes combining a crystalline graphite with a first electrolyte solution that includes at least one of a metal hydroxide salt, an oxidizer, and a surfactant. The crystalline graphite is then milled in the presence of the first electrolyte solution for a first time period to produce a thinned intermediate material. The thinned intermediate material is combined with a second electrolyte solution that includes a strong oxidizer and at least one of a metal hydroxide salt, a weak oxidizer, and a surfactant. The thinned intermediate material is then milled in the presence of the second electrolyte solution for a second time period to produce functionalized graphene.

Method for manufacturing peeled substrate

A method for manufacturing a peeled substrate has a laser condensing step for focusing laser light at a prescribed depth from the surface of a substrate and a positioning step for moving and positioning a laser condenser relative to the substrate, the method involving forming a processed layer in the substrate. The laser condensing step includes a laser light adjustment step in which a diffraction optical element is used to branch the laser light into a plurality of branched laser beams, and at least one of the branched laser beams is branched such that the intensity thereof differs from the other branched laser beams. The processed layer is elongated using the branched laser beam having a relatively high intensity among the plurality of branched laser beams to process the substrate, and the elongation of the processed layer is restrained using the branched laser beams having a relatively low intensity.

Method for manufacturing peeled substrate

A method for manufacturing a peeled substrate has a laser condensing step for focusing laser light at a prescribed depth from the surface of a substrate and a positioning step for moving and positioning a laser condenser relative to the substrate, the method involving forming a processed layer in the substrate. The laser condensing step includes a laser light adjustment step in which a diffraction optical element is used to branch the laser light into a plurality of branched laser beams, and at least one of the branched laser beams is branched such that the intensity thereof differs from the other branched laser beams. The processed layer is elongated using the branched laser beam having a relatively high intensity among the plurality of branched laser beams to process the substrate, and the elongation of the processed layer is restrained using the branched laser beams having a relatively low intensity.

Method of separating a film from a main body of a crystalline object
11414782 · 2022-08-16 ·

Methods are provided for separating a crystalline film from its main body. The method uses ion implantation to generate an ion damaged layer underneath the surface of the crystalline object. The ion damage changes the crystal structure of the ion damaged layer, so it will have different optical transmittance and absorption characteristics from the undamaged part of the crystalline object. A laser beam with a wavelength that is higher than the absorption edge of the non-ion damaged material, but within the absorption range of the ion damaged material is irradiated at or past the ion damaged layer, causing further damage to the ion damaged layer. The film can then be separated from the main body of the crystalline object.

Method of separating a film from a main body of a crystalline object
11414782 · 2022-08-16 ·

Methods are provided for separating a crystalline film from its main body. The method uses ion implantation to generate an ion damaged layer underneath the surface of the crystalline object. The ion damage changes the crystal structure of the ion damaged layer, so it will have different optical transmittance and absorption characteristics from the undamaged part of the crystalline object. A laser beam with a wavelength that is higher than the absorption edge of the non-ion damaged material, but within the absorption range of the ion damaged material is irradiated at or past the ion damaged layer, causing further damage to the ion damaged layer. The film can then be separated from the main body of the crystalline object.

METHOD FOR MANUFACTURING CRYSTAL FOR SYNTHETIC GEM
20220251729 · 2022-08-11 · ·

The method for manufacturing a crystal for a synthetic gem includes the step of preparing a SiC single crystal including an n-type impurity, and the step of irradiating the SiC single crystal with an electron beam to generate a carbon vacancy in the SiC single crystal. Irradiation energy and dose in electron beam irradiation are set such that the density of the carbon vacancy is higher than the density of the n-type impurity.