Patent classifications
C07D327/04
Method for preparing sultone derivatives
The present invention relates to a method for preparing 1,3-propanesultone derivative compounds used for pharmaceutical intermediates, organic solvents, and electrolyte additives for lithium ion secondary batteries. According to the preparation method of the present invention, it is possible to prepare a sultone compound having various derivatives in high yield.
COMPOSITIONS AND METHODS FOR CONJUGATING A PHENOLIC DYE TO A SUBSTRATE
The present invention provides derivatized indicator compounds, such as pH indicator compounds, which can be covalently immobilized to a variety of solid substrates to produce an indicator pad. Such pads can be used to monitor water quality in variety of settings. In particular, the pads of the invention are useful in devices which monitor the quality of recreational water, such as water in swimming pools, hot tubs, and amusement park attractions, including water slides, and water-based rides. The present invention overcomes the limitations of commercially available pad chemistries.
Compound, resin, resist composition and method for producing resist pattern
Disclosed is a compound represented by formula (I): ##STR00001##
in formula (I), R.sup.1 and R.sup.2 each independently represent a hydrogen atom or a methyl group, X.sup.1 and X.sup.2 each independently represent a group represented by any one of formula (X.sup.1−1) to formula (X.sup.1−8): ##STR00002## A.sup.1 and A.sup.2 each independently represent an aliphatic hydrocarbon group having 1 to 24 carbon atoms which may have a substituent, and —CH.sub.2— included in the aliphatic hydrocarbon group may be replaced by —O—, —S—, —CO— or —S(O).sub.2—, and R.sup.3 represents a hydrocarbon group having 1 to 24 carbon atoms which may have a substituent, and —CH.sub.2— included in the hydrocarbon group may be replaced by —O—, —S—, —CO— or —S(O).sub.2—.
Process for the manufacturing of a polymer with urethane groups
Process for the manufacturing of a polymer with urethane groups, wherein in a first alternative a compound A) with at least two five-membered cyclic monothiocarbonate groups and a compound B) with at least two amino groups, selected from primary or secondary amino groups and optionally a compound C) with at least one functional group that reacts with a group —SH are reacted or wherein in a second alternative a compound A) with at least two five-membered cyclic monothiocarbonate groups or a mixture of a compound A) with a compound A1) with one five-membered cyclic monothiocarbonate group and a compound B) with at least two amino groups, selected from primary or secondary amino groups or a compound B1) with one amino group selected from primary or secondary amino groups or mixtures of compounds B) and B1) and a compound C) with at least two functional groups that react with a group —SH or in case of a carbon-carbon triple bond as functional group that react with a group —SH, a compound C) with at least one carbon-carbon triple bond. are reacted.
Process for the manufacturing of a polymer with urethane groups
Process for the manufacturing of a polymer with urethane groups, wherein in a first alternative a compound A) with at least two five-membered cyclic monothiocarbonate groups and a compound B) with at least two amino groups, selected from primary or secondary amino groups and optionally a compound C) with at least one functional group that reacts with a group —SH are reacted or wherein in a second alternative a compound A) with at least two five-membered cyclic monothiocarbonate groups or a mixture of a compound A) with a compound A1) with one five-membered cyclic monothiocarbonate group and a compound B) with at least two amino groups, selected from primary or secondary amino groups or a compound B1) with one amino group selected from primary or secondary amino groups or mixtures of compounds B) and B1) and a compound C) with at least two functional groups that react with a group —SH or in case of a carbon-carbon triple bond as functional group that react with a group —SH, a compound C) with at least one carbon-carbon triple bond. are reacted.
NOVEL SHORT-ACTING PSYCHOACTIVE COMPOUNDS OF THE MDMA CLASS
The present invention is directed to novel chemical compositions of matter, and in particular novel MDMA class of compounds having substituted methylenedioxyphenethylamine and substituted amphetamine, having a metabolically labile thioether group.
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition containing: (A) a resin containing a repeating unit having an acid-labile group; (B) a photo-acid generator shown by a general formula (B-1); and (C) a solvent, where W.sub.1 represents a cyclic divalent hydrocarbon group having 4 to 12 carbon atoms and containing a heteroatom; W.sub.2 represents a cyclic monovalent hydrocarbon group having 4 to 14 carbon atoms and not containing a heteroatom; Rf represents a divalent organic group shown by the following general formula; and M.sup.+ represents an onium cation. This provides a resist composition and a patterning process that uses the resist composition that show a particularly favorable mask dimension dependency (mask error factor: MEF), LWR, and critical dimension uniformity (CDU) particularly in photolithography where a high-energy beam such as an ArF excimer laser beam is used as a light source.
##STR00001##
RESIST COMPOSITION AND PATTERNING PROCESS
A resist composition containing: (A) a resin containing a repeating unit having an acid-labile group; (B) a photo-acid generator shown by a general formula (B-1); and (C) a solvent, where W.sub.1 represents a cyclic divalent hydrocarbon group having 4 to 12 carbon atoms and containing a heteroatom; W.sub.2 represents a cyclic monovalent hydrocarbon group having 4 to 14 carbon atoms and not containing a heteroatom; Rf represents a divalent organic group shown by the following general formula; and M.sup.+ represents an onium cation. This provides a resist composition and a patterning process that uses the resist composition that show a particularly favorable mask dimension dependency (mask error factor: MEF), LWR, and critical dimension uniformity (CDU) particularly in photolithography where a high-energy beam such as an ArF excimer laser beam is used as a light source.
##STR00001##
AMINE COMPOUND, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS
A resist composition comprising a quencher in the form of an amine compound having a highly polar lactone or sultone ring and an acid labile group in a common molecule is provided. The resist composition has a high sensitivity and forms a pattern with improved LWR or CDU, independent of whether it is of positive or negative tone.
AMINE COMPOUND, CHEMICALLY AMPLIFIED RESIST COMPOSITION, AND PATTERNING PROCESS
A resist composition comprising a quencher in the form of an amine compound having a highly polar lactone or sultone ring and an acid labile group in a common molecule is provided. The resist composition has a high sensitivity and forms a pattern with improved LWR or CDU, independent of whether it is of positive or negative tone.