C07D333/46

ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND COMPOUND

An actinic ray-sensitive or radiation-sensitive resin composition contains a compound represented by general formula (S1) and an acid decomposable resin. In the general formula (S1), Q.sup.1, Q.sup.2, Q.sup.3, Q.sup.4, and Q.sup.5 each independently represent a hydrogen atom or a substituent, provided that at least one of Q.sup.1, Q.sup.2, Q.sup.3, Q.sup.4, or Q.sup.5 represents a substituent including an aryloxy group represented by general formula (QR1), Lq.sup.1 represents a single bond or a divalent linking group; and M.sup.+ represents an organic cation. In the general formula (QR1), G.sup.1, G.sup.2, G.sup.3, G.sup.4, and G.sup.5 each independently represent a hydrogen atom or a substituent, provided that at least one of G.sup.1, G.sup.2, G.sup.3, G.sup.4, or G.sup.5 represents a substituent including an ester group; and * represents a bonding position.

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ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM, PATTERN FORMING METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVICE, AND COMPOUND

An actinic ray-sensitive or radiation-sensitive resin composition contains a compound represented by general formula (S1) and an acid decomposable resin. In the general formula (S1), Q.sup.1, Q.sup.2, Q.sup.3, Q.sup.4, and Q.sup.5 each independently represent a hydrogen atom or a substituent, provided that at least one of Q.sup.1, Q.sup.2, Q.sup.3, Q.sup.4, or Q.sup.5 represents a substituent including an aryloxy group represented by general formula (QR1), Lq.sup.1 represents a single bond or a divalent linking group; and M.sup.+ represents an organic cation. In the general formula (QR1), G.sup.1, G.sup.2, G.sup.3, G.sup.4, and G.sup.5 each independently represent a hydrogen atom or a substituent, provided that at least one of G.sup.1, G.sup.2, G.sup.3, G.sup.4, or G.sup.5 represents a substituent including an ester group; and * represents a bonding position.

##STR00001##

RADIATION-SENSITIVE RESIN COMPOSITION, ONIUM SALT COMPOUND AND METHOD FOR FORMING RESIST PATTERN
20190285983 · 2019-09-19 · ·

A radiation-sensitive resin composition includes a resin including a structural unit having an acid-dissociable group, an onium salt compound represented by formula (1), and a solvent.

R.sup.1 is a hydrogen atom or a monovalent group provided that the monovalent group is not a fluoro group or a monovalent organic group containing a fluorine atom. X.sup.1 and X.sup.2 are each independently a single bond, O, S or NR wherein R is a hydrogen atom or a monovalent hydrocarbon group. In a case where X.sup.1 is NR, R.sup.2 is a monovalent organic group or a hydrogen atom. In a case where X.sup.2 is NR, R.sup.3 is a monovalent organic group or a hydrogen atom. In a case where neither X.sup.1 nor X.sup.2 is NR, R.sup.2 and R.sup.3 are each independently a monovalent organic group.

##STR00001##

RADIATION-SENSITIVE RESIN COMPOSITION, ONIUM SALT COMPOUND AND METHOD FOR FORMING RESIST PATTERN
20190285983 · 2019-09-19 · ·

A radiation-sensitive resin composition includes a resin including a structural unit having an acid-dissociable group, an onium salt compound represented by formula (1), and a solvent.

R.sup.1 is a hydrogen atom or a monovalent group provided that the monovalent group is not a fluoro group or a monovalent organic group containing a fluorine atom. X.sup.1 and X.sup.2 are each independently a single bond, O, S or NR wherein R is a hydrogen atom or a monovalent hydrocarbon group. In a case where X.sup.1 is NR, R.sup.2 is a monovalent organic group or a hydrogen atom. In a case where X.sup.2 is NR, R.sup.3 is a monovalent organic group or a hydrogen atom. In a case where neither X.sup.1 nor X.sup.2 is NR, R.sup.2 and R.sup.3 are each independently a monovalent organic group.

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Photoacid generators and lithographic resists comprising the same
10310375 · 2019-06-04 ·

The present invention provides photoacid generators for use in chemically amplified resists and lithographic processes using the same.

Photoacid generators and lithographic resists comprising the same
10310375 · 2019-06-04 ·

The present invention provides photoacid generators for use in chemically amplified resists and lithographic processes using the same.

COMPOUND AND PHOTOELECTRIC DEVICE, IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING THE SAME

A compound of Chemical Formula 1, and a photoelectric device, an image sensor, and an electronic device including the same are disclosed:

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In Chemical Formula 1, each substituent is the same as defined in the detailed description.

COMPOUND AND PHOTOELECTRIC DEVICE, IMAGE SENSOR AND ELECTRONIC DEVICE INCLUDING THE SAME

A compound of Chemical Formula 1, and a photoelectric device, an image sensor, and an electronic device including the same are disclosed:

##STR00001##

In Chemical Formula 1, each substituent is the same as defined in the detailed description.

SALT AND PHOTORESIST COMPOSITION CONTAINING THE SAME

A salt represented by the formula (I):

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Actinic ray-sensitive or radiation-sensitive resin composition, resist film, pattern forming method, and method for manufacturing electronic device

An actinic ray-sensitive or radiation-sensitive resin composition includes a compound represented by General Formula (I) and an acid-decomposable resin.
M.sub.1.sup.+A.sup.?-L-B.sup.?M.sub.2.sup.+(I)