H10P54/20

Chip manufacturing method using a laser beam with first and second focused points
12598936 · 2026-04-07 · ·

A chip manufacturing method for dividing a workpiece along a projected dicing line established thereon into a plurality of chips includes a modified layer forming step of applying a laser beam that is transmittable through the workpiece and focused into a first focused point and a second focused point, to the workpiece along the projected dicing line while positioning the first focused point and the second focused point within the workpiece, thereby forming a plurality of modified regions in the workpiece. The modified layer forming step includes applying the laser beam to the workpiece while forming one of the modified regions around a region where the first focused spot is positioned, and positioning the second focused spot in superposed relation to another modified region that has already been formed in the workpiece.

Chip manufacturing method using a laser beam with first and second focused points
12598936 · 2026-04-07 · ·

A chip manufacturing method for dividing a workpiece along a projected dicing line established thereon into a plurality of chips includes a modified layer forming step of applying a laser beam that is transmittable through the workpiece and focused into a first focused point and a second focused point, to the workpiece along the projected dicing line while positioning the first focused point and the second focused point within the workpiece, thereby forming a plurality of modified regions in the workpiece. The modified layer forming step includes applying the laser beam to the workpiece while forming one of the modified regions around a region where the first focused spot is positioned, and positioning the second focused spot in superposed relation to another modified region that has already been formed in the workpiece.