Systems and methods are provided for vibrations detection in a scene. Systems comprise at least one coherent light source configured to illuminate the scene, an optical unit configured to focus scattered light from the scene onto a pixelated detector, the detector configured to provide pixel intensity signals, and a processing unit configured to analyze the pixel intensity signals over the pixels of the detector to derive a vibration spectrum of elements in the scene that correspond to the pixels. The signal modulation at each pixel may be used to indicate the vibrations of the scene element(s) that corresponds to the pixel(s). Vibration information concerning the scene may be used to direct other methods of vibration measurements, such as speckle interferometry, according to derived vibration images of the scene.

Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.

A method for validating the placement of pieces in an assembly task by scanning a coherent light source, such as a laser, over a surface and characterizing the detected interference speckle pattern to discriminate the position of the placed piece from the surface on which the piece is placed. This discrimination is possible even if the characteristic features of the piece and background are smaller than the resolution of the scanning system. In addition, characteristics of the piece, such as the orientation of fibers in the material, may be sensed by classification of the associated speckle response.

Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of outputting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state.

A low coherence imaging method comprises acquiring image data of an object with an interferometric imaging system, where the image data is from a location of the object at first and second times; determining a first depth profile from the image data from the location at the first time and a second depth profile from the image data of the location at the second time; determining a change with respect to depth between the first and second depth profiles; and determining a property, or identifying a location, of at least one dynamic particle in the object based on the change between the first and second depth profiles. The method is able to identify, analyze, and/or visualize dynamic particles with features comparable to at least fluorescein angiography, indocyanine green angiography, confocal scanning laser fluorescein angiography, confocal scanning laser indocyanine green angiography, and fluorescence microscopy images, without the use of a dye.

A method for validating the placement of pieces in an assembly task by scanning a coherent light source, such as a laser, over a surface and characterizing the detected interference speckle pattern to discriminate the position of the placed piece from the surface on which the piece is placed. This discrimination is possible even if the characteristic features of the piece and background are smaller than the resolution of the scanning system. In addition, characteristics of the piece, such as the orientation of fibers in the material, may be sensed by classification of the associated speckle response.

An electronic device is described. The electronic device includes a housing, a set of one or more SMI sensors attached to the housing, and a processor. The set of one or more SMI sensors includes a set of one or more electromagnetic radiation emitters having a set of one or more resonant cavities and configured to emit a set of one or more beams of electromagnetic radiation. The set of one or more SMI sensors also includes a set of one or more detectors configured to generate indications of self-mixing within the set of one or more resonant cavities. The processor is configured to characterize, using the indications of self-mixing, an optical field speckle of a target. The processor is also configured to characterize, using the characterization of the optical field speckle, a surface quality of the target.

An electronic device is described. The electronic device includes a housing, a set of one or more SMI sensors attached to the housing, and a processor. The set of one or more SMI sensors includes a set of one or more electromagnetic radiation emitters having a set of one or more resonant cavities and configured to emit a set of one or more beams of electromagnetic radiation. The set of one or more SMI sensors also includes a set of one or more detectors configured to generate indications of self-mixing within the set of one or more resonant cavities. The processor is configured to characterize, using the indications of self-mixing, an optical field speckle of a target. The processor is also configured to characterize, using the characterization of the optical field speckle, a surface quality of the target.

Disclosed herein are systems, methods, and devices for calibrating contrast measurements from laser speckle imaging systems to accurately determine unknown particle motion characteristics, such as flow rate. The calibration stores to memory calibration data, which may include a set of measurements from samples with known particle characteristics and/or estimates of noise, including the effects on contrast arising from undesired signals unrelated to the unknown particle motion characteristics. The calibration data may be accessed and used to correct an empirical measurement of contrast and/or interpolate a value of the unknown particle motion characteristic. The system may include a light source, photodetector, processor, and memory, which can be combined into a single device, such as a wearable device, for providing calibrated flow measurements. The device may be used, for example, to measure blood flow, cardiac output, and heart rate, and can be used to amplify the pulsatile signal.

A system for use in monitoring parameters of an object includes an illumination unit configured for providing coherent illumination of a predetermined wavelength range and for directing the coherent illumination onto an inspection region of the object, and a collection unit comprising a lens arrangement and a detector array and configured for collecting light returning from the inspection region and for generating one or more image data pieces associated with speckle patterns generated at an intermediate plane between the inspection region and the detector array. The detector array is configured as a rolling shutter type detector unit and the collection unit comprises at least one light splitting element configured for splitting collected light to thereby form a plurality of image replications corresponding to the speckle patterns on the detector array.