A tool, such as a level, with magnets embedded in a working surface is provided. For example, the magnets assist in coupling the level to magnetic workpieces. The magnets are placed in a chamber with a floor having a periphery and internal walls extending from the floor periphery. Flanges extend from internal wall of the chamber toward a central axis or point and partially further define the chamber volume. Flanges may be created by depressing surface of the level near the chamber, thus deforming the level body surface to create a channel and a flange from the material displaced from the channel.

A tool, such as a level, with magnets embedded in a working surface is provided. For example, the magnets assist in coupling the level to magnetic workpieces. The magnets are placed in a chamber with a floor having a periphery and internal walls extending from the floor periphery. Flanges extend from internal wall of the chamber toward a central axis or point and partially further define the chamber volume. Flanges may be created by depressing surface of the level near the chamber, thus deforming the level body surface to create a channel and a flange from the material displaced from the channel.

Surface measuring device for measuring a surface of a workpiece has a device base body, and a measuring probe that by use of a feed apparatus is movable along a feed axis relative to a workpiece to be measured. The measuring probe has a probe base body and a probe element, connected to the probe base body, for scanning the workpiece in the direction of a measuring axis. The probe base body is connected to the measuring device base body via the feed apparatus. An oscillation damper is associated with the measuring probe, and is designed and configured for oscillation rate-dependent damping of oscillations of the probe base body of the measuring probe, and is active between the probe base body and the device base body.

Surface measuring device for measuring a surface of a workpiece has a device base body, and a measuring probe that by use of a feed apparatus is movable along a feed axis relative to a workpiece to be measured. The measuring probe has a probe base body and a probe element, connected to the probe base body, for scanning the workpiece in the direction of a measuring axis. The probe base body is connected to the measuring device base body via the feed apparatus. An oscillation damper is associated with the measuring probe, and is designed and configured for oscillation rate-dependent damping of oscillations of the probe base body of the measuring probe, and is active between the probe base body and the device base body.

A material testing apparatus of the present invention may be used as a stand-alone tester coupled to a single environmental chamber. Alternatively, a plurality of material testing apparatus of the present invention may be coupled to a common frame to form a multi-station material testing system. The material testing apparatus of the present invention includes a linear actuator that provides a repetitive linear load or displacement on an object or specimen while canceling vibrations caused by actuation of the linear actuator.

A material testing apparatus of the present invention may be used as a stand-alone tester coupled to a single environmental chamber. Alternatively, a plurality of material testing apparatus of the present invention may be coupled to a common frame to form a multi-station material testing system. The material testing apparatus of the present invention includes a linear actuator that provides a repetitive linear load or displacement on an object or specimen while canceling vibrations caused by actuation of the linear actuator.

A material testing apparatus of the present invention may be used as a stand-alone tester coupled to a single environmental chamber. Alternatively, a plurality of material testing apparatus of the present invention may be coupled to a common frame to form a muti-station material testing system. The material testing apparatus of the present invention includes a linear actuator that provides a repetitive linear load or displacement on an object or specimen while canceling vibrations caused by actuation of the linear actuator.

A material testing apparatus of the present invention may be used as a stand-alone tester coupled to a single environmental chamber. Alternatively, a plurality of material testing apparatus of the present invention may be coupled to a common frame to form a muti-station material testing system. The material testing apparatus of the present invention includes a linear actuator that provides a repetitive linear load or displacement on an object or specimen while canceling vibrations caused by actuation of the linear actuator.