Systems for spectroscopy are provided. Exemplary systems include: an enclosure; a tunable laser disposed in the enclosure; an opening on a surface of the enclosure; a beam splitter disposed in the enclosure, the beam splitter being optically coupled to the tunable laser and the opening; a sensor, a sensing surface of the sensor having a filter disposed thereon; and electronics coupled to the tunable laser and the sensor, the electronics including a processor, memory, and a battery.

Disclosed is a resonant wavelength measurement apparatus, including a light source and a measurement unit. The measurement unit has a guided-mode resonance filter and a photosensitive element. The guided-mode resonance filter has a plurality of resonant areas, and each resonant area has a different filtering characteristic, to receive first light in the light source transmitted by a sensor or receive second light in the light source reflected by the sensor. The first light has a first corresponding pixel on the photosensitive element, the second light has a second corresponding pixel on the photosensitive element, and the first corresponding pixel and the second corresponding pixel correspond to a same resonant wavelength.

The present disclosure resides in a spectrometer arrangement including a first dispersing element for spectral separation of radiation in a main dispersion direction, and a second dispersing element for spectral separation of radiation in a cross-dispersion direction, which is at an angle to the main dispersion direction, so that a two-dimensional spectrum is producible. The spectrometer arrangement also includes a collimating optics, which directs collimated radiation to the first and/or second dispersing element, a camera optics, which images a two-dimensional spectrum in an image plane, a two-dimensional detector for detecting the two-dimensional spectrum in the image plane, and an off-axis section of a rotationally symmetric, refractive element, which is arranged between the camera optics and the detector. The present disclosure resides likewise in an optical module comprising such a spectrometer arrangement.

A method and apparatus is provided for implementing a parametric down-conversion (PDC)-based calibration comprising calibrating a measuring instrument; disposing a pinhole at a position of a light-emitting sample for which the measuring instrument needs to be calibrated; irradiating a nonlinear crystal with a light source; setting the nonlinear crystal by ensuring a phase-matching wavelength of the nonlinear crystal is set at one boundary of a desired bandwidth; acquiring one or more PDC spectrums by the measuring instrument; obtaining peak values and their corresponding wavelengths from each acquired spectrum; and obtaining a response function based on the peak values and corresponding wavelengths.

Reflectometer, Spectrophotometer, Ellipsometer and Polarimeter Systems that utilize 1) electromagnetic radiation energy absorbing or reflecting material of spatially distributed different optical densities and 2) wavelength dependent electromagnetic radiation energy aperturing, or both, placed near the entry to said multi-element detector, to improve detector capability to monitor intensity vs. wavelength spectra entered thereinto and provide more uniform detector output, while preferably maintaining beam information content.

Methods and systems that utilize 1) electromagnetic radiation energy absorbing or reflecting material of spatially distributed different optical densities and 2) wavelength dependent electromagnetic radiation energy aperturing, or both, placed near the entry to said multi-element detector, to improve detector capability to monitor intensity vs. wavelength spectra entered thereinto and provide more uniform detector output, while preferably maintaining beam angle and plane of incidence.

A spectroscopic microscope device, comprising at least one array of metasurfaces, and at least one CCD array integrated with the array of metasurfaces. The metasurfaces in the array are configured to separately direct LCP an RCP components of light incident on the metasurface to separate pixels in the CCD array.

The present disclosure resides in a spectrometer arrangement including a first dispersing element for spectral separation of radiation in a main dispersion direction, and a second dispersing element for spectral separation of radiation in a cross-dispersion direction, which is at an angle to the main dispersion direction, so that a two-dimensional spectrum is producible. The spectrometer arrangement also includes a collimating optics, which directs collimated radiation to the first and/or second dispersing element, a camera optics, which images a two-dimensional spectrum in an image plane, a two-dimensional detector for detecting the two-dimensional spectrum in the image plane, and an off-axis section of a rotationally symmetric, refractive element, which is arranged between the camera optics and the detector. The present disclosure resides likewise in an optical module comprising such a spectrometer arrangement.

An optical spectrum measuring apparatus includes: a CCD (Charge Coupled Device) detector including a plurality of light-receiving devices that are two-dimensionally arranged; an optical system configured to split incident light into rays and irradiate the CCD detector with the rays; and a restriction unit configured to restrict one or more rows and/or one or more columns out of the rows and columns of the plurality of light-receiving devices from being irradiated with light from the optical system.

A method and apparatus is provided for implementing a parametric down-conversion (PDC)-based calibration comprising calibrating a measuring instrument; disposing a pinhole at a position of a light-emitting sample for which the measuring instrument needs to be calibrated; irradiating a nonlinear crystal with a light source; setting the nonlinear crystal by ensuring a phase-matching wavelength of the nonlinear crystal is set at one boundary of a desired bandwidth; acquiring one or more PDC spectrums by the measuring instrument; obtaining peak values and their corresponding wavelengths from each acquired spectrum; and obtaining a response function based on the peak values and corresponding wavelengths.