This invention addresses the abovementioned problem, and the purpose of this invention is to provide a far-infrared spectroscopy device that uses an is-TPG method to generate far-infrared light, and is capable of efficiently detecting is-TPG light without a detection optical system being fine-tuned. Even if the far-infrared light incidence angles on an Si prism for detection are the same when far-infrared light having a first frequency is incident on a non-linear optical crystal for detection and when far-infrared light having a second frequency is incident on the non-linear optical crystal for detection, this far-infrared. spectroscopy device adjusts the incidence surface angle of pump light in relation to the non-linear optical crystal for detection such that the angle of the far-infrared light in relation to the pump light within the non-linear optical crystal for detection can be appropriately set for each far-infrared light frequency (see FIG. 1A).

A method and system for detecting an aflatoxin on a grain, seed or nut which includes sorting a plurality of the grain seeds in single file, capturing a plurality of shortwave infrared images of each seed, comparing the wavelengths from the captured image with the wavelengths indicative of an aflatoxin presence at a predetermined concentration, and ejecting from a group of the seeds those seeds that have an aflatoxin concentration greater than the predetermined concentration as indicated by the wavelengths from the captured images.

Provided is a resin panel enabling an infrared sensor to fully function when the resin panel is applied as a protective cover to the infrared sensor. The resin panel comprises at least a core layer and has a light transmittance at a wavelength of 905 nm of 85% or more and a visible light transmittance of 20% or less.

An illuminator system for semiconductor chip testing has a rotary plate and a first light source and second light source mounted on the rotary plate. A controller is configured to rotate the rotary plate to provide a desired light output. A light output of the illuminator system is aligned to the desired first or second light source. A first semiconductor chip receives illumination from the desired source. The rotary plate is rotated until the desired light source is aligned to the light output. A quality or characteristic of light emitted by the first light source can be measured, and then the first light source can be adjusted, or an alert can be generated, if the quality or characteristic falls outside of a preconfigured range.

A 3-dimensional measuring device includes: a light source unit; a projection optical system; a scanning mirror that is provided to be rotatable about a rotating shaft in a state of being inclined with respect to a shaft center of the rotating shaft to radiate a range-finding light within a plane crossing the rotating shaft in a rotary manner; a light-receiving optical system that receives a reflection range-finding light; a reference light optical system that is provided in a range outside a measuring range within a radiation range to receive and reflect the range-finding light as an internal reference light, the reference light optical system being capable of changing a light quantity of the internal reference light; and a light receiving element that receives the reflection range-finding light and the internal reference light.

An infrared light source device includes: a heater portion which emits infrared light by being heated; and a cover member arranged to cover an entire circumference of the heater portion without contacting the heater portion, and having a hole formed therein for emitting the infrared light from the heater portion to outside. A material for the cover member is a pure aluminum (an aluminum alloy with a purity of 99% or more), which has a high heat reflectivity and is less likely to be denatured by heat dissipation from the heater portion.

An electronic device may include sensors such as a visible-light image sensor for capturing images. The sensors may also include optical sensors that operate at other wavelengths. An infrared light sensor may be used to gather an infrared light spectrum of a target object. The infrared light sensor may have a beam steerer and other adjustable components such as adjustable lenses and adjustable polarizers. During operation, an infrared beam emitted by the infrared light sensor may be steered onto the target object using information from a captured visible-light image and/or other sensor data such as distance sensor data, orientation sensor data, three-dimensional image sensor data, and data from other sensors. Infrared spectra, visible-light camera images, and/or data from other sensors may be used in characterizing target objects so that notifications can be provided to a user and other actions taken.

A multiband IR adjunct (MIRA) sensor to spectroscopically determine the content and the concentration of chemical composition of a targeted object, includes a sensor housing, a first front optics in a first optical channel, a second front optics in the first optical channel, an acousto-optic tunable filter (AOTF), a photo detector (PD), a set of back optics in the first optical channel that focuses polarized narrow-band light beams received from the AOTF device onto the PD, the PD converting the polarized narrow-band light beams into an electrical signal, and a data acquisition unit signal-connected to the PD, the data acquisition unit collecting the electrical signals. Multiple optical channels can be provided within the housing to analyze UV/VIS/near infrared (NIR), short-wavelength infrared (SWIR), mid-wavelength infrared (MWIR), and LWIR wavelength ranges respectively.

A spectroscopic analyzer includes: an irradiator that irradiates a target measurement object with lights of a plurality of different wavelengths sequentially as a pre-irradiation, and, after the pre-irradiation, further irradiates the target measurement object with lights of a plurality of different wavelengths sequentially as a measurement-irradiation; a detector that, during the measurement-irradiation, detects reflected light, transmitted light, or a transmitted reflected light from the target measurement object at each of the plurality of different wavelengths of the measurement-irradiation and that outputs absorbance spectral data; a data analyzer that analyzes the absorbance spectral data; and a result display that displays analysis results related to components of the target measurement object.

A display device includes a display, an illuminance sensor, an IR sensor disposed at a lower side of the display device, a memory to store correction data set by respective reflectance, and a processor. The processor is configured to calculate a reflectance of a floor surface, in an environment in which the display device is arranged, based on a sensing value of the IR sensor, obtain correction data corresponding to the calculated reflectance from stored correction data of the memory, correct an illuminance value sensed by using the illuminance sensor according to the obtained correction data, and control an operation of the display based on the corrected illuminance value.