G01N21/6489

INSPECTION APPARATUS AND INSPECTION METHOD

An inspection apparatus includes a light source unit, cameras, a keyboard, and a controller that determines a wavelength of the excitation light, based on the information on the emission color received by the keyboard, and that controls the light source unit so that the light source unit generates excitation light with the determined wavelength. The controller determines a wavelength longer than an absorption edge wavelength of the substrate of the sample and shorter than a peak wavelength of an emission spectrum of the light-emitting element, the peak wavelength being specified from the information on the emission color, to be the wavelength of the excitation light.

Excitation and photoluminescence detection device

A device for exciting objects with an excitation radiation and for detecting a photoluminescence radiation emitted by the objects after the absorption of the excitation radiation. The device includes a wall in contact with the objects, an organic light-emitting diode for emitting the excitation radiation and transparent to the photoluminescence radiation, an optical resonator tuned to the wavelength of the photoluminescence radiation and located on the side of the organic light-emitting diode opposite to the wall, and at least one sensor of the photoluminescence radiation arranged on the side of the optical resonator opposite to the organic light-emitting diode.

Measurement of bilirubin concentration in blood samples

A method for measuring bilirubin concentration in a sample includes preparing a sensing element, where the sensing element may include a plurality of carbon dots, adding the sample to the sensing element, where the sample may include a plurality of bilirubin molecules, obtaining a first grayscale image of the sensing element under ultra-violet (UV) irradiation, irradiating visible light with a wavelength between 470 nm and 490 nm on the sensing element, obtaining a second grayscale image of the sensing element under ultra-violet (UV) irradiation, calculating a light intensity difference by calculating a difference between a first average light intensity of the first grayscale image and a second average light intensity of the second image, and determining the bilirubin concentration based on a correlation between the bilirubin concentration and the light intensity difference.

PROCESSES, APPARATUSES AND SYSTEM FOR MEASURING A MEASURED VARIABLE

It is an object of the invention to improve processes, apparatuses and systems for measuring a measured variable. To this end, a measured variable is measured in a measuring process on the basis of an NV center as a quantum sensor. The NV center has a plurality of quantum states and is optically excitable on the basis of an occupancy of one of the quantum states into at least one excited state of the quantum states by means of an excitation light. The at least one excited state can decay at least with emission of emission light of the NV center. In the measuring process, the NV center is irradiated by the excitation light, the excitation light having a time periodic modulation, and a respective occupancy probability and/or a respective lifetime of the quantum states depending on the measured variable and the excitation light. A phase shift is determined between the emission light of the NV center and the modulation of the excitation light and a measurement value for the measured variable is determined on the basis thereof.

Authentication of quantum dot security inks
11493444 · 2022-11-08 · ·

A method is provided for verifying the authenticity of an article which bears a security mark. The method includes irradiating the security mark with a time-varying light source, ascertaining at least one portion of the emissions spectrum of the irradiated security mark with at least one photodetector, determining the photoluminescence lifetime of the security mark by monitoring the time or frequency response of the photodetector, and verifying the authenticity of the article only if the security mark exhibits a photoluminescence which has a lifetime that falls within the range of appropriate values for each portion of the photoluminescence spectrum for which the photoluminescence lifetime of said security mark was ascertained.

Methods and apparatus for sample measurement

The present application discloses a sensor system that includes a sensor having a sensor surface, a sample cartridge including one or more flexible membranes and a membrane frame, the membrane frame including one or more openings covered by the one or more flexible membranes defining one or more wells for holding one or more samples, the flexible membrane having a sample side supporting the sample and an opposite sensor side, the sample cartridge being removably insertable in the sensor system such that the sensor side of the flexible membrane is positioned above and faces the sensor surface, a displacement mechanism that can be actuated to displace the flexible membrane toward the sensor surface such that the sample is moved to a position closer to the sensor surface, and an optical imaging system that detects light emitted from the sensor. Disclosed also are a cartridge cassette and a method of use.

Systems and methods for inspecting solar modules using high-power light sources

Embodiments of the present disclosure are directed to systems and methods for inspecting solar modules, and in particular systems and methods incorporating high-power light sources to impart ultraviolet fluorescence of solar modules. The systems and methods can include a filter and/or a camera.

Method for inspecting light-emitting diodes and inspection apparatus

An inspection apparatus including an illumination light source, a sensing probe and a processing device is provided. The illumination light source emits an illumination beam to simultaneously irradiate the plurality of light-emitting diode. The sensing probe is configured to measure a charge distribution, an electric field distribution, or a voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. The processing device determines a plurality of electro-optical characteristics of the plurality of light-emitting diodes through the charge distribution, the electric field distribution, or the voltage distribution on the plurality of light-emitting diodes simultaneously irradiated by the illumination beam. Moreover, a method of for inspecting light-emitting diodes is also provided.

Metrology for OLED manufacturing using photoluminescence spectroscopy

An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.

DEFECT CLASSIFICATION EQUIPMENT FOR SILICON CARBIDE SUBSTRATE USING SINGLE INCIDENT LIGHT-BASED PHOTOLUMINESCENCE AND DEFECT CLASSIFICATION METHOD USING THE SAME
20230113093 · 2023-04-13 ·

Stack fault inspection apparatus and method are disclosed. The apparatus includes a sample stage fixing the silicon carbide substrate and allow the incident light to scan the substrate surface; an incident light source configured to irradiate a vertical illumination light of a wavelength corresponding to an energy greater than a band gap energy of the substrate to at least a portion of a surface of the substrate in a direction substantially perpendicular to the surface of the substrate; a photomultiplier tube (PMT) configured to obtain a photoluminescence mapping image having a wavelength corresponding to the band gap energy of the substrate from the surface of the substrate; and a controller configured to process the mapping image and identify stacking faults.