G01N2223/40

Method of examining a sample using a charged particle microscope

The invention relates to a method of examining a sample using a charged particle microscope, comprising the steps of providing a charged particle beam, as well as a sample, and scanning said charged particle beam over said sample. A first detector is used for detecting emissions of a first type from the sample in response to the beam scanned over the sample. Using spectral information of detected emissions of the first type, a plurality of mutually different phases are assigned to said sample. An image representation of said sample is provided, wherein said image representation contains different color hues. The color hues are selected from a pre-selected range of consecutive color hues in such a way that the selected color hues comprise mutually corresponding intervals within said pre-selected range of consecutive color hues.

Portable x-ray backscatter inspection of joining features

Method, apparatus, system, and computer program product for inspecting a joining feature on an object. A portable housing with an x-ray system is moved along the joining feature on the object. The x-ray system is controlled to direct an x-ray beam through an opening in the portable housing to scan an area of the object containing the joining feature as the portable housing moves along the joining feature on the object. Sensor data generated from a backscatter detected by a sensor system is received. The backscatter is generated in response to the x-ray beam encountering the area of the object including the joining feature. A determination is made as to whether an inconsistency is present in the area of the object including the joining feature using the sensor data.

X-RAY IMAGING DEVICE, X-RAY IMAGING SYSTEM, AND METHOD OF CONTROLLING X-RAY IMAGING DEVICE
20230059156 · 2023-02-23 · ·

According to an embodiment, an X-ray imaging device includes an irradiator, an exposure switch device, and a control device. The irradiator irradiates a subject placed on a bed with X-rays. The exposure switch device receives an operation of an operator related to X-ray irradiation. The control device controls the X-ray irradiation based on the X-rays. The exposure switch device includes a switch and an output. The switch is set on the basis of a position of the operator and detects the operation of the operator. The output outputs an operation signal based on the operation of the operator to the control device when the operation of the operator has been detected by the switch.

System and method for inspecting defects of structure by using x-ray
11585768 · 2023-02-21 · ·

A method of detecting a defect in a wind turbine blade uses a system that includes an X-ray generator, moved by a first transporting means, that generates X-ray to be irradiated to the wind turbine blade; an X-ray detector, moved by a second transporting means, that detects the X-ray generated by the X-ray generator and transmitted through the wind turbine blade; and a control unit. To detect a defect, the control unit divides virtually the wind turbine blade into a plurality of lengthwise sections based on a thickness profile thereof, receives a location of the X-ray generator, and controls output of the X-ray generator based on the location of the X-ray generator relative to the plurality of lengthwise sections. In particular, the output of the X-ray generator is decreased for a section among the plurality of lengthwise sections that is farther from a hub of the wind turbine blade.

Method for diffraction pattern acquisition

Methods and systems for conducting tomographic imaging microscopy of a sample with a high energy charged particle beam include irradiating a first region of the sample in a first angular position with a high energy charged particle beam and detecting emissions resultant from the charged particle beam irradiating the first region. The sample is repositioned into a second angular position such that the second region to be different than the first region, and a second region of the sample is irradiated. Example repositioning may include one or more of a translation of the sample, a helical rotation of the sample, the sample being positioned in a non-eucentric position, or a combination thereof. Emissions resultant from irradiation of the second region are then detected, and a 3D model of a portion of the sample is generated based at least in part on the detected first emissions and detected second emissions.

SEMICONDUCTOR-BASED BIOSENSORS FOR BASE CALLING

A device for base calling is provided. The device includes a receptacle configured to hold a biosensor having a sample surface holding a plurality of clusters during a sequence of sampling events, an array of sensors sensing information from clusters disposed in corresponding pixel areas of the sample surface during the sampling events and generate sequences of pixel signals and a communication port configured to output the sequences of pixel signals. The device also includes a signal processor coupled to the communication port and configured to receive and process at least one pixel signal in the sequences of pixel signals that mixes light gathered from at least two clusters in a corresponding pixel area, and to base call each of the at least two clusters using the at least one pixel signal.

Devices and methods for sample characterization
11573200 · 2023-02-07 · ·

Devices and methods for characterization of analyte mixtures are provided. Some methods described herein include performing enrichment steps on a device before expelling enriched analyte fractions from the device for subsequent analysis. Also included are devices for performing these enrichment steps.

Systems and Methods to Determine a Safe Time to Fire in a Vehicle Inspection Portal
20230036700 · 2023-02-02 ·

A system and method for the accurate determination of a time to fire high energy radiation for security inspection of a cargo vehicle in a drive-through inspection portal. The system includes at least two sensors, one of which is positioned at an entry to the portal, and the other is positioned just after beamline center (BCL). As a driver of the vehicle activates a button at the entry to the portal, the system takes a measurement using one sensor to determine a distance from the driver to a front of the vehicle. As the vehicle reaches the BCL, a measurement is taken by the other sensor in real time and compared with the measurement taken at the entry. A user defined offset is then applied to determine how far behind the driver should the high energy radiation be fired.

DETERMINATION OF MATERIAL
20220341855 · 2022-10-27 ·

In an example, there is disclosed a method for determining a material in a cargo, the cargo including a first object made of a first material and a second object made of a second material. The method includes obtaining image data associated with an inspection image of the cargo, for at least two levels of radiation energy, obtaining equivalence data associated with mass equivalence of at least one of the first material and the second material with respect to a reference material, for the at least two levels of radiation energy, obtaining observation data based on the image data and the equivalence data, and determining at least one of the first material and the second material, based on the obtained observation data.

Spectroscopy and imaging system

An apparatus and method for characterisation of a sample via spectroscopy and/or imaging. The apparatus comprises a first detector for imaging or spectroscopy, a second detector for imaging or spectroscopy, and a toroidal capacitor type electrostatic energy analyser. The toroidal capacitor type electrostatic energy analyser comprises a first and a second entrance aperture arranged such that charged particles emitted from a sample and passing through the first entrance aperture traverse a first trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the first detector, and charged particles emitted from a sample and passing through the second entrance aperture traverse a second trajectory through the toroidal capacitor type electrostatic energy analyser to be incident at the second detector. A deflection assembly arranged between the sample and the analyser may be used to direct charged particles emitted from the sample towards the first and/or second entrance aperture of the analyser.