A dual energy based X-ray scanning system has a linear detector array with high and low energy detectors. A signal processing method is employed that accounts for varying angles at which the transmitted X-rays impinge upon the detectors and also the varying order in which the transmitted X-rays pass through the high and low energy detectors. This yields both high resolution in the generated images and better penetration performance.

A method of investigating a specimen using charged-particle microscopy, comprising the following steps: (a) On a surface of the specimen, selecting a virtual sampling grid extending in an XY plane and comprising grid nodes to be impinged upon by a charged-particle probing beam during a two-dimensional scan of said surface; (b) Selecting a landing energy E.sub.i for said probing beam, with an associated nominal Z penetration depth d.sub.i below said surface; (c) At each of said nodes, irradiating the specimen with said probing beam and detecting output radiation emanating from the specimen in response thereto, thereby generating a scan image I.sub.i; (d) Repeating steps (b) and (c) for a series {E.sub.i} of different landing energies, corresponding to an associated series {d.sub.i} of different penetration depths, further comprising the following steps: (e) Pre-selecting an initial energy increment ΔE.sub.i by which E.sub.i is to be altered after a first iteration of steps (b) and (c); (f) Associating energy increment ΔE.sub.i with a corresponding depth increment Δd in the value of d.sub.i; (g) Selecting said sampling grid to have a substantially equal node pitch p in X and Y, which pitch p is matched to the value of Δd so as to produce a substantially cubic sampling voxel; (h) Selecting subsequent energy values in the series {E.sub.i} so as to maintain a substantially constant depth increment Δd between consecutive members of the series {d.sub.i}, within the bounds of selected minimum and maximum landing energies E.sub.min and E.sub.max, respectively.

An X-ray imaging apparatus and a method for generating X-ray images are provided. The X-ray imaging apparatus includes an X-ray source configured to irradiate X-rays to a subject, and an X-ray detector configured to detect X-rays penetrating the subject, and generate a frame image including pieces of X-ray data for energy bands. The X-ray imaging apparatus further includes an image divider configured to divide the frame image into images of substances, using the pieces of the X-ray data, and an image generator configured to restore the frame image by performing motion compensation on an image of a first substance of the frame image, among the images of the substances of the frame image, and an image of the first substance of a previous frame image.

There is provided a method and corresponding system and apparatus for image reconstruction based on image data from a photon-counting multi-bin x-ray detector. The method includes determining (S1) parameter(s) of a given functional form of the relationship between comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum. The method also includes performing (S2) image reconstruction based on the image data and the determined parameter(s). In this way, efficient high-quality image reconstruction can be achieved.

The invention provides a system and method for characterising at least part of a material comprising: a source of incident X-rays (4, 28) configured to irradiate at least part of the material; one or more detectors (300,302,312,1701,1704,1600,1607,1608,1604) adapted to detect radiation emanating from within or passing through the material as a result of the irradiation by the incident radiation (1700) and thereby produce a detection signal (313); and one or more digital processors (304-311,2000-2009) configured to process the detection signal (313) to characterise at least part of the material; wherein the one or more detectors (300,302,312,1701, 1704,1600,1607,1608,1604) and one or more digital processors (304-311,2000-2009) are configured to characterise at least part of the material by performing energy resolved photon counting X-ray transmission spectroscopy analysis.

High-contrast, subtraction, x-ray images of an object are produced via scanned illumination by a laser-Compton x-ray source. The spectral-angle correlation of the laser-Compton scattering process and a specially designed aperture and/or detector are utilized to produce/record a narrow beam of x-rays whose spectral content consists of an on-axis region of high-energy x-rays surrounded by a region of slightly lower-energy x-rays. The end point energy of the laser-Compton source is set so that the high-energy x-ray region contains photons that are above the k-shell absorption edge (k-edge) of a specific contrast agent or specific material within the object to be imaged while the outer region consists of photons whose energy is below the k-edge of the same contrast agent or specific material. Scanning the illumination and of the object by this beam will simultaneously record and map the above edge and below k-edge absorption response of the object.

An image processing apparatus comprises a filtering unit for performing recursive filtering on a first signal component and a second signal component that are obtained by emitting radiation at a plurality of levels of energy toward an object, and a generation unit for generating a moving image based on the first signal component and the second signal component on which the recursive filtering is performed. A filter coefficient of the recursive filtering performed on the first signal component and a filter coefficient of the recursive filtering performed on the second signal component differ from each other.

Provided is a highly reliable X-ray inspection device having two line sensors, in which accurate inspection results can be obtained even when there is displacement of the mounting position of the line sensors. The X-ray inspection device is provided with a conveyor unit for conveying an article, an X-ray emitter, a first line sensor, a second line sensor, a detection unit, and a corrected-image generation unit. The X-ray emitter emits X-rays to the article conveyed by the conveyor unit. The first line sensor detects, in a low energy band, X-rays that have passed through the article. The second line sensor detects, in a high energy band, X-rays that have passed through the article. The detection unit detects positional displacement of the second line sensor with respect to the first line sensor in horizontal direction and vertical direction.

Methods and systems are provided for dual energy imaging. In one embodiment, a method for a dual energy imaging system comprises determining a first tube potential and a second tube potential according to a size of a subject, and controlling the dual energy imaging system with the first tube potential and the second tube potential to generate lower energy x-rays and higher energy x-rays respectively to image the subject. In this way, image quality may be increased while minimizing dose during dual energy imaging of a particular imaging subject.

A method and a system for providing calibration for a photon counting detector forward model for material decomposition. The flux independent weighted bin response function is estimated using the expectation maximization method, and then used to estimate the pileup correction terms at each tube voltage setting for each detector pixel.