A device for determining the microstructure of a metal product during metallurgical production of the metal product, the device having at least one X-ray source, at least one X-ray detector and at least one accommodating chamber, inside which the X-ray source and/or the X-ray detector is/are arranged and which has at least one window which is transparent to X-ray radiation. To allow reliable determination of the microstructure of a metal product during the metallurgical production thereof, the device includes at least one cooling installation for actively cooling the accommodating chamber.

A device and method for the radioscopic examination of a continuous strip-shaped material of rubber which runs continuously in particular. During the movement, the strip-shaped material is x-rayed by a radioscopic measurer and the entire cross-sectional surface is detected so that foreign bodies or defects present in the material are detected according to their position and orientation. An elimination device removes the previously identified foreign body during the feed movement of the material in that a tool, configured as a punching tool, of the elimination device is moved synchronously with the material.

An inspection device is provided in which X-rays are radiated in a fan-like shape with respect to an extension direction of steel cords, are transmitted through a conveyor belt, and reach an X-ray line sensor. A control device makes an X-ray generator and the X-ray line sensor move in a fixed relative position at a certain speed within a certain movement range in a direction parallel with a plane and orthogonal to an extension direction of the steel cords. The control device generates two-dimensional image information on the basis of an X-ray transmission signal obtained each time the X-ray generator and the X-ray line sensor move a unit amount equal to a pixel pitch of the X-ray line sensor. The control device detects measurement information relating to the conveyor belt and the steel cords on the basis of the obtained two-dimensional image information.

An X-ray transmission inspection apparatus includes: an X-ray source configured to irradiate a sample with an X-ray; a detector configured to be disposed on a side opposite to the X-ray source with respect to the sample and to detect the X-ray which is transmitted through the sample using a phosphor; a shield member configured to be arranged to face a detection surface of the detector and to block a part of X-rays to partially form a shield area from the X-rays on the detection surface; and a shield moving mechanism configured to move the shield member relative to the detector to enable change of a position of the shield area.

A method for compensating for substrate variation in measurement of material quantity of a material positioned on a substrate is described. The method includes receiving a detected X-ray signal for a measurement of the material at a position on a surface of the substrate; and determining a material quantity based on the received X-ray measurement signal and a pre-determined set of compensation parameters for the substrate, the set of compensation parameters varying according to the position on the surface of the substrate.

A device and method for the radioscopic examination of a continuous strip-shaped material of rubber which runs continuously in particular. During the movement, the strip-shaped material is x-rayed by a radioscopic measurer and the entire cross-sectional surface is detected so that foreign bodies or defects present in the material are detected according to their position and orientation. An elimination device removes the previously identified foreign body during the feed movement of the material in that a tool, configured as a punching tool, of the elimination device is moved synchronously with the material.

X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.

Proposed is an X-ray analysis apparatus capable of detecting a foreign matter and identifying elements in the foreign matter with high accuracy even when applied to a roll-to-roll method, without reducing throughput. The X-ray analysis apparatus includes an unwinding part continuously unwinding therefrom a sample, a foreign matter inspection and analysis part inspecting and analyzing a foreign matter in the sample, and a winding part winding thereon the sample. The foreign matter inspection and analysis part includes a foreign matter location detection part detecting a location of the foreign matter in the sample, an intermittent transfer part intermittently stopping movement of a portion of the sample where the foreign matter is detected when the foreign matter is detected or slowly moving the portion, and an X-ray analysis part analyzing the portion while the portion is stopped or moved slowly by irradiating the portion with X-rays.

A method for preparing surrogate calibration standards for web gauging, is provided. The method includes providing linearizations for one or more radiometric gauges, each linearization associated with a radiometric gauge and relating the basis weight of real standards, comprising a lithium ion battery (LIB) electrode material, to transmission of the radiation through the LIB electrode material. The method also includes providing one or more surrogate standards comprising an inert material having an effective Z (Z.sub.surrogate) substantially the same as an effective Z (Z.sub.real) of the LIB material in the real standards. The method further includes assigning to each surrogate standard a surrogate basis weight based on a transmission of radiation through the surrogate standard and the linearizations.

A method for compensating for substrate variation in measurement of material quantity of a material positioned on a substrate is described. The method includes receiving a detected X-ray signal for a measurement of the material at a position on a surface of the substrate; and determining a material quantity based on the received X-ray measurement signal and a pre-determined set of compensation parameters for the substrate, the set of compensation parameters varying according to the position on the surface of the substrate.