G01N2223/648

INSPECTION POSITION IDENTIFICATION METHOD, THREE-DIMENSIONAL IMAGE GENERATION METHOD, AND INSPECTION DEVICE
20200264113 · 2020-08-20 ·

An inspection position identification method that allows accurate inspection to be performed without in-advance identification of the position of an inspection plane in an inspected target. A three-dimensional image generation method that allows generation of a three-dimensional image for inspection without in-advance identification of the position of an inspection plane in an inspected target and then allows inspection to be performed. An inspection device including the methods. An inspection device includes a storage unit, which stores a radiation transmission image of an inspected object and a three-dimensional image generated from the radiation transmission image, and a control unit. The process carried out by the control unit for identifying an inspection position in a three-dimensional image includes identifying the position of a transmission picture of the inspection position in the radiation transmission image and identifying the inspection position in the three-dimensional image from the position of the transmission picture.

SURFACE EXTRACTION METHOD AND APPARATUS FOR X-RAY CT VOLUME

An isosurface mesh M is generated by extracting voxels having a certain CT value from volume data obtained by X-ray CT. A gradient vector g of a CT value is calculated at each vertex p of the isosurface mesh M. A plurality of sample points S are generated in positive and negative directions of the calculated gradient vector g. Gradient norms N of CT values at the respective generated sample points S are calculated. The vertex p of the isosurface mesh is moved and corrected to a sample point Sm having the maximum norm Nm calculated.

Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process

An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhole extending therethrough. The electron beam system is configured to generate an electron beam directed toward the component. Interactions between the component and the electron beam generate x-ray radiation. The at least one imaging device is configured to detect the x-ray radiation through the pinhole. The computing device is configured to image the component based on the x-ray radiation detected by the at least one imaging device.

METHOD AND SYSTEM USING X-RAY PINHOLE CAMERA FOR IN-SITU MONITORING OF ELECTRON BEAM MANUFACTURING PROCESS

An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhole extending therethrough. The electron beam system is configured to generate an electron beam directed toward the component. Interactions between the component and the electron beam generate x-ray radiation. The at least one imaging device is configured to detect the x-ray radiation through the pinhole. The computing device is configured to image the component based on the x-ray radiation detected by the at least one imaging device.

X-ray sidescatter inspection of laminates
10393680 · 2019-08-27 · ·

Systems and methods are provided for detecting gaps in composite parts. One method includes radiating a beam of x-rays in a firing direction towards surface of a multi-layer Carbon Fiber Reinforced Polymer (CFRP) part, acquiring data indicating intensity of sidescatter radiation received at an x-ray detector that extends along the CFRP part in the firing direction, and examining the acquired data for gaps at the CFRP part based on differences in intensity indicated by the data.

APPARATUS AND METHOD FOR CALCULATING A RECORDING TRAJECTORY
20190170667 · 2019-06-06 ·

A calculating unit for calculating a recording trajectory of a CT system has a receive interface, an optimizer and a control unit. The receive interface serves for receiving measurement and simulation data relative to the object to be recorded. The optimizer is configured to determine the recording trajectory based on known degrees of freedom of the CT system, based on the measurement and simulation data and based on a test task from a group having a plurality of test tasks. The control unit is configured to output data in correspondence with the recording trajectory for controlling the CT system.

X-RAY SIDESCATTER INSPECTION OF LAMINATES
20180202949 · 2018-07-19 ·

Systems and methods are provided for detecting gaps in composite parts. One method includes radiating a beam of x-rays in a firing direction towards surface of a multi-layer Carbon Fiber Reinforced Polymer (CFRP) part, acquiring data indicating intensity of sidescatter radiation received at an x-ray detector that extends along the CFRP part in the firing direction, and examining the acquired data for gaps at the CFRP part based on differences in intensity indicated by the data.

Void evaluation apparatus and void evaluation method in the solder

A void evaluation apparatus in a solder includes an evaluation function calculation unit for calculating a solder evaluation function by using a pixel value pi contained in the voids that is set to 1 and the pixel value pi not contained in the voids is 0 for each pixel constituting an image in the solder, and by using a weight function w(ri), which is maximum at a solder center (ri=0), and is 0 at a maximum radius (ri=r0) for a distance ri from the solder center. The apparatus further has a void evaluation unit for evaluating that the influence of voids is larger as the evaluation function is relatively larger for the each solder. .Math. i = 1 N w ( r i ) p i .Math. i = 1 N w ( r i ) 100 i: pixel number (1N) pi: pixel value (0 or 1) w(ri): weighting function

Performance evaluation method for elastic material

A performance evaluation method for elastic material including rubber or elastomer, the method includes a step of applying a strain to a test piece made of the elastic material to form at least one void inside the test piece, a step of obtaining projected images of the test piece by irradiating the test piece with X-rays at a plurality of times after the at least one void is formed, and a step of obtaining a volume change of the at least one void between the plurality of times based on the projected images, as one of indexes of performance.

Handheld inspection device and method of inspecting an infrastructure having a structure wall supported into material
12259342 · 2025-03-25 · ·

There is described a handheld inspection device for inspecting an infrastructure having a structure wall at least partially supported into material such as soil. The handheld inspection device generally has a portable frame; a high energy photon source mounted to said portable frame and having a radioactivity level below a threshold radioactivity level; a scattered photon detector mounted to said portable frame and having a field of view diverging towards said target region of said infrastructure and encompassing at least a portion thereof, said scattered photon detector detecting scatter events incoming from said target region during a given period of time, and generating a signal indicative of scatter events detected during said period of time; and a controller receiving said signal generated by said scattered photon detector; and generating an integrity indication associated to said target region of said infrastructure based on said received signal.