The present invention relates to an ultrasonic testing apparatus with a variable frequency, which can automatically change the frequency according to thickness and thereby detect internal defects in objects having various thicknesses. The ultrasonic testing apparatus may comprise: a nozzle jetting a medium toward an object so as to form a medium column; and a plurality of probes disposed in the nozzle so as to generate ultrasonic waves.

A cable inspection device non-destructively inspects a cable used for supporting a bridge. The cable inspection device includes a neutron source and a neutron detection device. The neutron source emits neutrons to the cable. The neutron detection device includes a detection surface arranged outside the cable, and detects target neutrons and measures the number of the detected target neutrons when neutrons are emitted to the cable. The target neutrons are among the neutrons released from the cable and incident on the detection surface, and each have an energy equal to or lower than a predetermined value that is lower than an energy of a fast neutron.

A cable inspection device non-destructively inspects a cable used for supporting a bridge. The cable inspection device includes a neutron source and a neutron detection device. The neutron source emits neutrons to the cable. The neutron detection device includes a detection surface arranged outside the cable, and detects target neutrons and measures the number of the detected target neutrons when neutrons are emitted to the cable. The target neutrons are among the neutrons released from the cable and incident on the detection surface, and each have an energy equal to or lower than a predetermined value that is lower than an energy of a fast neutron.

A method of inspecting metallic container components (10) provides indexing a container component (10) produced from a metallic material into axial alignment with a probe (110). The probe (110) has a coil (176) produced from an electrical conductor. An alternating current (183) is applied to the coil (176) wherein a first magnetic field (184) is generated. An eddy current (188) develops in the container component (10) in response to the first magnetic field (184). A second magnetic field (192) is generated in response to the eddy current (188). Changes in an impedance amplitude and phase angle in the coil (176) are measured. A determination of the fitness for use of the container component (10) is made based on the measured changes in the impedance amplitude and phase angle in the coil (176).

A method of inspecting metallic container components (10) provides indexing a container component (10) produced from a metallic material into axial alignment with a probe (110). The probe (110) has a coil (176) produced from an electrical conductor. An alternating current (183) is applied to the coil (176) wherein a first magnetic field (184) is generated. An eddy current (188) develops in the container component (10) in response to the first magnetic field (184). A second magnetic field (192) is generated in response to the eddy current (188). Changes in an impedance amplitude and phase angle in the coil (176) are measured. A determination of the fitness for use of the container component (10) is made based on the measured changes in the impedance amplitude and phase angle in the coil (176).

A corrosion monitoring system includes one or more objects coupled to respective portions of a transformer tank. The one or more objects are configured to corrode before the respective portions of the transformer tank. At least one optical sensor is coupled to each of the objects. The at least one optical sensor has an optical output that changes in response to strain of the object. An analyzer is coupled to the at least one optical sensor. The analyzer is configured to perform one or more of detecting and predicting corrosion of the transformer tank based on the output of the at least one optical sensor.

A corrosion monitoring system includes one or more objects coupled to respective portions of a transformer tank. The one or more objects are configured to corrode before the respective portions of the transformer tank. At least one optical sensor is coupled to each of the objects. The at least one optical sensor has an optical output that changes in response to strain of the object. An analyzer is coupled to the at least one optical sensor. The analyzer is configured to perform one or more of detecting and predicting corrosion of the transformer tank based on the output of the at least one optical sensor.

A method for determining an amount of metallic impurities within silicon. The method includes the steps of (a) providing a rodlike silicon sample and a rodlike seed crystal in a zone melting apparatus, (b) zone melting to form a single silicon crystal having a conical end region with a droplike melt forming at the end of the single silicon crystal in a separation step, (c) cooling of the droplike melt to form a solidified silicon drop, (d) partial or complete dissolution of the silicon drop in an acid, and analyzing the solution obtained in step (d) by a trace analysis technique. Wherein the separation step further includes a remelting step for the silicon sample to reduce its diameter, forming a droplike melting zone, and separation of the seed crystal and the silicon sample by moving the seed crystal and the silicon sample apart from one another.

A method for determining an amount of metallic impurities within silicon. The method includes the steps of (a) providing a rodlike silicon sample and a rodlike seed crystal in a zone melting apparatus, (b) zone melting to form a single silicon crystal having a conical end region with a droplike melt forming at the end of the single silicon crystal in a separation step, (c) cooling of the droplike melt to form a solidified silicon drop, (d) partial or complete dissolution of the silicon drop in an acid, and analyzing the solution obtained in step (d) by a trace analysis technique. Wherein the separation step further includes a remelting step for the silicon sample to reduce its diameter, forming a droplike melting zone, and separation of the seed crystal and the silicon sample by moving the seed crystal and the silicon sample apart from one another.

Provided is a sheet inspection device capable of saving space, reducing member costs, and reducing the number of maintenance steps. A first light source Ls1 and a first inspection part S1 for inspecting a flaw on the front surface of a sheet and a second light source Ls2 and a second inspection part S2 for inspecting a flaw on the back surface of the sheet are disposed in such a positional relationship that when the sheet has a hole, the first inspection part S1 can detect light emitted by the second light source and transmitted through the hole in the sheet.