The present invention relates to a detection device (6) for detecting photons emitted by a radiation source (2). The detection device (6) is configured to detect the photons during a first time period. The detection device (6) comprises a sensor (10) having an intermediate direct conversion material for converting photons into electrons and holes, a shaping element (20), and a compensation unit (450, INT, 950). The compensation unit (450, INT, 950) is adapted to provide a compensation signal based on the electrical pulse and on a photoconductive gain of said sensor (10). The core of the invention is to provide circuits to reduce artifacts due to inherent errors with direct conversion detectors in spectral computed tomography by determining a compensation current, by detecting or monitoring a baseline restorer feedback signal, or by ignoring signals above the baseline level.

A self-powered nuclear radiation detector. The self-powered nuclear radiation detector includes a cable assembly, a temperature compensation assembly, and a metallic outer sheath. The cable assembly includes a metallic signal lead, an insulative material surrounding the metallic signal lead, and a metallic sheath surrounding the insulative material. The temperature compensation assembly includes a second metallic signal lead, a second insulative material surrounding the second metallic signal lead, and a second metallic sheath surrounding the second insulative material. The metallic outer sheath surrounds the cable assembly and the temperature compensation assembly.

A self-powered nuclear radiation detector. The self-powered nuclear radiation detector includes a cable assembly, a temperature compensation assembly, and a metallic outer sheath. The cable assembly includes a metallic signal lead, an insulative material surrounding the metallic signal lead, and a metallic sheath surrounding the insulative material. The temperature compensation assembly includes a second metallic signal lead, a second insulative material surrounding the second metallic signal lead, and a second metallic sheath surrounding the second insulative material. The metallic outer sheath surrounds the cable assembly and the temperature compensation assembly.

A radiation particle strike detection system is disclosed. The radiation particle strike detection system includes a radiation particle detector and a controller coupled to the radiation particle detector. The radiation particle detector is overlayed on at least one surface of a payload that is sensitive to interaction with radiation particles. The radiation particle detector is configured to undergo a change in state responsive to a radiation particle strike at a location on the radiation particle detector. The controller is configured to 1) monitor a state of the radiation particle detector; 2) detect a radiation particle strike on the radiation particle detector based on a change in state of the radiation particle detector; and 3) determine a location and time of the radiation particle strike on the radiation particle detector based on the change in state of the particle detector.

To provide a radiation analyzer that can perform analyses by a long-term stable and high energy resolution without correcting a current flowing through a transition edge sensor (hereinafter referred to as TES) or a pulse height value of a signal pulse. The radiation analyzer includes: a TES 1 configured to detect radiation; a current detection mechanism 4 configured to detect a current flowing through the TES 1; a pulse height analyzer 5 configured to measure a pulse height value based on the current detected by the current detection mechanism 4; a baseline monitor mechanism 6 configured to detect a baseline current flowing through the TES 1; a first heater 13 whose output is adjusted to stabilize a temperature of a first thermometer 12 disposed in a cold head that cools the TES 1; and a second heater 14 that is disposed fairly close to the TES 1 and whose output is adjusted to stabilize a baseline current.

To provide a radiation analyzer that can perform analyses by a long-term stable and high energy resolution without correcting a current flowing through a transition edge sensor (hereinafter referred to as TES) or a pulse height value of a signal pulse. The radiation analyzer includes: a TES 1 configured to detect radiation; a current detection mechanism 4 configured to detect a current flowing through the TES 1; a pulse height analyzer 5 configured to measure a pulse height value based on the current detected by the current detection mechanism 4; a baseline monitor mechanism 6 configured to detect a baseline current flowing through the TES 1; a first heater 13 whose output is adjusted to stabilize a temperature of a first thermometer 12 disposed in a cold head that cools the TES 1; and a second heater 14 that is disposed fairly close to the TES 1 and whose output is adjusted to stabilize a baseline current.

A radiation detector (100) includes an insulating substrate (110), which includes a material that undergoes a change in an electrical property when subjected to ionizing radiation. A conductive film (112) is disposed in relation to a surface of the substrate. The conductive film (112) has a resistance that is a function of a state of the electrical property. A resistance measuring device measures resistance across the conductive film (112). The resistance measured by the resistance measuring device indicates an amount of ionizing radiation to which the substrate (110) has been subjected. In a method of determining exposure to a type of radiation, a boron nitride substrate is exposed to a radiation environment. A resistance is measured across a conductive film disposed in relation to the boron nitride substrate. Radiation exposure is calculated as a function of the resistance.

A radiation detector (100) includes an insulating substrate (110), which includes a material that undergoes a change in an electrical property when subjected to ionizing radiation. A conductive film (112) is disposed in relation to a surface of the substrate. The conductive film (112) has a resistance that is a function of a state of the electrical property. A resistance measuring device measures resistance across the conductive film (112). The resistance measured by the resistance measuring device indicates an amount of ionizing radiation to which the substrate (110) has been subjected. In a method of determining exposure to a type of radiation, a boron nitride substrate is exposed to a radiation environment. A resistance is measured across a conductive film disposed in relation to the boron nitride substrate. Radiation exposure is calculated as a function of the resistance.

Solid-state radiation detectors utilizing a film as an alpha detection layer are provided. The detector can include a neutron conversion layer disposed thereon to enable neutron detection. The film can detect alpha particles from the ambient environment or emitted by the neutron conversion layer (if present) so the device can detect alpha particles and/or neutrons. The film can generate electron-hole pairs and can be disposed near a semiconductor material. The film can have a thickness of, for example, at least 100 nanometers.

A radiation particle strike detection system is disclosed. The radiation particle strike detection system includes a radiation particle detector and a controller coupled to the radiation particle detector. The radiation particle detector is overlayed on at least one surface of a payload that is sensitive to interaction with radiation particles. The radiation particle detector is configured to undergo a change in state responsive to a radiation particle strike at a location on the radiation particle detector. The controller is configured to 1) monitor a state of the radiation particle detector; 2) detect a radiation particle strike on the radiation particle detector based on a change in state of the radiation particle detector; and 3) determine a location and time of the radiation particle strike on the radiation particle detector based on the change in state of the particle detector.