A method and microscopy system are useful for recording an image of a sample region. A laser beam is directed onto the sample region with interface(s). An objective lens facilitates images the laser beam on a focusing point which lies on the optical axis of the objective lens or an axis parallel thereto, and which lies in a focusing plane. The objective lens and the sample region are displaced with respect to one another in relative fashion along the optical axis of the objective lens to different relative displacement positions. Intensity values of the laser beam are captured for a respective relative displacement position. A respective highest intensity value for a respective displacement position, a curve of the highest intensity values, and a reference relative displacement position from at least one maximum of the curve, are determined. Image(s) of the sample region is/are captured at the reference relative displacement position.

An auto-focusing system is disclosed. The system includes an illumination source. The system includes an aperture. The system includes a projection mask. The system includes a detector assembly. The system includes a relay system, the relay system being configured to optically couple illumination transmitted through the projection mask to an imaging system. The relay system also being configured to project one or more patterns from the projection mask onto a specimen and transmit an image of the projection mask from the specimen to the detector assembly. The system includes a controller including one or more processors configured to execute a set of program instructions. The program instructions being configured to cause the one or more processors to: receive one or more images of the projection mask from the detector assembly and determine quality of the one or more images of the projection mask.

For correcting aberration-induced imaging errors of an optical system which includes an objective (14) and an adaptive optic (18), light (5) and a sample (20) are selected such that the light (5), in acting upon the sample (20), reduces a measurement signal (28) from the sample (20), wherein a relative variation of the measurement signal (28) depends on the intensity of the light (5). The measurement signal (28) from a focal area of the optical system in the sample (20) is registered over a first and a later second period of time (38, 37) to determine a first measurement value and a second measurement value. Over a third period of time (39) which overlaps with the first and/or the second period of time, the light (5) is focused into the focal area by means of the optical system. A measure value for the relative variation of the measurement signal (28) is determined from the first and the second measurement values and used in controlling the adaptive optic (18) as a metric to be optimized.

A method for viewing a microscopy specimen is described. The method includes receiving a request to change a field of view of an optical microscope system that images the microscopy specimen. In response to the request, a current field of view is automatically changed to a new field of view. Parameters of the optical microscope system are automatically adjusted to align an illumination plane of a light sheet of the optical microscope system and a detection plane of the optical microscope system. The adjustment of parameters to align the illumination plane with the detection plane is based at least on precalibrated parameters that correspond to the new field of view, the illumination path objective, and the detection path objective.

A medical projection apparatus includes: a plurality of projectors each configured to project projection light onto an observation area of an observation optical system, wherein at least two or more projectors of the plurality of projectors are configured to respectively emit projection light to different planes including an optical axis of the observation optical system, and the projection light emitted by the two or more projectors cross each other in any position within a range of at least a possible working distance of the observation optical system.

The observation device includes an imaging optical system that includes an imaging lens forming an image of an observation target in a cultivation container, an operating section that performs at least one of a first operation of changing a focal length of the imaging optical system, a second operation of moving the imaging lens in an optical axis direction, or a fourth operation of moving the container in the optical axis direction, a detection section that detects a vertical position of the cultivation container, and an operation controller that controls the operating section based on the vertical position of the cultivation container.

By moving at least one of a culture container having a plurality of wells or an imaging optical system that forms an image of an observation target in each of the wells, an observation position in the culture container is scanned to observe the observation target. In a case where an auto-focus control for each observation position is performed, a start timing of the auto-focus control for each observation position is switched on the basis of a boundary portion between the adjacent wells in a scanning direction of the observation position.

An apparatus for measuring a surface topography of a patient's teeth may include an optical probe, a light source configured to generate incident light, and focusing optics configured to focus one or more wavelengths of the incident light to a fixed focal position external to the optical probe, wherein the fixed focal position is fixed relative to the optical probe. The apparatus may further include a light sensor configured to measure a characteristic of returned light generated by illuminating the patient's teeth with the incident light and a processing unit operable to determine the surface topography of the patient's teeth based on the measured characteristic of the returned light.

Techniques for acquiring focused images of a microscope slide are disclosed. During a calibration phase, a “base” focal plane is determined using non-synthetic and/or synthetic auto-focus techniques. Furthermore, offset planes are determined for color channels (or filter bands) and used to generate an auto-focus model. During subsequent scans, the auto-focus model can be used to quickly estimate the focal plane of interest for each color channel (or filter band) rather than re-employing the non-synthetic and/or synthetic auto-focus techniques.

Techniques for acquiring focused images of a microscope slide are disclosed. During a calibration phase, a “base” focal plane is determined using non-synthetic and/or synthetic auto-focus techniques. Furthermore, offset planes are determined for color channels (or filter bands) and used to generate an auto-focus model. During subsequent scans, the auto-focus model can be used to quickly estimate the focal plane of interest for each color channel (or filter band) rather than re-employing the non-synthetic and/or synthetic auto-focus techniques.