An optical device may include an optical fiber having a fixed end and a free end; a first actuator positioned at a actuator position between the fixed end and the free end and configured to apply a first force on the actuator position of the optical fiber such that a movement of the free end of the optical fiber in a first direction is caused, wherein the first direction is orthogonal to a longitudinal axis of the optical fiber; and a deformable rod disposed adjacent to the optical fiber, and having a first end and a second end, wherein the first end is connected to a first rod position of the optical fiber and the second end is connected to a second rod position of the optical fiber.

The present invention initially relates to a method for generating an image of a sample, said image being pieced together from a plurality of individual microscope images. A microscope is provided, for which a measurement value of a twist angle (δ) present between an image recording unit of the microscope and an object stage of the microscope and a measurement accuracy of this measurement value are known. There is a recording of a first individual microscope image of the sample using the microscope and a displacement of the image recording unit and the sample-supporting object stage relative to one another, whereupon a second individual microscope image (02) of the sample is recorded using the microscope. A search region is determined in the second or first individual microscope image, an overlap region between the individual microscope images being expected in said search region.

Diffraction-based imaging systems are described. Aspects of the technology relate to imaging systems having one or more sensors inclined at angles with respect to a sample plane. In some cases, multiple sensors may be used that are, or are not, inclined at angles. The imaging systems may have no optical lenses and are capable of reconstructing microscopic images of large sample areas from diffraction patterns recorded by the one or more sensors. Some embodiments may reduce mechanical complexity of a diffraction-based imaging system. A diffractive imaging system comprises a light source, a sample support configured to hold a sample along a first plane, and a first sensor comprising a plurality of pixels disposed in a second plane that is tilted at an inclined angle relative to the first plane. The first sensor is arranged to record diffraction images of the light source from the sample.

A calibration apparatus comprises estimation circuitry configured to estimate, based on a calibration factor, an estimated number of cells of a first type in a dyed biological sample containing an unknown number of cells. Determination circuitry determines the actual number of cells of the first type in the dyed biological sample. Processing circuitry adjusts the calibration factor. The estimation circuitry is configured with the processing circuitry to estimate the estimated number of the cells of the first type in the dyed biological sample one or more times, based on a different value of the calibration factor for each of the one or more times, until the estimated number of the cells of the first type approaches the actual number of cells of the first type.

This disclosure includes an imaging system that is configured to image in parallel multiple focal planes in a sample uniquely onto its corresponding detector while simultaneously reducing blur on adjacent image planes. For example, the focal planes can be staggered such that fluorescence detected by a detector for one of the focal planes is not detected, or is detected with significantly reduced intensity, by a detector for another focal plane. This enables the imaging system to increase the volumetric image acquisition rate without requiring a stronger fluorescence signal. Additionally or alternatively, the imaging system may be operated at a slower volumetric image acquisition rate (e.g., that of a conventional microscope) while providing longer exposure times with lower excitation power. This may reduce or delay photo-bleaching (e.g., a photochemical alteration of the dye that causes it to no longer be able to fluoresce), thereby extending the useful life of the sample.

A re-scan microscope for forming an image of a sample is disclosed. The system comprises an illumination optical system for directing, and optionally focusing, illumination light at the sample herewith providing an illumination light spot at the sample. The illumination light spot causes emission light from the sample. The microscope system further comprises a detection optical system for focusing at least part of the emission light onto an imaging plane of an imaging system herewith causing an emission light spot on the imaging plane. The microscope system also comprises a rotatable element for, when rotating, moving the illumination light spot over and/or through the sample and simultaneously moving the emission light spot over said imaging plane of the imaging system. The rotatable element comprises at least two reflective surfaces.

A method of contrast enhancement of a three-dimensional light sheet microscopy image formed from N individual images each corresponding to a light sheet plane and spaced apart from each other in the z-direction by at least a distance d, the x/y-plane being the light sheet plane and the x-direction being the propagation direction of the light sheet of the light sheet plane, comprising:

Deconvolution of the three-dimensional image in the z-direction, comprising: For each intensity vector of N intensities (I.sub.x,y,1, . . . ,I.sub.x,y,N) having the same x/y value, performing a multiplication with a tridiagonal N×N deconvolution matrix, which assigns to each voxel (x, y, n) a correction parameter f1, with which, by the multiplication of the deconvolution matrix with the intensity vector, for a component I(x, y, n) of the intensity vector the intensities Ix, y,n+1 and Ix, y,n−1 of the corresponding voxels of the neighboring image plane are multiplied, before they are subtracted from the intensity value I(x, y,n).

A confocal scanner (21) according to the present disclosure includes a first pinhole array disk (211a), a second pinhole array disk (211b), a condensing element array disk (212) located between the first pinhole array disk (211a) and the second pinhole array disk (211b), a connecting shaft (213) connecting the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212), and a motor (214) configured, together with the connecting shaft (213), to rotate the first pinhole array disk (211a), the second pinhole array disk (211b), and the condensing element array disk (212). The first pinhole array disk (211a) is located at a first focal plane, the second pinhole array disk (211b) is located at a second focal plane.

The present invention relates to a photodetector array for capturing image data, comprising: photodetector cells arranged on a substrate, each including a single-photon avalanche diode, wherein the active areas of the photodetector cells are neighbored along a hexagonal grid; microlenses, having a hexagonal or circular shape, each arranged on one photodetector cell to focus light onto the photodiode.

A method and microscopy system are useful for recording an image of a sample region. A laser beam is directed onto the sample region with interface(s). An objective lens facilitates images the laser beam on a focusing point which lies on the optical axis of the objective lens or an axis parallel thereto, and which lies in a focusing plane. The objective lens and the sample region are displaced with respect to one another in relative fashion along the optical axis of the objective lens to different relative displacement positions. Intensity values of the laser beam are captured for a respective relative displacement position. A respective highest intensity value for a respective displacement position, a curve of the highest intensity values, and a reference relative displacement position from at least one maximum of the curve, are determined. Image(s) of the sample region is/are captured at the reference relative displacement position.