A fiber optic cable includes a plurality of optical fibers and an optical sensor. The optical sensor includes a first optical coupler and a first mirror. The first optical coupler is coupled to a first of the optical fibers and to a second of the optical fibers at a first sensor takeout location. The first mirror is coupled to the first of the optical fibers at a second sensor takeout location. The first sensor takeout location is longitudinally offset from the second sensor takeout location.

An interferometer includes a coherent light source and an array of electrically coupled light-sensitive pixel elements. The interferometer is configured to direct an internal optical path of the coherent light source and an external optical path of the coherent light source into a monolithic unit cell. In addition, the monolithic unit cell is configured to direct the internal optical path first through the monolithic unit cell and then onto the array and also configured to direct the external optical path back outside the monolithic unit cell through an external environment and then back into the monolithic unit cell and finally onto the array. In addition, interferometer is further configured to combine the internal optical path and the external optical path at the array and produce a first interferogram on the array, the interferogram characterizing an optical property of the external environment.

An optical filter assembly comprising: a tuneable optical filter; a beam splitter assembly configured to split an input beam into an output beam, a reference beam, and a probe beam, and to direct the output beam and the probe beam through the tuneable optical filter, such that the probe beam is at an angle α to the output beam; a first detector configured to measure the intensity S0 of the reference beam; a second detector configured to measure the intensity S1 of the probe beam after it has passed through the filter; a controller configured to adjust the tuneable optical filter on the basis of the measured intensities of the reference and probe beams.

A diagnostic system is provided with a plurality of semiconductor light emitters, each configured to generate an optical beam, and a beam combiner to generate a multiplexed optical beam. An optical fiber or waveguide communicates at least a portion of the multiplexed optical beam to form an output beam, wherein the output beam is pulsed. A filter, coupled to at least one of a lens and a mirror to receive at least a portion of the output beam, forms an output light. A beam splitter splits the light into a sample arm and a reference arm and directs at least a portion of the sample arm light to a sample. A detection system is configured to receive from the sample at least a portion of reflected sample light, to generate a sample detector output, and to use a lock-in technique with the pulsed output beam.

An optical device includes a modulator and a tap coupler. The modulator includes an optical waveguide that is formed of a thin-film lithium niobate (LN) substrate and through which light passes, and an electrode that applies voltage to the optical waveguide, and modulates a phase of light that passes through the optical waveguide in accordance with an electric field in the optical waveguide, where the electric field corresponds to the voltage. The tap coupler includes at least a part formed of the thin-film LN substrate, and splits a part of the light that passes through an inside of the optical waveguide. The tap coupler includes a delayed interferometer that splits a part of the light that passes through the optical waveguide, at a split ratio corresponding to a phase difference of light that passes through an inside of the tap coupler from the optical waveguide.

An optical filter assembly comprising: a tuneable optical filter; a beam splitter assembly configured to split an input beam into an output beam, a reference beam, and a probe beam, and to direct the output beam and the probe beam through the tuneable optical filter, such that the probe beam is at an angle to the output beam; a first detector configured to measure the intensity S0 of the reference beam; a second detector configured to measure the intensity S1 of the probe beam after it has passed through the filter; a controller configured to adjust the tuneable optical filter on the basis of the measured intensities of the reference and probe beams.

A directly modulated semiconductor laser whose optical output can be modulated by varying the transmittance of an end reflector of the laser cavity. In an example embodiment, the end reflector can be implemented using a lightwave circuit in which optical waveguides are arranged to form an optical interferometer. At least one of the optical waveguides may include a waveguide section configured to modulate the phase of an optical beam passing therethrough in response to an electrical radio-frequency drive signal in a manner that causes the transmittance and reflectance of the end reflector to be modulated accordingly. Advantageously, relatively high (e.g., >10 GHz) phase and/or amplitude modulation speeds of the optical output can be achieved in this manner to circumvent the inherent modulation-speed limitations of the laser's gain medium.

A fiber optic cable includes a plurality of optical fibers and an optical sensor. The optical sensor includes a first optical coupler and a first mirror. The first optical coupler is coupled to a first of the optical fibers and to a second of the optical fibers at a first sensor takeout location. The first mirror is coupled to the first of the optical fibers at a second sensor takeout location. The first sensor takeout location is longitudinally offset from the second sensor takeout location.

A diagnostic system is provided with a plurality of semiconductor light emitters, each configured to generate an optical beam, and a beam combiner to generate a multiplexed optical beam. An optical fiber or waveguide communicates at least a portion of the multiplexed optical beam to form an output beam, wherein the output beam is pulsed. A filter, coupled to at least one of a lens and a mirror to receive at least a portion of the output beam, forms an output light. A beam splitter splits the light into a sample arm and a reference arm and directs at least a portion of the sample arm light to a sample. A detection system is configured to receive from the sample at least a portion of reflected sample light, to generate a sample detector output, and to use a lock-in technique with the pulsed output beam.

A light module includes an optical element and a base on which the optical element is mounted. The optical element has an optical portion which has an optical surface; an elastic portion which is provided around the optical portion such that an annular region is formed; and a pair of support portions which is provided such that the optical portion is sandwiched in a first direction along the optical surface and in which an elastic force is applied and a distance therebetween is able to be changed in accordance with elastic deformation of the elastic portion. The base has a main surface, and a mounting region in which an opening communicating with the main surface is provided. The support portions are inserted into the opening in a state where an elastic force of the elastic portion is applied.