A data driven approach for fault detection in robotic actuation is disclosed. Here, a set of robotic tasks are received and analyzed by a Deep Learning (DL) analytics. The DL analytics includes a stateful (Long Short Term Memory) LSTM. Initially, the stateful LSTM is trained to match a set of activities associated with the robots based on a set of tasks gathered from the robots in a multi robot environment. Here, the stateful LSTM utilizes a master slave framework based load distribution technique and a probabilistic trellis approach to predict a next activity associated with the robot with minimum latency and increased accuracy. Further, the predicted next activity is compared with an actual activity of the robot to identify any faults associated robotic actuation.

A system and method for unsupervised prediction of machine failures. The method includes monitoring sensory inputs related to at least one machine; analyzing, via at least unsupervised machine learning, the monitored sensory inputs, wherein the output of the unsupervised machine learning includes at least one indicator; identifying, based on the at least one indicator, at least one pattern; and determining, based on the at least one pattern and the monitored sensory inputs, at least one machine failure prediction.

A diagnostic system includes an acquirer configured to acquire current waveform data representing a waveform relating to a current supplied to a driving device of an apparatus and a determiner configured to determine a degree of abnormality in the apparatus from a varying portion of the waveform, the varying portion corresponding to a varying time period during which a rotation speed of the driving device increases or decreases.

An event estimation system includes an upper device, and a lower controller device including first circuitry that acquires operation information of a control target device connected to the lower controller device, estimates a presence or absence of an abnormality based on the operation information, holds the operation information for a certain time period, and transmits, based on the presence or absence of an abnormality and to the upper device, the operation information related to the estimation of the presence or absence of the abnormality. The upper device has second circuitry that receives the operation information from the lower controller device, and operates according to the presence or absence of the abnormality, inputs, using an upper neural network model, the operation information, output event information, and estimates an event.

A method of detecting and classifying anomalies during semiconductor processing includes executing a wafer recipe a semiconductor processing system to process a semiconductor wafer; monitoring sensor outputs from a sensors that monitor conditions associated with the semiconductor processing system; providing the sensor outputs to models trained to identify when the conditions associated with the semiconductor processing system indicate a fault in the semiconductor wafer; receiving an indication of a fault from at least one of the models; and generating a fault output in response to receiving the indication of the fault.

A method includes receiving, from one or more sensors associated with manufacturing equipment, current trace data associated with producing, by the manufacturing equipment, a plurality of products. The method further includes performing signal processing to break down the current trace data into a plurality of sets of current component data mapped to corresponding component identifiers. The method further includes providing the plurality of sets of current component data and the corresponding component identifiers as input to a trained machine learning model. The method further includes obtaining, from the trained machine learning model, one or more outputs indicative of predictive data and causing, based on the predictive data, performance of one or more corrective actions associated with the manufacturing equipment.

Techniques to facilitate predictive maintenance for industrial assets in an industrial automation environment are disclosed herein. In at least one implementation, a computing system receives a plurality of industrial automation process variables associated with at least one industrial asset employed in an industrial automation process. The industrial automation process variables are fed into a machine learning model associated with the at least one industrial asset to generate a future maintenance event prediction for the at least one industrial asset. The future maintenance event prediction for the at least one industrial asset is provided to an industrial controller that controls the at least one industrial asset.

A quality management apparatus includes an acquisition unit and an extraction unit. The acquisition unit acquires, about products to be managed, a rate of occurrence of a malfunction on an occurrence period basis, an operation condition of the products, and a manufacturing condition for the products. The extraction unit classifies the rate of occurrence into layers under the operation condition, and extracts, for each layer under the operation condition, a relationship between the rate of occurrence and the manufacturing condition.

Methods, systems, and non-transitory computer readable medium are described for sensor metrology data integration. A method includes receiving sets of sensor data and sets of metrology data. Each set of sensor data includes corresponding sensor values associated with producing corresponding product by manufacturing equipment and a corresponding sensor data identifier. Each set of metrology data includes corresponding metrology values associated with the corresponding product manufactured by the manufacturing equipment and a corresponding metrology data identifier. The method further includes determining common portions between each corresponding sensor data identifier and each corresponding metrology data identifier. The method further includes, for each of the sensor-metrology matches, generating a corresponding set of aggregated sensor-metrology data and storing the sets of aggregated sensor-metrology data to train a machine learning model. The trained machine learning model is capable of generating one or more outputs for performing a corrective action associated with the manufacturing equipment.

In order to provide a method for predicting process deviations in an industrial-method plant, for example a painting plant, by means of which process deviations are predictable simply and reliably, it is proposed according to the invention that the method should comprise the following: automatic generation of a prediction model; prediction of process deviations during operation of the industrial-method plant, using the prediction model.