G05B2219/33322

Controller-equipped machining apparatus having machining time measurement function and on-machine measurement function

A machining apparatus is provided with a machine learning device that performs machine learning. The machine learning device performs the machine learning by receiving the input of machining accuracy between a machining shape of a workpiece measured on-machine and design data on the workpiece and machining time of the workpiece measured by a measurement device. Based on a result of the machine learning, the machining apparatus changes machining conditions such that the machining accuracy increases and the machining time becomes as short as possible.

Systems and methods for adaptive troubleshooting of semiconductor manufacturing equipment

A system includes a processing device, operatively coupled to the memory device, to perform operations comprising obtaining a plurality of sensor values associated with a deposition process performed, according to a recipe, in a process chamber to deposit film on a surface of a substrate; generating a manufacturing data graph based on the plurality of sensor values; receiving, via a user interface, a selection of a data point on the manufacturing graph; receiving failure data associated with the data point; and storing, in a data structure, the failure data to be accessible via the user interface presenting the manufacturing data graph.

SYSTEMS AND METHODS FOR ADAPTIVE TROUBLESHOOTING OF SEMICONDUCTOR MANUFACTURING EQUIPMENT
20240353812 · 2024-10-24 ·

A system includes a processing device, operatively coupled to the memory device, to perform operations comprising obtaining a plurality of sensor values associated with a deposition process performed, according to a recipe, in a process chamber to deposit film on a surface of a substrate. A machine-learning model is applied to the plurality of sensor values. The machine-learning model is trained based on historical sensor data of a sub-system of the process chamber and task data associated with the recipe for depositing the film. An output of the machine-learning model is generated that is indicative of a suspected failure of the sub-system and a corrective action is generated based on the suspected failure of the sub-system.

NUMERICAL CONTROLLER AND MACHINE LEARNING DEVICE
20180164781 · 2018-06-14 ·

To provide a numerical controller and a machine learning device that predict an abnormality, based on machine learning with perception of temporal change in data. The numerical controller includes the machine learning device provided with a learning unit that conducts machine learning of trends in operation of a machine on occasions of occurrence of abnormalities in the machine, based on time-series data acquired by a data logger device and relating to the operation of the machine and abnormality information relating to the abnormalities which have occurred in the machine and a prediction unit that predicts an abnormality which will occur in the machine, based on results of the machine learning in the learning unit and time-series data acquired by the data logger device and relating to current operation of the machine.

Motor control apparatus with magnetic flux controller and machine learning apparatus and method therefor
09977411 · 2018-05-22 · ·

A machine learning apparatus that learns a condition associated with a gain of a magnetic flux controller and a time constant of a magnetic flux estimator in a motor control apparatus includes: a state observation unit that observes a state variable defined by at least one of data relating to an acceleration of a motor, data relating to a jerk of the motor, and data relating to an acceleration time of the motor; and a learning unit that learns the condition associated with the gain of the magnetic flux controller and the time constant of the magnetic flux estimator in accordance with a training data set defined by the state variable.

COMPUTER-IMPLEMENTED METHOD AND SYSTEM FOR AUTOMATICALLY MONITORING AND DETERMINING THE STATUS OF ENTIRE PROCESS SEGMENTS IN A PROCESS UNIT
20170082988 · 2017-03-23 · ·

The invention relates to a method and a computer-implemented system for automatically monitoring and determining the status of entire process sections in a process unit in a computer-implemented manner.

CONTROLLER-EQUIPPED MACHINING APPARATUS HAVING MACHINING TIME MEASUREMENT FUNCTION AND ON-MACHINE MEASUREMENT FUNCTION

A machining apparatus is provided with a machine learning device that performs machine learning. The machine learning device performs the machine learning by receiving the input of machining accuracy between a machining shape of a workpiece measured on-machine and design data on the workpiece and machining time of the workpiece measured by a measurement device. Based on a result of the machine learning, the machining apparatus changes machining conditions such that the machining accuracy increases and the machining time becomes as short as possible.

MOTOR CONTROL APPARATUS WITH MAGNETIC FLUX CONTROLLER AND MACHINE LEARNING APPARATUS AND METHOD THEREFOR
20170031331 · 2017-02-02 ·

A machine learning apparatus that learns a condition associated with a gain of a magnetic flux controller and a time constant of a magnetic flux estimator in a motor control apparatus includes: a state observation unit that observes a state variable defined by at least one of data relating to an acceleration of a motor, data relating to a jerk of the motor, and data relating to an acceleration time of the motor; and a learning unit that learns the condition associated with the gain of the magnetic flux controller and the time constant of the magnetic flux estimator in accordance with a training data set defined by the state variable.

Systems and methods for adaptive troubleshooting of semiconductor manufacturing equipment

A system includes a processing device, operatively coupled to the memory device, to perform operations comprising obtaining a plurality of sensor values associated with a deposition process performed, according to a recipe, in a process chamber to deposit film on a surface of a substrate. A machine-learning model is applied to the plurality of sensor values. The machine-learning model is trained based on historical sensor data of a sub-system of the process chamber and task data associated with the recipe for depositing the film. An output of the machine-learning model is generated that is indicative of a suspected failure of the sub-system and a corrective action is generated based on the suspected failure of the sub-system.