The invention relates an apparatus for analysing movement of an arrangement made of a plurality of bodies assigned to a platform, of which at least one is provided with a drive, in particular of the hexapod type or of the articulated arm type, having means for vibration analysis and/or force analysis. According to the invention, the apparatus has in a modular construction a vibration analysis module for analytically determining natural vibration modes of the bodies and/or of the platform in respect of at least one of the following variables: frequency, centre of rotation of the torsional component of the vibrations, axis of rotation of torsional vibration, displacement vector of a Cartesian vibration, amplitude ratio of the vibrations in relation to one another, and/or a force analysis module for analytically determining the acceleration forces and/or weights and/or torques, occurring on a predetermined trajectory, in respect of the bodies and/or the platform.

The invention relates to a device and method for electrical testing of an electrical component, the component including at least one electrical contact point. The device includes: an interface for providing the electrical component; a first robot manipulator having an effector, which is configured and constructed for picking up, handling and releasing the electrical component; a mechanical receiving interface into which the electrical component is insertable; a contacting device having at least one electrical counter contact, the contacting device being positioned in a first state in such a manner that space is available for the first robot manipulator to be able to insert/remove the electrical component into/from the receiving interface, and the contacting device being positioned in a second condition in such a manner that the at least one counter contact is connected to the at least one contact point of the electrical component which has been inserted into the receiving interface; an analysis unit connected to the at least one counter contact, the analysis unit being configured and constructed to perform electrical testing of the electrical component using the electrical connection of the at least one counter contact and the at least one contact point in the second state and to provide and/or output a test result; and a control unit for automated control of the first robot manipulator and the contacting device.

A monitoring terminal in a manufacturing process which is able to detect and correct a faulty product-testing machine includes a communication module, a determining module, and a recording module. The communication module receives a test log transmitted from at least one product-testing machine communicating with the monitoring terminal. The test log includes identification of the product-testing machine and status thereof. The determining module can determine according to the test log whether the product-testing machine is faulty according to several conditions. The recording module records the identification of the machine in a fault information list when the machine is deemed faulty. A robot and a method for testing products and the product-testing machines themselves are also disclosed.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to and operable to stress a smart device in an enclosure, wherein the enclosure comprises a plurality of components, and wherein the system controller comprises: (a) a memory comprising test logic; and (b) a processor configured to automatically control the plurality of components and test the smart device in accordance with the test logic. Further, the plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto, wherein the stylus is operable to manipulate the smart device; and (b) a platform comprising a device holder affixed thereto, wherein the device holder is operable to receive the smart device, and wherein the platform and the robotic arm are robotically controlled to move by the processor.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller coupled to a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The enclosure comprises a plurality of components, wherein the processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic. The plurality of components comprises: (a) a robotic arm comprising a stylus affixed thereto; and (b) a platform comprising a device holder affixed thereto, wherein the smart device is inserted into the device holder; and (c) a wireless access point. The processor is further configured to: (a) control the smart device to activate wireless mode; (b) receive wireless signals from the wireless access point using the smart device; (c) retrieve wireless scan results from the smart device; and (d) analyze the wireless scan results.

An automatic system level testing (ASLT) system for testing smart devices is disclosed. The system comprises a system controller operable to be coupled with a smart device in an enclosure, wherein the system controller comprises a memory comprising test logic and a processor. The system also comprises the enclosure, wherein the enclosure comprises a plurality of components, the plurality of components comprising: (i) a robotic arm comprising a stylus, wherein the stylus is operable to manipulate the smart device to simulate human interaction therewith; and (ii) a platform comprising a device holder, wherein the device holder is operable to receive a smart device inserted there into. The processor is configured to automatically control the smart device and the plurality of components in accordance with the test logic.

In an approach to non-functional requirement stimulus testing of a robot, one or more computer processors receive one or more stimulus parameters to test. The one or more computer processors trigger the one or more stimulus parameters in the robot. The one or more computer processors determine at least one response time to the one or more stimulus parameters.