Provided is a spot detection device including an imager configured to capture a display panel displaying a first image of a first grayscale and a second image of a second grayscale different from the first grayscale and generate image data, and a spot detector configured to receive the image data from the imager in order to detect a spot. The image data includes first image data obtained by capturing the first image, second image data obtained by capturing the second image, and a plurality of third image data obtained by capturing portions of the first image.

Embodiments are described herein for an electronic device, system and method for remotely detecting whether or not the electronic device has a screen protector placed over its display screen. The electronic device is placed face-down on a flat, opaque surface, such that the display screen and front camera of the electronic device are also face-down and the electronic device takes a series of photos with the camera. The series of photos is analyzed to determine whether or not the screen protector is attached to the display screen of the electronic device, which can be communicated electronically.

Systems and methods for classifying products are disclosed. A first data sample having a first portion and a second portion is identified from a training dataset. A first mask is generated based on the first data sample, where the first mask is associated with the first portion of the first data sample. A second data sample is generated based on a noise input. The first mask is applied to the second data sample for outputting a third portion of the second data sample. The third portion of the second data sample is combined with the second portion of the first data sample for generating a first combined data sample. Confidence and classification of the first combined data sample are predicted. The first combined data sample is added to the training dataset in response to predicting the confidence and the classification.

A device to detect and analyze defects in a finished surface includes a supporting mechanism, a transmitting mechanism, a detecting mechanism, and a processor. The transmitting mechanism carries and transmits the product. The detecting mechanism includes a detecting frame, a light source assembly. The processor is used to connect to a first camera module and a second camera module, and preprocess the first image and the second image to obtain a detection and analysis of any defects of the front of the product.

The present invention relates to a method, system and computer program product for defect enhancement. According to the method, a plurality of proposed regions from a plurality of images taken for a display panel is obtained. Each of proposed region of the plurality of proposed regions include a suspected defect on the display panel. At least two proposed regions from the plurality of proposed regions that deserve to be superimposed based on a set of conditions is determined. The at least two proposed regions for acquiring an enhanced defect are superimposed.

A method of manufacturing a display device includes preparing a cover substrate assembly including a cover substrate, a protective film attached to a lower surface of the cover substrate, and an inspection pattern disposed between the cover substrate and the protective film, obtaining a first image by imaging the inspection pattern through an upper surface of the cover substrate, obtaining noise data by comparing a reference image of the inspection pattern with the first image, obtaining a second image by imaging the cover substrate assembly, obtaining a corrected image of the second image by reflecting the noise data in the second image, and detecting a defect of the cover substrate based on the corrected image of the second image.

Some embodiments provide a method for calculating parasitic parameters for a pattern to be manufactured on an integrated circuit (IC) substrate. The method receives a definition of a wire structure as input. The method rasterizes the wire structure (e.g., produces pixel-based definition of the wire structure) to produce several images. Before rasterizing the wire structure, the method in some embodiments decomposes the wire structure into several components (e.g., several wires, wire segments or wire structure portions), which it then individually rasterizes. The method then uses the images as inputs to a neural network, which then calculates parasitic parameters associated with the wire structure. In some embodiments, the parasitic parameters include unwanted parasitic capacitance effects exerted on the wire structure. Conjunctively, or alternatively, these parameters include unwanted parasitic resistance and/or inductance effects on the wire structure.

Provided are a method for detecting display screen quality, an apparatus, an electronic device and a storage medium. The method includes: receiving a quality detection request sent by a console deployed on a display screen production line, the quality detection request including a display screen image collected by an image collecting device on the display screen production line; inputting the display screen image into a defect detection model to obtain a defect detection result, the defect detection model being obtained by training historical defective display screen images using a structure of deep convolutional neural networks and an object detection algorithm; and determining, according to the defect detection result, a defect on a display screen corresponding to the display screen image, a defect category corresponding to the defect, and a position corresponding to the defect.

The present disclosure provides a detection device of a display panel. The detection device includes: an image receiver configured to receive a detection image of a display panel to be detected; a detector configured to input the detection image of the display panel to be detected into a detection model and generate a detection result by the detection model, the detection model is pre-constructed and configured to detect the display panel. The disclosure also provides a detection method of the display panel, an electronic device and a computer readable medium.

An inspection device, and a method of inspecting and a method of repairing a display panel using the inspection device are provided. The method of inspecting the display panel including light emitting elements includes acquiring an image of the display panel, and determining an alignment degree of the light emitting elements in the display panel.