A LIDAR device includes an input node, an output node, and a sample-and-convert circuit. The input node receives a photodetector signal, and the output node generates an output signal indicating a light intensity value of the photodetector signal. The sample-and-convert circuit includes a number of detection channels coupled in parallel between the input node and the output node. In some aspects, each of the detection channels may be configured to sample a value of the photodetector signal during the sample mode and to hold the sampled value during the convert mode using a single capacitor.

An ADC includes a plurality of sub ADCs configured to operate in a time-interleaved manner and a sampling circuit configured to receive an analog input signal of the ADC, wherein the sampling circuit is common to all sub ADCs. The ADC includes a test signal generation circuit configured to generate a test signal for calibration of the ADC. The sampling circuit has a first input configured to receive the analog input signal and a second input configured to receive the test signal. The sampling circuit includes an amplifier circuit and a first feedback switch connected between an output of the amplifier circuit and an input of the amplifier circuit. The first feedback switch is configured to be closed during a first clock phase and open during a second clock phase, which is non-overlapping with the first clock phase.

An N-tap feedforward equalizer (FFE) comprises a set of N FFE taps coupled together in parallel, a filter coupled between the (N−1)th FFE tap and the Nth FFE tap, and a summer coupled to an output of the set of N FFE taps. Each FFE tap includes a unique sample-an-hold (S/H) circuit that generates a unique time-delayed signal and a unique transconductance stage that generates a unique transconductance output based on the unique time-delayed signal. The filter causes the N-tap FFE to have the behavior of greater than N taps. In some examples, the filter is a first order high pass filter that causes coefficients greater than N to have an opposite polarity of the Nth coefficient. In some examples, the filter is a first order low pass filter that causes coefficients greater than N to have the same polarity as the Nth coefficient.

A sample holding circuit includes a signal input terminal, a first sampling unit, a second sampling unit, and a holding unit. The signal input terminal receives a first reference voltage or a second reference voltage, the first sampling unit samples the first reference voltage when a first clock signal is triggered to obtain a first sampling voltage, the second sampling unit samples the second reference voltage when a second clock signal is triggered to obtain a second sampling voltage. The holding unit receives the first sampling voltage and the second sampling voltage when a third clock signal is triggered. The sample holding circuit effectively simplifies circuit structure and reduces the use of amplifiers, also improving the signal to noise ratio.

A sample holding circuit includes a signal input terminal, a first sampling unit, a second sampling unit, and a holding unit. The signal input terminal receives a first reference voltage or a second reference voltage, the first sampling unit samples the first reference voltage when a first clock signal is triggered to obtain a first sampling voltage, the second sampling unit samples the second reference voltage when a second clock signal is triggered to obtain a second sampling voltage. The holding unit receives the first sampling voltage and the second sampling voltage when a third clock signal is triggered. The sample holding circuit effectively simplifies circuit structure and reduces the use of amplifiers, also improving the signal to noise ratio.

Various embodiments provide apparatuses, systems, and methods for multibit analog representation, e.g., for in-memory computing. Embodiments may include a single-ended or differential ladder network to generate an analog value (e.g., a voltage or charge) based on a set of bits from a memory array. The ladder network may include a plurality of branches coupled to an output line, wherein individual branches include a capacitor with a first terminal coupled to the output line and a switch coupled to a second terminal of the capacitor. The switch may be controlled by a respective bit of the set of bits to selectively couple the second terminal of the capacitor to a first voltage node or a second voltage node based on a value of the respective bit. Other embodiments may be described and claimed.

Operating DC to DC power converters. At least some of the example embodiments are methods including: driving current through an inductance in a first on cycle of the power converter; comparing, by a comparator, a signal indicative of current through the inductance coupled to a first input of the comparator to a threshold applied to a second input of the comparator, and asserting a comparator output responsive to the signal indicative of current meeting the threshold; sampling a differential voltage across the first and second inputs, the sampling responsive to assertion of a comparator output, and the differential voltage indicative of propagation delay through the comparator; and compensating the comparator in a second on cycle for the compensation delay based on the differential voltage, the second on cycle subsequent to the first on cycle.

A sample-and-hold amplification circuit can include a sampling circuit configured to sample first and second input signals in response to first and second control signals to generate first and second sampled signals, an amplification circuit configured to amplify a voltage difference between the first and second sampled signals to generate first and second output signals, and an offset compensation circuit configured to form a first path between input and output terminals of the amplification circuit in response to the first control signal to store an offset of the input terminal and form a second path between the input and output terminals in response to the second control signal to reflect the offset to the output terminal.

An in-memory processing apparatus includes: a memory cell array comprising memory cell groups configured to generate current sums of column currents flowing through respective column lines in response to input signals input through row lines; voltage controlled delay circuits configured to output, in response to an input of a start signal at a first time point, stop signals at second time points delayed by delay times determined based on magnitudes of applied sampling voltages corresponding to the current sums; a time-digital converter configured to perform time-digital conversion at the second time points; and sampling resistors connected to the column lines, wherein the time-digital converter is configured to reset a counter at the first time point, and output counting values as digital values at the second time points.

A comparator may include: a comparison block suitable for comparing a ramp signal and a pixel signal, and outputting a comparison signal; a voltage adjusting block suitable for adjusting a clamping voltage; and an output voltage swing control block suitable for controlling an output voltage swing of the comparison block according to the clamping voltage from the voltage adjusting block.