The application provides a content addressable memory (CAM) memory device and a method for searching and comparing data thereof. The CAM memory device comprises: a plurality of CAM memory strings; and a sensing amplifier circuit coupled to the CAM memory strings; wherein in data searching, a search data is compared with a storage data stored in the CAM memory strings, the CAM memory strings generate a plurality of memory string currents, the sensing amplifier circuit senses the memory string currents to generate a plurality of sensing results: based on the sensing results, a match degree between the search data and the storage data is determined as one of the follows: all-matched, partially-matched and all-mismatched.

A memory device includes a memory cell array including memory blocks and a peripheral circuit coupled to the memory cell array. Each memory block includes memory strings each including dummy cells and select transistors, bit lines coupled to the memory strings, select lines including first select lines and second select lines, and one or more dummy word lines. Each select line coupled to the select transistors. The first select lines are closer to the bit lines than the second select lines. Each dummy word line is coupled to the respective dummy cells. The dummy word lines include a first dummy word line adjacent to either the first select lines or the second select lines. The peripheral circuit is configured to apply a turn-on voltage to all the first select lines, and apply a program voltage to the first dummy word line.

A memory device includes a memory cell array including memory blocks and a peripheral circuit coupled to the memory cell array. Each memory block includes memory strings each including dummy cells and select transistors, bit lines coupled to the memory strings, select lines including first select lines and second select lines, and one or more dummy word lines. Each select line coupled to the select transistors. The first select lines are closer to the bit lines than the second select lines. Each dummy word line is coupled to the respective dummy cells. The dummy word lines include a first dummy word line adjacent to either the first select lines or the second select lines. The peripheral circuit is configured to apply a turn-on voltage to all the first select lines, and apply a program voltage to the first dummy word line.

A semiconductor device includes a memory bank. The memory bank includes a plurality N of memory arrays and a local control circuit. Each memory array includes a plurality of bit cells configured to store bits of information and connected between a plurality of bit lines and a plurality of complement bit lines. The local control circuit is configured to pre-charge the bit lines and the complement bit lines at most N-1 memory array at a time. A method of operating the semiconductor device is also disclosed.

A semiconductor device includes a memory bank. The memory bank includes a plurality N of memory arrays and a local control circuit. Each memory array includes a plurality of bit cells configured to store bits of information and connected between a plurality of bit lines and a plurality of complement bit lines. The local control circuit is configured to pre-charge the bit lines and the complement bit lines at most N-1 memory array at a time. A method of operating the semiconductor device is also disclosed.

Provided herein may be a page buffer, a memory device having the page buffer, and a method of operating the memory device. The page buffer may include a precharger configured to precharge a bit line to a precharge level, a comparison signal output circuit configured to generate a first output signal by comparing a voltage of the bit line with a reference voltage, a pulse width control circuit configured to generate a second output signal by increasing a pulse width of a pulse of the first output signal by a preset multiple, and a register configured to sense data based on a pulse width of the second output signal and output the sensed data.

Provided herein may be a page buffer, a memory device having the page buffer, and a method of operating the memory device. The page buffer may include a precharger configured to precharge a bit line to a precharge level, a comparison signal output circuit configured to generate a first output signal by comparing a voltage of the bit line with a reference voltage, a pulse width control circuit configured to generate a second output signal by increasing a pulse width of a pulse of the first output signal by a preset multiple, and a register configured to sense data based on a pulse width of the second output signal and output the sensed data.

An example apparatus includes a sense amplifier, a plurality of storage memory cells coupled to the sense amplifier via a first digit line, and a plurality of offset memory cells coupled to the sense amplifier via a second digit line. The plurality of storage memory cells and the plurality of offset memory cells can comprise an array of memory cells. Each of the storage memory cells and the offset memory cells can include a respective capacitor having a particular capacitance.

Systems, apparatuses and methods include technology that identifies whether a product of first and second digital numbers is associated with a positive value or a negative value. During a first clock phase, the technology sets a first reference voltage to have a first value or a second value based on whether the product is associated with the positive value or the negative value. During the first clock phase, the technology controls switches to supply the first reference voltage to first plates of capacitors. Each of the capacitors includes a respective first plate of the first plates and a second plate. Further, during the first clock phase, the technology controls the switches based on the first digital number to electrically connect at least one of the second plates to the first reference voltage and electrically connect at least one of the second plates to a second reference voltage.

Systems, apparatuses and methods include technology that identifies whether a product of first and second digital numbers is associated with a positive value or a negative value. During a first clock phase, the technology sets a first reference voltage to have a first value or a second value based on whether the product is associated with the positive value or the negative value. During the first clock phase, the technology controls switches to supply the first reference voltage to first plates of capacitors. Each of the capacitors includes a respective first plate of the first plates and a second plate. Further, during the first clock phase, the technology controls the switches based on the first digital number to electrically connect at least one of the second plates to the first reference voltage and electrically connect at least one of the second plates to a second reference voltage.