Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.

Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.

A method for measuring the chirality of molecules in a sample of chiral molecules, the sample including at least one chemical species, the method including the steps of: introducing the sample of chiral molecules into an ionisation area; ionising the molecules by electromagnetic radiation in the ionisation area; and detecting a distribution of electrons produced by ionisation and emitted at the front and back of the ionisation area relative to the axis, z, of propagation of the electromagnetic radiation; wherein the electromagnetic radiation is elliptically polarised, the ellipticity varying continuously and periodically as a function of time, the method further including a step of: determining the chirality of the molecules from the electron distribution detected continuously as a function of time. A system is also provided for measuring the chirality of molecules using such a method.

Apparatuses and methods for an optical induced ion source are disclosed herein. An example apparatus at least includes an ionization volume arranged to receive a gas and first optical energy, the first optical energy to ionize the gas, and a channel formed between a first membrane and a second membrane, the first membrane having at least a transparent portion and the second membrane including an aperture, where the gas is provided to the ionization volume through the channel, the ionization volume formed inside the channel and adjacent to the aperture, and where the first optical energy ionizes the gas after passing through the at least transparent portion of the first membrane.

Apparatuses and methods for an optical induced ion source are disclosed herein. An example apparatus at least includes an ionization volume arranged to receive a gas and first optical energy, the first optical energy to ionize the gas, and a channel formed between a first membrane and a second membrane, the first membrane having at least a transparent portion and the second membrane including an aperture, where the gas is provided to the ionization volume through the channel, the ionization volume formed inside the channel and adjacent to the aperture, and where the first optical energy ionizes the gas after passing through the at least transparent portion of the first membrane.

The present invention relates to an ion generation composite target for an ion irradiation technology including: a substrate having a through hole formed thereon; and a graphene thin film configured on the substrate, across the through hole, having a thickness in a range between 1 nm to 3 nm, and ionized to release a proton or a carbon ion.

The present invention relates to an ion generation composite target for an ion irradiation technology including: a substrate having a through hole formed thereon; and a graphene thin film configured on the substrate, across the through hole, having a thickness in a range between 1 nm to 3 nm, and ionized to release a proton or a carbon ion.

Systems for directing a pulsed beam of charged particles include an ion source configured to produce a pulsed ion beam that includes at least one ion bunch. Such systems include an electromagnet for producing an electromagnetic field through which the pulsed ion beam travels, and an automated switch that selectively activates the electromagnet. A source of radiation triggers the automated switch, and at least one processor is configured to activate the electromagnet as the ion bunch traverses the electromagnetic field. Such systems may be useful, for example, for filtering a pulsed ion beam to select ions falling within a desired energy range and/or for providing pulsed ion radiation at desired times.

Systems for directing a pulsed beam of charged particles include an ion source configured to produce a pulsed ion beam that includes at least one ion bunch. Such systems include an electromagnet for producing an electromagnetic field through which the pulsed ion beam travels, and an automated switch that selectively activates the electromagnet. A source of radiation triggers the automated switch, and at least one processor is configured to activate the electromagnet as the ion bunch traverses the electromagnetic field. Such systems may be useful, for example, for filtering a pulsed ion beam to select ions falling within a desired energy range and/or for providing pulsed ion radiation at desired times.

The present invention relates to an ion generation composite target for an ion irradiation technology including: a substrate having a through hole formed thereon; and a graphene thin film configured on the substrate, across the through hole, having a thickness in a range between 1 nm to 3 nm, and ionized to release a proton or a carbon ion.