The present invention provides a method for analyzing a sample containing metal fine particles with an inductive coupling plasma mass spectrometer. The method enables analysis of the sample without the need of standard metal fine particles. Specifically, the present invention relates to a method for analyzing metal fine particles in liquid by use of an inductive coupling plasma mass spectrometer. In the method, the analysis apparatus is provided with a standard solution introduction apparatus including a standard solution storage unit for storing a standard solution containing a specific element in a known concentration, a syringe pump for suctioning and discharging the standard solution, and a solution introduction unit having a standard solution nebulizer and a standard solution spray chamber that are supplied with the standard solution, the standard solution is directly supplied to the standard solution nebulizer at a flow rate of 3 μL/min or less.

A method that includes introducing at least one analyte into a gas plasma; generating neutral species from atoms of the analyte in the gas plasma; preferentially transporting the neutral species downstream of the gas plasma relative to any ions produced in the gas plasma; and reacting the neutral species of the analyte with at least one reagent ion downstream of the plasma resulting in ion species of the analyte, wherein the at least one reagent ion is supplied by an independent ion source.

The invention relates to a system for aligning the firing of a laser-ablation apparatus to a signal or property of an inductively-coupled-plasma mass-spectrometer apparatus. At least one kind of input unit that receives timing data from the mass-spectrometer and isolates the system. A processor configured to translate the mass cycle of the mass-spectrometer into a series of triggering signals to fire the laser. A delay circuit to retard the triggering signals by a specified duration. At least one kind of signal output unit to deliver a triggering signal to the laser. A method for configuring a system for controlling a laser in laser-ablation inductively-coupled-plasma mass-spectrometry as above. A computer program product for controlling a laser in laser-ablation inductively-coupled-plasma mass-spectrometry as above.

A system for cooling an inductively coupled plasma (ICP) instrument includes: the ICP instrument; a pump in fluid communication with the instrument via a first conduit; and a micro-channel heat exchanger in fluid communication with the instrument via a second conduit, and in fluid communication with the pump via a third conduit. The pump is configured to generate a pump outlet pressure of coolant that exceeds a back pressure of the instrument such that a pressure of the coolant traveling through the second conduit and into the heat exchanger is less than or equal to 5 pounds per square inch (psi) above atmospheric pressure, as measured at an inlet to the heat exchanger.

Certain configurations of plasma discharge chambers and plasma ionization sources comprising a plasma discharge chamber are described. In some examples, the discharge chamber comprises a conductive area and is configured to sustain a plasma discharge within the discharge chamber. In other examples, the discharge chamber comprises at least one inlet configured to receive a plasma gas and at least one outlet configured to provide ionized analyte from the discharge chamber. Systems and methods using the discharge chambers are also described.

Provided is a mass spectrometer including: an ion generation unit configured to provide an ion generation path; an ion selection unit configured to provide an ion selection path connected to the ion generation path; a reaction unit configured to provide a reaction path connected to the ion selection path; a second ion selection unit configured to provide a second ion selection path connected to the reaction path; and an ion detection unit coupled to the second ion selection unit. The ion selection path and the reaction path extend in a first direction, and the reaction unit includes: a reaction pipe extending in the first direction to define the reaction path; and a sample inflow pipe coupled to the reaction pipe. The sample inflow pipe provides a sample inflow path connected to the reaction path, and the sample inflow path includes an inclined path. The inclined path extends to form an acute angle (α) with respect to the first direction.

In some examples, a multi-device removal and installation tool may include a device removal tool including a first side having a first receiver with a first dimension that removably receives a first device, and a second side having a second receiver with a second dimension that removably receives a second device. The first dimension may be different from the second dimension. A torque limit tool may apply, in a first rotation direction of the torque limit tool and the device removal tool, a tightening torque to the first device. Further, the torque limit tool may apply, in a second rotation direction of the torque limit tool and the device removal tool, a loosening torque to the first device. The second rotation direction may be generally opposite to the first rotation direction.

Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.

The present invention relates to a matrix-assisted laser desorption ionization mass spectrometry method and, specifically, a mass spectrometry method according to the present invention comprises the steps of: acquiring a mass spectrum of an analyte by performing matrix-assisted laser desorption ionization of the analyte, wherein a detection spectrum, which is the mass spectrum of the analyte, is acquired using each of two or more matrixes different from one another; and removing, from each detection spectrum, a peak of a corresponding matrix to obtain a matrix-removed spectrum, and then acquiring a corrected mass spectrum of the analyte on the basis of a matrix-removed spectrum for each of different matrixes.

The present invention relates to a matrix-assisted laser desorption ionization mass spectrometry method and, specifically, a mass spectrometry method according to the present invention comprises the steps of: acquiring a mass spectrum of an analyte by performing matrix-assisted laser desorption ionization of the analyte, wherein a detection spectrum, which is the mass spectrum of the analyte, is acquired using each of two or more matrixes different from one another; and removing, from each detection spectrum, a peak of a corresponding matrix to obtain a matrix-removed spectrum, and then acquiring a corrected mass spectrum of the analyte on the basis of a matrix-removed spectrum for each of different matrixes.