Various methods and circuital arrangements for biasing one or more gates of stacked transistors of an amplifier are possible where the amplifier is configured to operate in at least an active mode and a standby mode. Circuital arrangements can reduce bias circuit standby current during operation in the standby mode while allowing a quick recovery to normal operating conditions of the amplifier. Biasing an input transistor of the stacked transistors can be obtained by using a replica stack circuit.

Examples of amplifiers use current-replication transistors and a separation circuit coupled to such transistors to separate error current components from other current components in a pre-driver of an amplifier. In response to driving the current-replication transistors with the separated error current components, replica base current components that approximate error-modulation components of the pre-driver base currents are generated. Replica-current subtraction circuitry coupled to the current-replication transistors then subtract the replica base current components from the pre-driver base currents, affecting cancellation of the error-modulation components of the pre-driver base currents.

The present disclosure provides for process and temperature compensation in a transimpedance amplifier (TIA) using a dual replica via monitoring an output of a first TIA (transimpedance amplifier) and a second TIA; configuring a first gain level of the first TIA based on a feedback resistance and a reference current applied at an input to the first TIA; configuring a second gain level of the second TIA and a third TIA based on a control voltage; and amplifying a received electrical current to generate an output voltage using the third TIA according to the second gain level. In some embodiments, one or both of the second TIA and the third TIA include a configurable feedback impedance used in compensating for changes in the second gain level due to a temperature of the respective second or third TIA via the configurable feedback impedance of the respective second or third TIA.

An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.

A circuit includes a high-side switch and a low-side switch. A first inverter includes first and second discharge current paths activatable to sink first and second discharge currents, respectively, from the control terminal of the high-side switch. A second inverter includes first and second charge current paths activatable to source first and second charge currents to the control terminal of the low-side switch. A high-side sensing current path includes an intermediate high-side control node, and a low-side sensing current path includes an intermediate low-side control node. The second discharge current path is selectively enablable in response to a high-side detection signal at the intermediate high-side control node having a high logic value, and the second charge current path is selectively enablable in response to a low-side detection signal at the intermediate low-side control node having a low logic value.

A bias structure includes a reference voltage node connected to gate structures of a first NMOS transistor and a second NMOS transistor, a bias voltage node comprising a bias voltage, and a first op amp having a first input connected to the reference voltage, a second input connected to a drain of the first NMOS transistor, and an output connected to gate structures of a first PMOS transistor and a second PMOS transistor. The bias structure further includes a second op amp having a first input connected to the reference voltage, a second input connected to a drain of the second NMOS transistor, and an output connected to a gate structure of a third NMOS transistor and the bias voltage node. The first NMOS transistor matches a transistor of a differential pair of an integrated circuit device.

Aspects of the present disclosure provide a method for regulating an integration current of a sensing amplifier. The sensing amplifier includes a first input transistor and a second input transistor, wherein a source of the first input transistor and a source of the second input transistor are coupled to a source node. The method includes pulling a current from or sourcing the current to the source node, measuring the integration current, comparing the measured integration current with a reference signal, and adjusting the current pulled from or sourced to the source node based on the comparison.

A signal processor and method. The signal processor includes a signal current path. The signal processor includes a transconductor. The transconductor has an input operable to receive an input voltage of the signal processor. The transconductor also has an output operable to output a current based on the input voltage. The signal processor also includes a processing stage coupled to the output of the transconductor to receive and process the current outputted by the transconductor. The signal processor further includes a current replicator operable to generate a replica current proportional to the current outputted by the transconductor. The signal processor also includes a comparator operable to compare an output of the current replicator with a reference. The signal processor further includes a current limiter operable to limit the current outputted by the transconductor based on the comparison of the output of the current replicator with the reference.

A balanced differential transimpedance amplifier with a single-ended input operational over a wide variation in the dynamic range of input signals. A threshold circuit is employed to either or a combination of (1) generate a varying decision threshold to ensure a proper slicing over a wide range of input current signal levels; and (2) generate a bias current and voltage applied to an input of a transimpedance stage to cancel out a dependence of the transimpedance stage voltage input on input current signal levels.

A differential amplifier comprises: a long tailed pair transistor configuration comprising a differential pair of transistors and a tail transistor; and a replica circuit configured to vary a feedback current in the replica circuit to match a replica voltage to a reference voltage, wherein varying the feedback current in the replica circuit 4 provides a bias voltage to the tail transistor in the long tailed pair which controls a tail current through the tail transistor to determine a common mode voltage in the long tailed pair.