Patent classifications
H03K5/15046
Delay line structure and delay jitter correction method thereof
A delay line structure and a delay jitter correction method thereof are provided. The delay line structure comprises N delay units and N selectors. An output end of the N−1th delay unit is connected to a first input end of the N−1th selector and an input end of the Nth delay unit respectively, the N−1th selector inputs the N−1th selection signal, an output end of the Nth delay unit is connected to a first input end of the Nth selector, an output end of the Nth selector is connected to a second input end of the N−1th selector, and the Nth selector inputs the Nth selection signal. The time delay units and the selectors are stacked forwards according to the above-mentioned rule until the input ends of the first time delay units are connected with input signals and the output ends of the first selectors are connected with output signals.
Phase calibration with half-rate clock for injection-locking oscillators
A clock generation circuit has an injection-locked oscillator, a frequency doubler circuit, low pass filters and a calibration circuit. The injection-locked oscillator has an input coupled to a half-rate clock signal. The frequency doubler circuit has inputs coupled to outputs of the injection-locked oscillator. Each of the low pass filters has an input coupled to one of a plurality of outputs of the frequency doubler circuit. The calibration circuit includes comparison logic that receives outputs of the low pass filters. The calibration circuit has an output coupled to a control input of a source of a supply current in the injection-locked oscillator. In one example, the source of the supply current is a current digital to analog converter.
RING OSCILLATOR AND METHOD FOR STARTING RING OSCILLATOR
A ring oscillator including: an oscillation circuit including an even number of inverters connected in a ring configuration, the oscillation circuit outputting a clock signal; plural potential fixing circuits respectively connected between pairs of the inverters, each of plural potential fixing circuits being switchable between a connected and a disconnected state in response to a first control signal; and an adjustment circuit that adjusts a drive capability of the inverters based on a second control signal, wherein, during startup, the drive capability is controlled to be a first capability, in which the potential fixing circuits are connected, by the first control signal, and wherein, after a predetermined time has elapsed after the first control signal is output, the drive capability is controlled to be a second capability, higher than the first capability, in which the potential fixing circuits are disconnected, by the second control signal.
MULTI-GATED I/O SYSTEM, SEMICONDUCTOR DEVICE INCLUDING AND METHOD FOR GENERATING GATING SIGNALS FOR SAME
A method of generating multiple gating signals for a multi-gated input/output (I/O) system. The system includes an output level shifter and an output driver which are coupled in series between an output node of a core circuit and an external terminal of a corresponding system. The method includes: generating first and second gating signals having corresponding first and second waveforms, the first waveform transitioning from a non-enabling state to an enabling state before the second waveform transitions from the non-enabling state to the enabling state; receiving the first gating signal at the output level shifter; and receiving the second gating signal at the output driver.
MULTI-GATED I/O SYSTEM, SEMICONDUCTOR DEVICE INCLUDING AND METHOD FOR GENERATING GATING SIGNALS FOR SAME
A system (for generating multi-gated power-on control signals) includes: a multi-gated input/out (I/O) interface configured to receive at least first and second gating signals; and a gated power-on control (POC) signals generator configured to generate at least the first and second gating signals for the multi-gated I/O interface, a waveform of the first gating signal being different from a waveform of the second gating signal.
Measurement, calibration and tuning of memory bus duty cycle
A method and apparatus for dynamically monitoring, measuring, and adjusting a clock duty cycle of an operating storage device is disclosed. A storage device includes a measuring circuit comprising a plurality of flip flop registers coupled to a first input line, with each flip flop register having a first input and a second input. One or more delay taps are coupled to each flip flop register, and are disposed on a second input line. While the device operates, a clock signal is input directly into the first input of each flip flop register via the first input line. Simultaneously, the clock signal is input into the second input of each flip flop register through the one or more delay taps via the second input line. The flip flop registers are then read to determine the clock duty cycle of the device, and the clock frequency is adjusted as needed.
SEQUENCE SIGNAL GENERATOR AND SEQUENCE SIGNAL GENERATION METHOD
A sequence signal generator and a sequence signal generation method are provided. In the sequence signal generation method, a waveform output instruction sent by a host computer is received to acquire waveform data. The waveform data includes original square wave sequence data and target square wave sequence data, and the target square wave sequence data includes a preliminary delay parameter and a secondary delay parameter. An original square wave sequence signal is acquired according to the original square wave sequence data. According to the preliminary delay parameter, preliminary delay processing is performed on the original square wave sequence signal to acquire an intermediate square wave sequence signal, and according to the secondary delay parameter, secondary delay processing is performed on the intermediate square wave sequence signal to acquire a target square wave sequence signal.
Synchronising Devices Using Clock Signal Delay Comparison
A circuit for estimating a time difference between a first signal and a second signal includes a first signal line for receiving the first signal; a delay unit configured to receive the second signal and delay the second signal so as to provide a plurality of delayed versions of the second signal, each delayed version being delayed by a different amount of delay to the other delayed versions; a comparison unit configured to compare each of the delayed versions of the second signal with the first signal so as to identify which of the delayed versions of the second signal is the closest temporally matching signal to the first signal; and a difference estimator configured to estimate the time difference between the first and second signals in dependence on the identified delayed version.
MEASUREMENT, CALIBRATION AND TUNING OF MEMORY BUS DUTY CYCLE
A method and apparatus for dynamically monitoring, measuring, and adjusting a clock duty cycle of an operating storage device is disclosed. A storage device includes a measuring circuit comprising a plurality of flip flop registers coupled to a first input line, with each flip flop register having a first input and a second input. One or more delay taps are coupled to each flip flop register, and are disposed on a second input line. While the device operates, a clock signal is input directly into the first input of each flip flop register via the first input line. Simultaneously, the clock signal is input into the second input of each flip flop register through the one or more delay taps via the second input line. The flip flop registers are then read to determine the clock duty cycle of the device, and the clock frequency is adjusted as needed.
Synchronising devices using clock signal delay comparison
A circuit for estimating a time difference between a first signal and a second signal, the circuit comprising: a first signal line for receiving the first signal; a delay unit configured to receive the second signal and delay the second signal so as to provide a plurality of delayed versions of the second signal, each delayed version being delayed by a different amount of delay to the other delayed versions; a comparison unit configured to compare each of the delayed versions of the second signal with the first signal so as to identify which of the delayed versions of the second signal is the closest temporally matching signal to the first signal; and a difference estimator configured to estimate the time difference between the first and second signals in dependence on the identified delayed version.