METHOD FOR MONITORING RADIATION

Abstract

A method for monitoring radiation by an optical sensor which generates a signal, such as a shut-off signal, which influences the radiation when subjected to radiation. A sensor with dark current pulses is used, which are assessed as a functional capability signal of the sensor.

Claims

1. A method for the monitoring of radiation, in particular laser radiation by an optical sensor which generates a signal, in particular a cutoff signal which influences the radiation at least when subjected to radiation, characterized in that a sensor with dark stream pulses is used which are evaluated as a signal of the functionality of the sensor.

2. The method according to claim 1, characterized in that the sensor is constructed as an active or a passive sensor.

3. The method according to claim 1, characterized in that a Single Photon Avalanche Diode (SPAD) or Avalanche Photo Diode (APD) is used.

4. The method according to claim 1, characterized in that the pulse rate of the sensor is monitored for a minimum pulse rate and a maximum pulse rate, wherein when the minimum pulse rate is dropped below and when the maximum pulse rate is exceeded, the radiation to be detected by the sensor is influenced, in particular turned off.

5. The method according to claim 1, characterized in that the evaluation of the pulse rate takes place twice in different evaluation paths.

6. The method according to claim 1, characterized in that the sensor is arranged in a protective enclosure and/or inside a beam protection wall, especially a passive beam protection wall.

7. The method according to claim 1, characterized in that the space receiving the sensor is loaded in a controlled manner via a closable opening with a radiation which deviates in particular from the radiation to be monitored.

8. The method according to claim 1, characterized by a feature or by several features of the specification.

Description

[0016] The invention is based on the problem of using optical sensory technology in particular for active laser protection walls or for beam protection elements, wherein their ability to function is to be checked without an active optical testing with light sources or beam sources having to be used inside the volume to be optically monitored.

[0017] In particular, alternative, active laser protection wall sensors, active laser protection walls, active laser protection wall elements (and also their front-part variants in front of a passive protection wall) and active laser protection cabins should result as applications.

[0018] The starting point of the invention can be the known monitoring of a hollow space against penetrating radiation such as laser radiation, as can be gathered from the previously cited prior art.

[0019] It is preferably provided for solving the problem that a sensor with dark current pulses is used which are evaluated as a functional capability signal of the sensor.

[0020] In particular, an SPAD (Single Photon Avalanche Diode) is used as sensor.

[0021] The sensors are used in order to detect even individual photons and are therefore extremely sensitive.

[0022] It is characteristic for the sensors that they are loaded counter to the blocking direction with appropriately high voltage shortly before the breakthrough. Incident light then generates free charge carriers which then ensure a current in the blocking direction of the SPAD via an avalanche breakthrough.

[0023] If the current is interrupted (or if the voltage drops below the breakthrough voltage), then the current dies down and the SPAD assumes its blocked state and can subsequently be loaded with voltage. A current pulse is then released again with incident light so that a chain of current pulses results as a function of the incident light.

[0024] However, it is additionally characteristic for these SPAD diodes that avalanche breakthroughs already occur based on the “high” applied voltage, which are also thermally conditioned, and therefore a temperature-dependent current pulse rate occurs without incident light. Therefore, obtainable SPAD modules are also usually actively cooled with Peltier elements in order to be able to keep them at a constant temperature and therefore to ensure a constant “dark current pulse rate”.

[0025] Even the APD (Avalanche Photo Diode), operated in the “Geiger mode), can be considered as a sensor for the invention.

[0026] This invention uses precisely these “dark current pulses” as a functional capability signal of the sensors because [0027] If these impulses are not present, the sensor is defective. [0028] If the diode is continuously conductive, either light is striking the diode so that it can no longer enter into the blocking state or it has an internal short circuit. [0029] If one of these cases occurs, a signal such as a shut-off signal must be generated in order ensure the influencing such as cutting off the light source like the process laser beam source.

[0030] If the diode is above a limit, conditioned by the temperature, of current pulses per time unit (therefore, above the “dark current pulse rate”) a start is then to be made from the incidence of light on the diode, and therefore a breakdown, e.g., of a laser protection wall element or of a laser protection wall is present, so that a shut-off signal must be generated for cutting off the process laser beam source. This would be the normal “protection case” for this diode when it is used in an active laser protection wall.

[0031] The wiring of the diode can be designed to be purely passive, as is known, with a resistor connected in front (passive quenching), in order to generate this pulse behavior. However, the passive wiring has the disadvantage of a longer “recovery time” of the SPAD so that even with the recognition of the current pulse the voltage can be actively lowered and subsequently raised again in order to achieve a shortened recovery time (active quenching). The “recovery time” is at the same time a blind phase of the sensor since during this time no photons can be detected. Therefore, it must be selected to be short in accordance with the application.

[0032] Therefore, the method according to the invention evaluates current pulses or voltage pulses of one or more actively or passively pulsing light sensors or radiation sensors, wherein the sensor still continuously generates current pulses or voltage pulses even in darkness in a closed volume.

[0033] The pulses are converted into a frequency or counting rate. This frequency or pulse rate is monitored for a minimum pulse rate. If the minimum pulse rate is dropped below, a shut-off signal is generated which leads to the turning off, e.g., of a laser beam.

[0034] Furthermore, this frequency or pulse rate is monitored for a maximum pulse rate. If this maximum pulse rate is exceeded, a shut-off signal is also preferably generated which leads to the turning off e.g. of a laser beam.

[0035] This pulse evaluation takes place twice in different evaluation paths for a monitoring directed at safety.

[0036] Furthermore, the protective wall elements monitored in this manner or volumes of double-wall protective housings can comprise closable openings. A test of the sensors by incident light is also possible by opening the opening, e.g. for the closing test after the production of the wall element or for regular tests if a contamination of the sensors inside the closed element cannot be excluded.

[0037] Independently of the pulse counting rate method, the active protective wall for the test of the sensors can also comprise in the simplest case an automatically activated flap for closing the opening for sensor tests.

[0038] Alternatively, the opening can also be closed by optically switching elements which optionally also transmit only a part of the receiving spectrum of the sensors in a switchable manner. As a result of this opening which can be automatically opened and closed, light can penetrate from the outside into the wall and a corresponding reaction of the sensors must be ensured. If this reaction does not take place, a shut-off signal is generated which leads to the turning off of a laser beam.

[0039] The features characterizing the invention result from the specification and also from the claims, which, however, are not to be understood as being limiting as regards their feature combinations. Rather, individual features disclosed on the whole, therefore, especially in the specification, are to be evaluated separately as well as in possible combinations as inventive.