Zeroing method and zeroing device for optical time-domain reflectometer

Abstract

A zeroing method and zeroing device for an optical time-domain reflectometer (OTDR) are disclosed. The zeroing method includes: before starting the optical time-domain reflectometer, when a laser device is in an off state, sending a zeroing signal; and performing zeroing processing according to the zeroing signal. In the embodiments of the present invention, the feedback zeroing can be performed on a receiving circuit by utilizing the idle time prior to a test or during the test, thus the influence of an offset voltage is reduced, and a problem of operational-amplifier zero drift also can be solved in the meantime, which improves a detectability of the OTDR, and overcomes a disadvantage that a manual zeroing method is not intelligent and a measured waveform introduced in an automatic zeroing method is bad.

Claims

1. A zeroing method for an optical time-domain reflectometer, comprising: before starting the optical time-domain reflectometer, when a laser device is in an off state, sending a zeroing signal; performing zeroing processing according to the zeroing signal; wherein performing zeroing processing according to the zeroing signal comprises: in a case that the zeroing signal is valid, receiving a voltage difference of output signals of a low noise amplifier, and performing zeroing on the low noise amplifier based on the voltage difference.

2. The method according to claim 1, wherein, in the process of performing zeroing, if the zeroing signal is removed, starting the optical time-domain reflectometer to perform testing.

3. The method according to claim 2, in a process of the optical time-domain reflectometer performing testing, further comprising: before the laser device sends a test pulse or a test sequence at any one time, sending a zeroing signal for performing zeroing processing.

4. The method according to claim 1, wherein, the zeroing signal is obtained through calculation according to a collected offset voltage, or obtained through lookup table, performing zeroing processing according to the zeroing signal comprises: converting the zeroing signal into a zeroing voltage and then inputting the zeroing voltage to a low noise amplifier for performing zeroing.

5. A zeroing device, applied to an optical time-domain reflectometer, comprising: a first module including a sending and receiving control circuit, configured to: before starting the optical time-domain reflectometer, when a laser device is in an off state, send a zeroing signal; a second module comprising a zeroing circuit, including a first unit configured to: perform zeroing processing according to the zeroing signal; wherein performing zeroing processing includes, in a case that the zeroing signal is valid, receiving a voltage difference of output signals of a low noise amplifier, and performing zeroing on the low noise amplifier based on the voltage difference.

6. The zeroing device according to claim 5, wherein, the first module is further configured to: in a process of the first unit performing zeroing, if the zeroing signal is removed, start the optical time-domain reflectometer to perform testing.

7. The zeroing device according to claim 6, wherein, the first module is further configured to: in a process of the optical time-domain reflectometer performing testing, before the laser device sends a test pulse or a test sequence at any one time, send a zeroing signal, and trigger the second module to perform zeroing processing.

8. The zeroing device according to claim 7, wherein, the first module is configured to: obtain the zeroing signal through calculation according to a collected offset voltage, or obtain the zeroing signal through lookup table, the zeroing circuit of the second module comprises: a second unit, configured to: convert the zeroing signal into a zeroing voltage and then input the zeroing voltage to a low noise amplifier for performing zeroing.

9. An optical time-domain reflectometer, comprising: a laser device, a low noise amplifier and the zeroing device according to claim 7.

10. The zeroing device according to claim 6, wherein, the first module is configured to: obtain the zeroing signal through calculation according to a collected offset voltage, or obtain the zeroing signal through lookup table, the zeroing circuit of the second module comprises: a second unit, configured to: convert the zeroing signal into a zeroing voltage and then input the zeroing voltage to a low noise amplifier for performing zeroing.

11. An optical time-domain reflectometer, comprising: a laser device, a low noise amplifier and the zeroing device according to claim 10.

12. An optical time-domain reflectometer, comprising: a laser device, a low noise amplifier and the zeroing device according to claim 6.

13. The zeroing device according to claim 5, wherein, the first module is configured to: obtain the zeroing signal through calculation according to a collected offset voltage, or obtain the zeroing signal through lookup table, the zeroing circuit of the second module further comprises: a second unit, configured to: convert the zeroing signal into a zeroing voltage and then input the zeroing voltage to a low noise amplifier for performing zeroing.

14. An optical time-domain reflectometer, comprising: a laser device, a low noise amplifier and the zeroing device according to claim 13.

15. An optical time-domain reflectometer, comprising: a laser device, a low noise amplifier and the zeroing device according to claim 5.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

(1) FIG. 1 is a schematic diagram of a zeroing device according to the embodiment of the present invention.

(2) FIG. 2 is a flow chart of a zeroing method according to the embodiment of the present invention.

(3) FIG. 3 is a schematic diagram of an optical time-domain reflectometer according to the embodiment 1 of the present invention.

(4) FIG. 4 is a flow chart of a zeroing method according to the embodiment 1 of the present invention.

(5) FIG. 5 is a schematic diagram of an optical time-domain reflectometer according to the embodiment 2 of the present invention.

(6) FIG. 6 is a flow chart of a zeroing method according to the embodiment 2 of the present invention.

PREFERRED EMBODIMENTS OF THE INVENTION

(7) The embodiments of the present invention will be described in detail in combination with the accompanying drawings below. It should be noted that the embodiments in the present invention and the characteristics in the embodiments can be optionally combined with each other in the condition of no conflict.

(8) FIG. 1 is a schematic diagram of a zeroing device according to the embodiment of the present invention, and as shown in FIG. 1, the zeroing device of the embodiment includes:

(9) a first module, used to: before starting the optical time-domain reflectometer, when a laser device is in an off state, send a zeroing signal;

(10) a second module, used to: perform zeroing processing according to the zeroing signal.

(11) Wherein, the second module can include:

(12) a first unit, used to: in a case that the zeroing signal is valid, receive a voltage difference of output signals of a low noise amplifier, and perform zeroing on the low noise amplifier based on the voltage difference.

(13) Wherein, the first module is also used to: in the process of the first unit performing zeroing, if the zeroing signal is removed, start the optical time-domain reflectometer to perform testing.

(14) In one preferred embodiment, in the process of the optical time-domain reflectometer performing testing, the first module is also used to: before the laser device sends a test pulse or a test sequence at any one time, send a zeroing signal, and trigger the second module to perform zeroing processing.

(15) In one preferred embodiment, the first module obtains the zeroing signal through calculation according to a collected offset voltage, or obtains the zeroing signal through lookup table,

(16) the second module includes:

(17) a second unit, used to: convert the zeroing signal into a zeroing voltage and then input the zeroing voltage to the low noise amplifier for performing zeroing.

(18) The disadvantage that a manual zeroing method is not intelligent and a measured waveform introduced in an automatic zeroing method is bad can be overcome with the zeroing device of the embodiment.

(19) FIG. 2 is a flow chart of a zeroing method according to the embodiment of the present invention, and as shown in FIG. 2, the method of the embodiment includes the following steps.

(20) In step S11, before starting the optical time-domain reflectometer, when a laser device is in an off state, a zeroing signal is sent.

(21) In step S12, zeroing processing is performed according to the zeroing signal.

(22) The zeroing method of the present document will be described in detail with two specific embodiments below.

Embodiment 1

(23) As shown in FIG. 3, the optical time-domain reflectometer of the embodiment of the present invention includes the following constituent parts:

(24) a photodiode (PD), a trans-impedance amplifier (TIA), a low noise amplifier (LNA), a low pass filter (FILTER), an analog-to-digital converter (ADC), data processing, a sending and receiving control circuit, a laser device (LD) driver, an LD and a zeroing circuit. Both the TIA and LNA at the receiving end will have the problem of offset voltage, in order to eliminate the influence from the offset voltage, the zeroing device of the embodiment is added in the circuit.

(25) The zeroing device of the embodiment includes:

(26) a sending and receiving control circuit (equivalent to a first module), used to: before starting the optical time-domain reflectometer, when a laser device is in an off state, send a zeroing signal;

(27) a zeroing circuit (equivalent to a first unit of a second module), used to: in a case that the zeroing signal is valid, receive a voltage difference of output signals of a low noise amplifier, and perform zeroing on the low noise amplifier based on the voltage difference.

(28) Wherein, the sending and receiving control circuit is also used to: in the process of the zeroing circuit performing zeroing, if the zeroing signal is removed, start the optical time-domain reflectometer to perform testing.

(29) Wherein, the sending and receiving control circuit is also used to: before the laser device sends a test pulse or a test sequence at any one time, trigger the zeroing circuit to perform zeroing processing.

(30) As shown in FIG. 4, a zeroing method in the optical time-domain reflectometer of the embodiment includes the following steps.

(31) In step S101, before starting an OTDR test, firstly an LD is closed, and a zeroing circuit is triggered to perform zeroing processing.

(32) Specifically, a sending and receiving control circuit gives a zeroing signal pulse, and when a zeroing control signal is valid (it can be defined that high level is valid or low level is valid), the zeroing circuit is triggered to perform zeroing processing.

(33) In step S102, the zeroing circuit performs zeroing processing.

(34) Specifically, when the zeroing control signal is valid, an operational amplifier will give a voltage difference to the zeroing circuit according to a LNA differential output voltage difference, and a zeroing voltage is to provide a reference voltage for the input at one end of the LNA with the voltage difference as a basis for zeroing, and the output of the LNA can be adjusted by changing the reference voltage, so that an output voltage difference of the LNA is more approximated to 0, thereby achieving the goal of zeroing.

(35) In step S103, in the process of the zeroing circuit performing zeroing, if the zeroing control signal is removed, the OTDR test is started.

(36) After the zeroing control signal is removed, that is, the zeroing is completed, the zeroing circuit keeps the originally adjusted voltage, and then the OTDR test is started.

(37) An offset voltage of the receiving circuit may be changed in the testing process, and adjustment also can be made in such case. According to the degree of change of the offset voltage, before the LD sends a test pulse or a test sequence at any one time, the sending and receiving control circuit can send a zeroing control signal for performing zeroing, and the test can be continued after the zeroing is completed.

(38) In the embodiment, it is required to notice the following aspects during the zeroing: 1. It is to guarantee that the PD does not have any input light during the zeroing; 2. Zeroing is performed before each test or any tests, and zeroing time is generally dozens of uS; 3. The zeroing signal in the testing process must be kept in a removed state in order to avoid affecting a tested waveform.

(39) In the method of the embodiment, zeroing is performed on the circuit prior to a complete OTDR test, or zeroing is performed by utilizing the idle time in the testing process, which ensures a minimum offset voltage of the system, increases an effective dynamic range of the system, and also guarantees a consistency of the test in the meantime.

Embodiment 2

(40) The difference between the embodiment 2 and the embodiment 1 is that, an ADC collects the amplitude of offset voltage, then a sending and receiving control circuit gives a zeroing control code, and a DAC converts the zeroing control code into an analog zeroing voltage, and gives the analog zeroing voltage to the zeroing circuit for performing zeroing, and the OTDR of the embodiment is as shown in FIG. 5, in the zeroing device of the embodiment, the zeroing signal is a zeroing control code obtained by the sending and receiving control circuit through calculation according to the collected offset voltage, or it is a zeroing control code obtained through lookup table.

(41) The zeroing circuit of the embodiment (equivalent to a second unit of the second module) is used to convert the zeroing control code into a zeroing voltage and then input the zeroing voltage to a low noise amplifier for performing zeroing.

(42) The zeroing control code can be sent to the DAC and converted into the analog zeroing voltage, then it goes through the zeroing circuit, and it is finally output to an input end of the LNA and serves as a reference level of the LNA, by changing the reference level, a zeroing function can be implemented.

(43) Wherein, the zeroing control code can be acquired by using the method of repeated measurements through the ADC, that is, firstly a value is given, after the adjustment, it is to observe what the offset voltage collected by the ADC is, and then another value is given, the offset voltage is reduced, a small amplitude of adjustment is made each time, and finally the offset voltage reaches a permissible range. In such method, the adjustment time is long, and efficiency is low, but the accuracy of the adjusted value is high, which is not affected by the temperature drift.

(44) A lookup table of relationship between the offset voltage and the zeroing control code also can be established in advance, and the ADC collects and acquires a value of the offset voltage, and by means of lookup table, the zeroing control code is obtained, thus the complete zeroing can be performed at one time, and the adjustment time is short, and the efficiency is high, but the accuracy is not high, which is easily affected by the temperature drift.

(45) FIG. 6 is a flow chart of a zeroing method according to the embodiment, and as shown in FIG. 6, the following steps are included.

(46) In step S201, before starting an OTDR test, firstly an LD is closed.

(47) In step S202, an ADC collects a front-end analog voltage (i.e. an offset voltage), and outputs the offset voltage to a sending and receiving control circuit.

(48) In step S203, the sending and receiving control circuit judges whether the offset voltage is within a permissible range, if the offset voltage is not within the permissible range, it proceeds to step S204, and if the offset voltage is within the permissible range, it proceeds to step S207.

(49) In step S204, the sending and receiving control circuit gives a zeroing control code.

(50) In step S205, a DAC converts the zeroing control code into an analog zeroing voltage.

(51) In step S206, a zeroing circuit performs zeroing through the analog zeroing voltage, and then it returns to the step S202.

(52) In step S207, the zeroing is finished, the zeroing code is kept unchanged, and the OTDR test is started.

(53) In the OTDR testing process, before the LD sends a test pulse or a test sequence at any one time, the sending and receiving control circuit can send a zeroing control code for performing zeroing, and the test can be continued after the zeroing is completed.

(54) The ordinary person skilled in the art can understand that all or part of the steps in the above method can be completed by a program instructing related hardware, and the program can be stored in a computer readable memory medium, such as a read-only memory, disk or optical disk and so on. Alternatively, all or part of the steps of the above embodiments also can be implemented by using one or multiple integrated circuits. Correspondingly, each module/unit in the above embodiments can be implemented in a form of hardware, and also can be implemented in a form of software function module. The present document is not limited to any combination of hardware and software in a specific form.

(55) The above description is only the preferred embodiments of the present invention. Certainly, the present document can still have other various embodiments, and the skilled familiar to the art can make various corresponding changes and transformations according to the present document without departing from the spirit and essence of the present document, and these corresponding changes and transformations shall all fall into the protection scope of the appended claims of the present document.

INDUSTRIAL APPLICABILITY

(56) With the OTDR and zeroing method of the embodiments of the present invention, compared to the related art, a flexibility of the zeroing method is strengthened, and a quality of the tested waveform is guaranteed in the meantime, which increases an effect of the effective dynamic range, reduces the influence from the temperature drift and instrument offset voltage, and enhances the overall detection performance.