VACUUM CHUCK FOR CLAMPING WORKPIECES, MEASURING DEVICES AND METHOD FOR CHECKING WORKPIECES, IN PARTICULAR WAFERS
20170219504 · 2017-08-03
Inventors
Cpc classification
H01L21/6838
ELECTRICITY
H01L21/68728
ELECTRICITY
H01L21/6875
ELECTRICITY
H01L21/67259
ELECTRICITY
H01L21/68742
ELECTRICITY
H01L21/68785
ELECTRICITY
H01L2221/68318
ELECTRICITY
G01N23/223
PHYSICS
H01L21/6779
ELECTRICITY
International classification
G01N23/223
PHYSICS
B25B11/00
PERFORMING OPERATIONS; TRANSPORTING
H01L21/67
ELECTRICITY
Abstract
The invention relates to a vacuum chuck for clamping workpieces (19), in particular wafers, and a measuring device and a method for checking workpieces, in particular wafers, by means of X-ray fluorescent radiation.
Claims
1. Vacuum chuck for clamping workpieces, having a clamping plate having a support surface, having at least one suction connection arranged on a base body for connecting to a negative-pressure device and for clamping the workpiece on the clamping plate by means of negative pressure which is received by the base body and having several suction grooves arranged in the clamping plate and are open towards the support surface, the support surface has several concentric suction grooves having at least one suction opening to which a negative-pressure line is connected or which is connected to a work channel, wherein every suction groove having a separate negative pressure, which is separate to the adjacent suction groove, is selectively controlled by means of at least one control valve by a control for supplying the respective negative pressure in the respective suction groove.
2. Vacuum chuck according to claim 1, wherein the clamping plate is selected from a material, in which the atomic number is selected in such a way that, with primary X-ray radiation aimed at the workpiece, a slight scattered radiation is produced and the energy of the fluorescent radiation is so small that it is absorbed into the material of the workpiece.
3. Vacuum chuck according to claim 1, wherein the clamping plate is selected from a material, in which the atomic number is chosen in such a way that primary X-ray radiation aimed at the workpiece produces fluorescent radiation, which is absorbed by the material of the workpiece by 20% up to 80%.
4. Vacuum chuck according to claim 1, wherein at least three lifting pins are provided in the base body which are moveable from a retracted position in or below the support surface of the clamping plate into an extended position with respect to the support surface and the lifting pins have a receiving element similar to a suction cup, which comprises a central hole that is connected to a suction channel to produce a holding force by means of negative pressure.
5. Vacuum chuck according to claim 4, wherein a moveable sliding carriage is provided in the base body for controlling the retractable or the extendable position of the lifting pins and, at the same time, transferring the lifting pins into the retracted position and into the extended position and the moveable sliding carriage has slanted control surfaces, along which at least one control element is guided such that it is moveable, said control element being connected to the lifting pin.
6. Vacuum chuck according to claim 4, wherein the lifting pin is guided along a guiding sleeve such that it is shiftable, said guiding sleeve being connected to the suction channel in the base body for producing a negative pressure.
7. Vacuum chuck according to claim 4, wherein the moveable sliding carriage is positioned in the base body between the clamping plate lying on the base body and an underplate arranged on the underside of the base body.
8. Vacuum chuck according to claim 4, wherein the moveable sliding carriage is arranged in a receiving space of the base body and two opposing sensor elements are allocated to the receiving space, whereby the adoption of the retracted or extended position of the lifting pins is detectable depending on the position of the sliding carriage in the receiving space.
9. Vacuum chuck according to claim 1, wherein several stopping pins are provided in the base body, which are moveable from a retracted position in or below the support surface into an extended position above the support surface of the clamping plate.
10. Vacuum chuck according to claim 9, wherein one or more stopping pins for transferring into an extended stopping position are connected to at least one supply channel which is supplied with positive pressure and the stopping pins independently adopt the retracted position by venting the respective supply channel that is connected to the at least one stopping pin and by means of a return spring touching the stopping pin.
11. Vacuum chuck according to claim 9, wherein at least two stopping pins are allocated to every suction groove, said stopping pins being able to be controlled by positive pressure by one common supply channel or control pins provided for a certain size of the workpiece are radially arranged outside the suction groove, which is provided for the same size of the workpiece.
12. Vacuum chuck according to claim 4, wherein three lifting pins are provided outside the smallest or first suction groove and at least two stopping pins are provided offset relative to this.
13. Vacuum chuck according to claim 9, wherein at least two stopping pins are provided between two suction grooves arranged respectively adjacent to each other.
14. Vacuum chuck according to claim 1, wherein work channels that run complementarily to the suction grooves are provided on a side of the base body pointing towards the clamping plate, said work channels being connected to at least one suction opening with the suction grooves in the support surface of the clamping plate and every work channel is controlled separately by vacuum by a control valve.
15. Vacuum chuck according to claim 10, wherein supply channels are provided in an underplate, said supply channels being respectively connected to a feed channel, through which the at least two stopping pins, which are allocated to the size of the workpiece, are simultaneously supplied with positive pressure.
16. Vacuum chuck according to claim 1, wherein it is provided for clamping wafers.
17. Measuring device for checking workpieces, having X-ray fluorescent radiation, which has a moveable measuring table for receiving the at least one workpiece, at which a primary X-ray radiation, which is produced by a radiation source, is aimed and the emitted secondary radiation is detected by a detector and the measuring signals detected by the detector are evaluated by means of a control device, wherein a vacuum chuck according to claim 1 is provided on the moveable measuring table.
18. Method for checking a workpiece, with a measuring device according to claim 17, wherein, before fitting the vacuum chuck with the workpiece, lifting pins opposite the support surface of the clamping plate are transferred into an extended position, wherein the workpiece to be checked is placed on the lifting pins by the handling device, wherein the lifting pins are supplied with negative pressure and the workpiece to be checked is fixed to them, wherein the lifting pins are transferred into a retracted position and the workpiece is placed on the support surface, wherein at least one of the sizes of the workpiece supplies the corresponding suction groove with negative pressure and the workpiece is fixed on the support surface, wherein checking the workpiece is carried out by means of X-ray fluorescent radiation, wherein the negative pressure is switched off in the at least one suction groove, wherein the lifting pins are transferred into the extended position, wherein the workpiece is grasped by the handling device, and wherein the negative pressure applied to the lifting pins is switched off and the workpiece is guided out of the measuring device by the handling device.
19. Method according to claim 18, wherein the negative pressure applied to the lifting pins is retained during the clamping of the workpiece on the support surface of the clamping plate.
20. Method according to claim 18, wherein the negative pressure applied to the lifting pins is switched off after transferring into a retracted position and clamping the workpiece by the at least one suction groove supplied with negative pressure and negative pressure is supplied to the lifting pins to lift the workpiece, before the negative pressure on the at least one suction groove is switched off for lifting the workpiece.
Description
[0028] The invention and further advantageous embodiments and developments of the same are described and explained below in more detail by means of examples presented in the drawings. The features that can be ascertained from the description and the drawings can be applied individually or together in any combination according to the invention. Here are shown:
[0029]
[0030]
[0031]
[0032]
[0033]
[0034]
[0035]
[0036]
[0037]
[0038]
[0039]
[0040]
[0041]
[0042]
[0043]
[0044]
[0045]
[0046] A measuring device 11 for carrying out a measurement by means of X-ray fluorescent radiation is depicted perspectively in
[0047] A vacuum chuck 18 according to the invention, which is described in more detail in the figures below, serves to receive and clamp workpieces 19, in particular wafers. This vacuum chuck 18 can be mounted or fixed on the measuring table 12 of the measuring device 11 in order to fix the workpiece 19, in particular the wafer, for checking, for example by means of X-ray fluorescent radiation. This workpiece 19 can be placed on the vacuum chuck 18 by a handling device 89, for example.
[0048] In
[0049] Furthermore, the vacuum chuck 18 comprises lifting pins 29, for example three lifting pins 29. These are preferably arranged between the first suction groove 22 and the second suction groove 23. In particular, these are arranged to be evenly distributed across the periphery. The lifting pins 29 are preferably made from precious metal.
[0050] The vacuum chuck 18 can furthermore have stopping pins 31, wherein at least two stopping pins 31 can be allocated to every suction groove 22 to 26 in order to achieve positioning and alignment of the workpiece 19. The stopping pins 31 are arranged to be offset with respect to one another, for example, in particular offset with respect to one another at an angle of 90°. For two smaller sizes of workpieces 19 to be received, three stopping pins 31 are, for example, allocated to the first suction groove 22 and the second suction groove 22 in each case, wherein two stopping pins 31 lie on a common straight line in order to obtain additional alignment on a stopping surface of the workpiece 19.
[0051] The vacuum chuck 18 comprises a base body 33 which receives the clamping plate 21. The clamping surface 21 can be provided to be fixed on the base body, for example by adhesion, screwing or riveting. Alternatively, the clamping plate 21 can also be provided exchangeably on the base body 33. To do this, detachable fixing elements are preferably provided. The clamping plate 21 can consist of different materials and be selected according to the measuring object.
[0052] An actuator 34 is provided on a front face of the vacuum chuck 18, said actuator controlling a multi-position valve that is not depicted in more detail, in order to correspondingly activate the individual stopping pins 31 according to the size of the workpieces 19 to be clamped. This is described in more detail below. Several connections 43 are provided under a covering 32, said connections being discussed by means of
[0053] In
[0054] Detail C in
[0055] A perspective view of the base body 33 in a removed clamping plate 21 is depicted in
[0056] It can be seen in
[0057] Furthermore, a connection piece 43 is provided on the base body 33, which is controlled by the control valve 95. This control valve 95 regulates the applying of the negative pressure to the lifting pins 29. This is described in more detail in
[0058] Furthermore, on an upper side of the base body 33, four feed channels 44 to 47 are provided, through which, respectively, a positive pressure can be guided into a supply channel 48 to 51 connected thereto. These supply channels 48 to 51 can be controlled by the multi-switch valve which is selected by means of the operating element 34. These supply channels 48 to 51 are supplied with positive pressure by a positive pressure device. This can be carried out by a separate positive pressure device or even by correspondingly controlling the negative-pressure device 97.
[0059] At least two stopping pins 31 are allocated to every supply channel 48 to 51. For example, the feed channel 44 ends in the supply channel 48, in which in total three stopping pins 31, for example, can be controlled, which are arranged between the first suction groove 22 and the second suction groove 23 or the corresponding work channel 37, 38. This feed channel 44 is supplied with compressed air, for example, if a workpiece 19, in particular a wafer, with a diameter of 4″ (4 inches) is to be placed and clamped. The feed channel 45 is supplied for a 6″ wafer, the feed channel 46 for an 8″ wafer and the feed channel 47 for a 12″ wafer.
[0060] The course of the feed channels 44 to 47 and supply lines 48 to 51 are also clear from the view of the base body 33 from below according to
[0061] In the region of the feed channels 44 to 47, the work channels 39 to 41 in the base body 33 are indeed interrupted; however, applying a vacuum in these regions is sufficient to obtain a circular vacuum in each case inside the corresponding suction grooves 22 to 26, whereby a flat support of the workpiece 19 on the support surface 27 of the clamping plate 21 is provided.
[0062] A receiving space 64 in the base body 33 arises from
[0063] The supply and waste air of the cylinder 66 is regulated via the control valves 98, 99. The cylinder 66 can have an adjustable end position damping. Thus, a gentle lifting and lowering of the lifting pins 29 for placing and lifting the workpiece 19 on the support surface 27 of the clamping plate 21 can be adjusted and enabled. The connections 68, 69, by means of which the control valves 98, 99 are connected in the vacuum chuck 18 in order to supply the supply air for the cylinder 66, comprise one-way-restrictors in order to restrict at least the waste air.
[0064] Sensor elements 67 are arranged opposite one another to detect the position of the respective retracted or extended position of the lifting pins 29. These detect the position of the sliding carriage 65 in the receiving space 64 and convey the signals to the control 96 and/or the control device 17. The position of the lifting pins 29 is also detected from the position of the sliding carriage 65 because of the forced guiding of the lifting pins 29.
[0065] A perspective view of the sliding carriage 65 with the lifting pins 29 is depicted in
[0066] The sliding carriage 65 is preferably approximately H-shaped, wherein longitudinal indentations 74 are provided in a leg, the lifting pins 29 being moveable inside said indentations. The lifting pin 29 is connected to at least one control element 75, in particular a cam, a friction or anti-friction bearing, which is moveable along a slanted control surface 76. A shifting movement of the sliding carriage 65 in an XY-plane or according to arrow 77 produces an extending and retracting movement of the lifting pins 29 which is aligned perpendicular to said plane. Thus, the lifting pin 29 is guided to be vertically moveable along a guiding sleeve 78 such that this is able to be transferred from a retracted position into an extended position that is depicted in
[0067] On its upper end, the lifting pin 29 has a receiving element 81 that is similar to a suction cup, which is preferably formed from plastic. A hole 82 is provided inside the receiving element 81, said hole aligning with the guiding sleeve 78 such that a negative pressure produced by the guiding sleeve 78 also abuts on the receiving element 81. With a supporting workpiece 19, this is fixed to the support element 81. The guiding sleeve 78 and the lifting pins 29 are connected to one another by a common suction channel 84. Such a suction channel 84 is illustrated in the view from below of the underplate 36 in
[0068] Taking
[0069] The workpiece 19 is grasped by a handling device 89 according to
[0070] Subsequently, the cylinder 66 is controlled again in order to transfer the sliding carriage 65 into a further position, such that the lifting pins 29 are lowered and retracted. This can take place by at least one of the control valves 98, 99 and be monitored by the sensor elements 67. The workpiece 19 comes to rest gently on the support surface 27 of the clamping plate 21. Before or during, if appropriate also after lowering, the respectively provided suction groove 22 to 26 is supplied with a vacuum corresponding to the size of the workpiece 19, such that the workpiece 19 is fixed to the clamping plate 21. The workpiece 19, according to
[0071] At least the suction groove 24 is supplied with a vacuum. Preferably, the smaller suction grooves 23 and/or 22 are also supplied with a vacuum. The suction grooves 25 and 26 are thus not supplied with a vacuum since these are not covered by the workpiece 19.
[0072] The positioning and placing of a workpiece by hand, i.e. a manual operation, is described by