SEMICONDUCTOR CIRCUIT FOR DIGITAL-ANALOG CONVERSION AND IMPEDANCE CONVERSION
20170278460 · 2017-09-28
Inventors
Cpc classification
H03M1/68
ELECTRICITY
G09G2310/0291
PHYSICS
G09G2330/028
PHYSICS
G09G2310/027
PHYSICS
H03M1/742
ELECTRICITY
G09G2310/0272
PHYSICS
G09G3/20
PHYSICS
International classification
Abstract
A semiconductor circuit includes first and second DA converters which selects first and second reference voltages in response to upper m bits of input digital data, a select circuitry which outputs first to N-th selected input voltages in response to lower n bits of the input digital data; first to N-th differential input stages, an output stage and a first tail current source. Each of the first to N-th differential input stages includes a transistor pair. The i-th selected input voltage is supplied to the gates of a first MISFET of the i-th differential input stage and the gates of the second MISFETs of the first to N-th differential input stages are connected to the output node. The first tail current source controls the current levels of the first tail current in the first to N-th differential input stages in response to lower n bits of the input digital data.
Claims
1. A semiconductor circuit, comprising: a first DA converter configured to receive a plurality of reference voltages and select a first reference voltage from the plurality of reference voltages in response to upper m bits of (m+n)-bit input digital data; a second DA converter configured to receive the plurality of reference voltages and select a second reference voltage from the plurality of reference voltages in response to the upper m bits of the input digital data so that the second reference voltage is lower than the first reference voltage; a select circuitry configured to receive the first and second reference voltages and output first to N-th selected input voltages in response to lower n bits of the input digital data for N being an integer two or more, wherein each of the first to N-th selected input voltages is selected as one of the first and second reference voltages; first to N-th differential input stages; first and second drain interconnections; an output stage configured to output an analog output voltage to an output node in response to currents flowing through the first and second drain interconnections; and a first tail current source, wherein each of the first to N-th differential input stages includes: a first MISFET of a first conductivity type, having a source connected to a first node and a drain connected to the first drain interconnection; and a second MISFET of the first conductivity type, having a source connected to the first node and a drain connected to the second drain interconnection, wherein the i-th selected input voltage of the first to N-th selected input voltages is supplied to the gate of the first MISFET of the i-th differential input stage of the first to N-th differential input stages, where i is any integer from one to N, wherein the gate of the second MISFET of each of the first to N-th differential input stages is connected to the output node, wherein the first tail current source is configured to generate a first tail current flowing through the first node of each of the first to N-th differential input stages, and wherein the first tail current source controls a current level of the first tail current generated in each of the first to N-th differential input stages in response to lower n bits of the input digital data.
2. The semiconductor circuit according to claim 1, further comprising: third and fourth drain interconnections; and a second tail current source, wherein each of the first to N-th differential input stages further includes: a third MISFET of a second conductivity type complementary to the first conductivity type, having a source connected to a second node and a drain connected to the third drain interconnection; and a fourth MISFET of the second conductivity type, having a source connected to the second node and a drain connected to the fourth drain interconnection, wherein the i-th selected input voltage is supplied to the gate of the third MISFET of the i-th differential input stage, wherein the gate of the fourth MISFET of each of the first to N-th differential input stages is connected to the output node, wherein the second tail current source is configured to generate a second tail current flowing through the second node of each of the first to N-th differential input stages, wherein the second tail current source controls a current level of the second tail current generated in each of the first to N-th differential input stages in response to the lower n bits of the input digital data.
3. The semiconductor circuit according to claim 1, wherein the first tail current source includes: a plurality of first constant current sources; and a first switch circuit configured to connect each of the plurality of first constant current sources to a selected one of the first nodes of the first to N-th differential input stages in response to the lower bits of the input digital data.
4. The semiconductor circuit according to claim 2, wherein the first tail current source includes: a plurality of first constant current sources; and a first switch circuit configured to connect each of the plurality of first constant current sources to a selected one of the first nodes of the first to N-th differential input stages in response to the lower bits of the input digital data, and wherein the second tail current source includes: a plurality of second constant current sources; and a second switch circuit configured to connect each of the plurality of second constant current sources to a selected one of the second nodes of the first to N-th differential input stages in response to the lower bits of the input digital data.
5. The semiconductor circuit according to claim 3, wherein the plurality of first constant current sources are configured to generate constant currents having the same current level.
6. The semiconductor circuit according to claim 4, wherein the plurality of first constant current sources are configured to generate constant currents having the same current level, and wherein the plurality of second constant current sources are configured to generate constant currents having the same current level.
7. A semiconductor circuit, comprising: a first DA converter configured to receive a plurality of reference voltages and select a first reference voltage from the plurality of reference voltages in response to upper m bits of (m+n)-bit input digital data; a second DA converter configured to receive the plurality of reference voltages and select a second reference voltage from the plurality of reference voltages in response to the upper m bits of the input digital data so that the second reference voltage is lower than the first reference voltage; a select circuitry configured to receive the first and second reference voltages and output first to N-th selected input voltages in response to lower n bits of the input digital data for N being an integer two or more, wherein each of the first to N-th selected input voltages is selected as one of the first and second reference voltages; first to N-th differential input stages; first to fourth drain interconnections; an output stage configured to output an analog output voltage to an output node in response to currents flowing through the first to fourth drain interconnections; and first and second tail current sources, wherein the first to N-th selected input voltages are supplied to the first to N-th differential input stages, respectively, wherein at least one of the first to N-th differential input stages includes: a first MISFET of a first conductivity type, having a source connected to a first node and a drain connected to the first drain interconnection; a second MISFET of the first conductivity type, having a source connected to the first node and a drain connected to the second drain interconnection; wherein a remaining one(s) of the first to N-th differential input stages includes: a third MISFET of a second conductivity type complementary to the first conductivity type, having a source connected to a second node and a drain connected to the third drain interconnection; a second MISFET of the second conductivity type, having a source connected to the second node and a drain connected to the fourth drain interconnection; wherein a corresponding one of the first to N-th selected input voltages is supplied to the gate of the first MISFET of the at least one of the first to N-th differential input stage, wherein the gate of the second MISFET of the at least one of the first to N-th differential input stage is connected to the output node, wherein a corresponding one of the first to N-th selected input voltages is supplied to the gate of the third MISFET of the remaining one(s) of the first to N-th differential input stage, wherein the gate of the fourth MISFET of the remaining one(s) of the first to N-th differential input stage is connected to the output node, wherein the first tail current source is configured to generate a first tail current flowing through the first node of the at least one of the first to N-th differential input stages, and wherein the first tail current source controls a current level of the first tail current generated through the first node of the at least one of the first to N-th differential input stages in response to lower n bits of the input digital data, wherein the second tail current source is configured to generate a second tail current flowing through the second node of the remaining one(s) of the first to N-th differential input stages, and wherein the second tail current source controls a current level of the second tail current generated through the second node of the remaining one(s) of the first to N-th differential input stages in response to lower n bits of the input digital data, wherein the at least one of the first to N-th differential input stages does not include a differential pair including MISFETs of the second conductivity type, and wherein the remaining one(s) of the first to N-th differential input stages does not include a differential pair including MISFETs of the first conductivity type.
8. A display driver adapted to drive a source line of a display panel in response to image data, the driver comprising: a source output to be connected to the source line; a first DA converter configured to receive a plurality of reference voltages and select a first reference voltage from the plurality of reference voltages in response to upper m bits of (m+n)-bit image data; a second DA converter configured to receive the plurality of reference voltages and select a second reference voltage from the plurality of reference voltages in response to the upper m bits of the image data so that the second reference voltage is lower than the first reference voltage; a select circuitry configured to receive the first and second reference voltages and output first to N-th selected input voltages in response to lower n bits of the image data for N being an integer two or more, wherein each of the first to N-th selected input voltages is selected as one of the first and second reference voltages; first to N-th differential input stages; first and second drain interconnections; an output stage configured to output an analog output voltage to an output node connected to the source output in response to currents flowing through the first and second drain interconnections; and a first tail current source, wherein each of the first to N-th differential input stages includes: a first MISFET of a first conductivity type, having a source connected to a first node and a drain connected to the first drain interconnection; a second MISFET of the first conductivity type, having a source connected to the first node and a drain connected to the second drain interconnection; wherein the i-th selected input voltage of the first to N-th selected input voltages is supplied to the gate of the first MISFET of the i-th differential input stage of the first to N-th differential input stages, where i is any integer from one to N, wherein the gate of the second MISFET of each of the first to N-th differential input stages is connected to the output node, wherein the first tail current source is configured to generate a first tail current flowing through the first node of each of the first to N-th differential input stages, and wherein the first tail current source controls a current level of the first tail current generated in each of the first to N-th differential input stages in response to lower n bits of the image data.
9. The display driver according to claim 8, further comprising: third and fourth drain interconnections; and a second tail current source, wherein each of the first to N-th differential input stages further includes: a third MISFET of a second conductivity type complementary to the first conductivity type, having a source connected to a second node and a drain connected to the third drain interconnection; and a fourth MISFET of the second conductivity type complementary to the first conductivity type, having a source connected to the second node and a drain connected to the fourth drain interconnection, wherein the i-th selected input voltage is supplied to the gate of the third MISFET of the i-th differential input stage, wherein the gate of the fourth MISFET of each of the first to N-th differential input stages is connected to the output node, wherein the second tail current source is configured to generate a second tail current flowing through the second node of each of the first to N-th differential input stages, and wherein the second tail current source controls a current level of the second tail current generated in each of the first to N-th differential input stages in response to the lower n bits of the image data.
10. A display driver for driving source lines of a display panel in response to image data, the driver comprising: a reference voltage generator circuit configured to generate a plurality of reference voltages and a drive circuitry configured to receive the image data and output source voltages having voltage levels corresponding to the image data to the source lines by using the plurality of reference voltages, wherein the reference voltage generator circuit includes: a resistor string; a first DA converter configured to receive a plurality of voltages and select a first selected voltage from the plurality of voltages in response to upper m bits of (m+n)-bit input digital data; a second DA converter configured to receive the plurality of voltages and select a second selected voltage from the plurality of voltages in response to the upper m bits of the input digital data so that the second reference voltage is lower than the first reference voltage; a select circuitry configured to receive the first and second selected voltages and output first to N-th selected input voltages in response to lower n bits of the input digital data for N being an integer two or more, wherein each of the first to N-th selected input voltages is selected as one of the first and second selected voltages; a preamplifier configured to receive the first to N-th selected input voltages and supply a standard voltage to the resistor string in response to the first to N-th selected input voltages, wherein the plurality of reference voltages are generated from voltages obtained from a plurality of positions of the resistor string, wherein the preamplifier includes: first to N-th differential input stages; first and second drain interconnections; an output stage configured to output the standard voltage to an output node connected to the resistor string in response to currents flowing through the first and second drain interconnections; and a first tail current source, wherein each of the first to N-th differential input stages includes: a first MISFET of a first conductivity type, having a source connected to a first node and a drain connected to the first drain interconnection; a second MISFET of the first conductivity type, having a source connected to the first node and a drain connected to the second drain interconnection; wherein the i-th selected input voltage of the first to N-th selected input voltages is supplied to the gate of the first MISFET of the i-th differential input stage of the first to N-th differential input stages, where i is any integer from one to N, wherein the gate of the second MISFET of each of the first to N-th differential input stages is connected to the output node, wherein the first tail current source is configured to generate a first tail current flowing through the first node of each of the first to N-th differential input stages, and wherein the first tail current source controls a current level of the first tail current generated in each of the first to N-th differential input stages in response to lower n bits of the input digital data.
11. The display driver according to claim 10, wherein the preamplifier further includes: third and fourth drain interconnections; and a second tail current source, wherein each of the first to N-th differential input stages further includes: a third MISFET of a second conductivity type complementary to the first conductivity type, having a source connected to a second node and a drain connected to the third drain interconnection; and a fourth MISFET of the second conductivity type complementary to the first conductivity type, having a source connected to the second node and a drain connected to the fourth drain interconnection, wherein the i-th selected input voltage is supplied to the gate of the third MISFET of the i-th differential input stage, wherein the gate of the fourth MISFET of each of the first to N-th differential input stages is connected to the output node, wherein the second tail current source is configured to generate a second tail current flowing through the second node of each of the first to N-th differential input stages, wherein the second tail current source controls a current level of the second tail current generated in each of the first to N-th differential input stages in response to the lower n bits of the input digital data.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0013] The above and other advantages and features of the present disclosure will be more apparent from the following description taken in conjunction with the accompanied drawings, in which:
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DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS
[0029] Various embodiments of the present disclosure will be now described herein with reference to attached drawings. It should be noted that same or similar elements may be denoted by same or corresponding reference numerals and suffixes may be attached to reference numerals for distinguishing multiple same components from each other.
[0030]
[0031] In the present embodiment, the semiconductor circuit 10 includes DA converters 1, 2, selectors 3, 4 and a differential amplifier circuit 5.
[0032] The DA converters 1 and 2 is each configured to select one of reference voltages V.sub.REF1 to V.sub.REFq received from a reference voltage bus 6 in response to upper m bits of the input digital data D.sub.IN and output the selected reference voltage, where q is the number of the reference voltages V.sub.REF1 to V.sub.REFq supplied to the DA converters 1 and 2. In the present embodiment, q is 2.sup.m+1. In the following, the reference voltage selected by the DA converter 1 is referred to as the reference voltage V.sub.REFH and the reference voltage selected by the DA converter 2 is referred to as the reference voltage V.sub.REFL. The DA converters 1 and 2 are configured to select the reference voltages V.sub.REFH and V.sub.REFL so that the reference voltages V.sub.REFH and V.sub.REFL are different from each other and the reference voltages V.sub.REFH is higher than the reference voltages V.sub.REFL.
[0033] In one embodiment, the reference voltages V.sub.REF1 to V.sub.REFq are generated to satisfy the following formula:
V.sub.REF1<V.sub.REF2< . . . <V.sub.REF(q-1)<V.sub.REFq.
In this case, two reference voltages V.sub.REFk and V.sub.REF(k+1), which have adjacent voltage levels, may be selected from the reference voltages V.sub.REF1 to V.sub.REFq as the reference voltages V.sub.REFH and V.sub.REFL, where k is an integer from one to q−1. As described later, the semiconductor circuit 10 is configured to generate the analog output voltage V.sub.OUT so that the analog output voltage V.sub.OUT is equal to or higher than the reference voltage V.sub.REFL and lower than the reference voltage V.sub.REFH.
[0034] The selectors 3 and 4 operate as a select circuitry which receives the reference voltages V.sub.REFH and V.sub.REFL and outputs selected input voltages V.sub.IN1 and V.sub.IN2 to be supplied to the differential amplifier circuit 5, in response to lower n bits of the input digital data D.sub.IN. It should be noted that each of the selected input voltages V.sub.IN1 and V.sub.IN2 is selected from the reference voltages V.sub.REFH and V.sub.REFL. The selector 3 outputs a selected one of the reference voltages V.sub.REFH and V.sub.REFL as the selected input voltage V.sub.IN1, in response to the lower n bits of the input digital data D.sub.IN. The selector 4 outputs a selected one of the reference voltages V.sub.REFH and V.sub.REFL as the selected input voltage V.sub.IN2, in response to the lower n bits of the input digital data D.sub.IN. It should be noted that the selected input voltages V.sub.IN1 and V.sub.IN2 selected by the selectors 3 and 4 may be equal to each other.
[0035] The differential amplifier circuit 5 is configured to receive the selected input voltages V.sub.IN1 and V.sub.IN2 from the selectors 3 and 4 and generate the analog output voltage V.sub.OUT from the selected input voltages V.sub.IN1 and V.sub.IN2. It should be noted that, as described later in detail, the voltage level of the analog output voltage V.sub.OUT output from the differential amplifier circuit 5 is adjusted in response to the value of the lower n bits of the input digital data D.sub.IN.
[0036]
[0037] In detail, the differential input stage 11.sub.1 includes PMOS transistors MP11, MP21 and NMOS transistors MN11 and MN21. It should be noted that, as is well known in the art, the NMOS transistor is a sort of N-channel MISFET (metal insulator semiconductor field effect transistor) and the PMOS transistor is a sort of P-channel MISFET.
[0038] The PMOS transistors MP11 and MP21 have commonly-connected sources and form a PMOS differential pair. More specifically, the sources of the PMOS transistors MP11 and MP21 are commonly connected to a node N11. The gate of the PMOS transistor MP11 is connected to the input node 17.sub.1, which receives the selected input voltage V.sub.IN1 from the selector 3, and the gate of the PMOS transistor MP21 is connected to the output node 18, from which the analog output voltage V.sub.OUT is output. The drain of the PMOS transistor MP11 is connected to a drain interconnection 21 and the drain of the PMOS transistor MP21 is connected to a drain interconnection 22.
[0039] The NMOS transistors MN11 and MN21 have commonly-connected sources and form an NMOS differential pair. More specifically, the sources of the NMOS transistors MN11 and MN21 are commonly connected to a node N21. The gate of the NMOS transistor MN11 is connected to the input node 17.sub.1, and the gate of the NMOS transistor MN21 is connected to the output node 18. The drain of the NMOS transistor MN11 is connected to a drain interconnection 23 and the drain of the NMOS transistor MN21 is connected to a drain interconnection 24.
[0040] The differential input stage 11.sub.2 is configured similarly to the differential input stage 11.sub.1. The differential input stage 11.sub.2 includes PMOS transistors MP12, MP22, and NMOS transistors MN12 and MN22.
[0041] The PMOS transistors MP12 and MP22 have commonly-connected sources and form a PMOS differential pair. More specifically, the sources of the PMOS transistors MP12 and MP22 are commonly connected to a node N12. The gate of the PMOS transistor MP12 is connected to the input node 17.sub.2, which receives the selected input voltage V.sub.IN2 from the selector 4, and the gate of the PMOS transistor MP22 is connected to the output node 18, from which the analog output voltage V.sub.OUT. The drain of the PMOS transistor MP12 is connected to a drain interconnection 21 and the drain of the PMOS transistor MP22 is connected to a drain interconnection 22.
[0042] The NMOS transistors MN12 and MN22 have commonly-connected sources and form an NMOS differential pair. More specifically, the sources of the NMOS transistors MN12 and MN22 are commonly connected to a node N22. The gate of the NMOS transistor MN12 is connected to the input node 17.sub.2, and the gate of the NMOS transistor MN22 is connected to the output node 18. The drain of the NMOS transistor MN12 is connected to a drain interconnection 23 and the drain of the NMOS transistor MN22 is connected to a drain interconnection 24.
[0043] The tail current source circuit 12 supplies tail currents Icp1 and Icp2 to the nodes N11 and N12 of the differential input stages 11.sub.1 and 11.sub.2, respectively. In the present embodiment, the tail current source circuit 12 includes a variable current source 26.sub.1 connected between a positive-side line 19 and the node N11 and a variable current source 26.sub.2 connected between the positive-side line 19 and the node N12. In this embodiment, an analog power supply voltage VSP is supplied to the positive-side line 19. The variable current source 26.sub.1 generates the tail current Icp1 flowing through the node N11 and the variable current source 26.sub.2 generates the tail current Icp2 flowing through the node N12. A control signal is supplied to the tail current source circuit 12 from the tail current source control circuit 16 and the current levels of the tail currents Icp1 and Icp2 are controlled in response to the control signal.
[0044] Similarly, the tail current source circuit 13 draws tail currents Icn1 and Icn2 from the nodes N21 and N22 of the differential input stages 11.sub.1 and 11.sub.2, respectively. In the present embodiment, the tail current source circuit 13 includes a variable current source 27.sub.1 connected between the node N21 and a negative-side line 20 and a variable current source 27.sub.2 connected between the node N22 and the negative-side line 20. In this embodiment, the negative-side line 20 is connected to the circuit ground. The variable current source 27.sub.1 generates the tail current Icn1 flowing through the node N21 and the variable current source 27.sub.2 generates the tail current Icn2 flowing through the node N22. A control signal is supplied to the tail current source circuit 13 from the tail current source control circuit 16 and the current levels of the tail currents Icn1 and Icn2 are controlled in response to the control signal.
[0045] The active load circuit 14 operates as an active load connected to the drain interconnections 21 to 24. In the present embodiment, the active load circuit 14 includes PMOS transistors MP3, MP4, NMOS transistors MN3, MN4 and constant current sources 28 and 29.
[0046] The PMOS transistors MP3 and MP4 form a current mirror connected to the drain interconnections 23 and 24. The PMOS transistors MP3 and MP4 have sources commonly connected to the positive-side line 19 and gates commonly connected to the drain of the PMOS transistor MP4. The drains of the PMOS transistors MP3 and MP4 are connected to the drain interconnections 23 and 24, respectively.
[0047] The NMOS transistors MN3 and MN4 form a current mirror connected to the drain interconnections 21 and 22. The NMOS transistors MN3 and MN4 have sources commonly connected to the negative-side line 20 and gates commonly connected to the drain of the NMOS transistor MN4. The drains of the NMOS transistors MN3 and MN4 are connected to the drain interconnections 21 and 22, respectively.
[0048] The current source 28 is connected between the drain of the PMOS transistor MP3 and the drain of the NMOS transistor MN3, and generates a current flowing from the drain of the PMOS transistor MP3 to the drain of the NMOS transistor MN3. Similarly, the current source 29 is connected between the drain of the PMOS transistor MP4 and the drain of the NMOS transistor MN4, and generates a current flowing from the drain of the PMOS transistor MP4 to the drain of the NMOS transistor MN4.
[0049] The output stage 15 drives the output node 18 in response to the currents flowing through the drain interconnections 21 to 24. In the present embodiment, the output stage 15 includes a PMOS transistor MP5, an NMOS transistor MN5 and a phase compensation circuit 25. The PMOS transistor MP5 and the NMOS transistor MN5 operate as output transistors which drive the output node 18. The PMOS transistor MP5 has a source connected to the positive-side line 19, a drain connected to the output node 18 and a gate connected to the drain of the PMOS transistor MP3 of the active load circuit 14. The NMOS transistor MN5 has a source connected to the negative-side line 20, a drain connected to the output node 18 and a gate connected to the drain of the NMOS transistor MN3 of the active load circuit 14. The phase compensation circuit 25 is connected to the gate of the PMOS transistor MP5, the gate of the NMOS transistor MN5 and the output node 18 to achieve phase compensation of the differential amplifier circuit 5.
[0050] The tail current source control circuit 16 generates the control signals to be supplied to the tail current source circuits 12 and 13 in response to the lower n bits D.sub.IN[n-1:0] of the input digital data D.sub.IN, to thereby control the tail currents Icp1, Icp2, Icn1 and Icn2 generated by the tail current source circuits 12 and 13. It is significant that the tail currents Icp1, Icp2, Icn1 and Icn2 are controlled in response to the lower n bits D.sub.IN[n-1:0] of the input digital data D.sub.IN. As described later in detail, in the present embodiment, the function of digital-analog conversion of n-bit resolution is achieved by controlling the tail currents Icp1, Icp2, Icn1 and Icn2 in response to the lower n bits D.sub.IN[n-1:0] of the input digital data D.sub.IN.
[0051]
[0052] In one embodiment, the constant current sources 31.sub.1 and 31.sub.2 may be configured to generate constant currents of the same current level. In this case, the number of the allowed current levels of the tail current Icp1 generated by the variable current source 26.sub.1 is equal to the number of the constant current sources 31.sub.1 and the number of the allowed current levels of the tail current Icp2 generated by the variable current source 26.sub.2 is equal to the number of the constant current sources 31.sub.2. In an alternative embodiment, the constant currents generated by the constant current sources 31.sub.1 and 31.sub.2 may have weighted current levels. This configuration effectively increases the number of the allowed current levels of the tail currents Icp1 and Icp2 output from the tail current source circuit 12. When the variable current source 26.sub.1 includes a constant current sources 31.sub.1 and the current levels of the constant currents generated by the constant current sources 31.sub.1 are adjusted to I, 2×I, . . . , 2.sup.α-1×I, respectively for I being a given current level, for example, the number of the allowed current levels of the tail current Icp1 generated by the variable current source 26.sub.1 can be increased up to 2.sup.α. The similar goes for the tail current Icp2 generated by the variable current source 26.sub.2.
[0053] Similarly, the tail current source circuit 13 includes a variable current source 27.sub.1 configured to draw the tail current Icn1 from the node N21 of the differential input stage 11.sub.1; and a variable current source 27.sub.2 configured to draw the tail current Icn2 from the node N22 of the differential input stage 11.sub.2. The variable current source 27.sub.1 includes: a plurality of constant current sources 33.sub.1 connected in parallel between the negative-side line 20 and the node N21 of the differential input stage 11.sub.1; and a plurality of switches 34.sub.1 connected in series to the constant current sources 33.sub.1, respectively. Similarly, the variable current source 27.sub.2 includes: a plurality of constant current sources 33.sub.2 connected in parallel between the negative-side line 20 and the node N22 of the differential input stage 11.sub.2; and a plurality of switches 34.sub.2 connected in series to the constant current sources 33.sub.2, respectively. The turn-on-and-off of the switches 34.sub.1 and 34.sub.2 are controlled on the control signal received from the tail current source control circuit 16. The variable current sources 27.sub.1 and 27.sub.2 thus configured is able to control the current levels of the tail current Icn1 and Icn2 by adjusting the number of the switches 34.sub.1 and 34.sub.2 which are turned on.
[0054] In one embodiment, the constant current sources 33.sub.1 and 33.sub.2 may be configured to generate constant currents of the same current level. In this case, the number of the allowed current levels of the tail current Icn1 generated by the variable current source 27.sub.1 is equal to the number of the constant current sources 33.sub.1 and the number of the allowed current levels of the tail current Icn2 generated by the variable current source 27.sub.2 is equal to the number of the constant current sources 33.sub.2. In an alternative embodiment, the constant currents generated by the constant current sources 33.sub.1 and 33.sub.2 may have weighted current levels. This configuration effectively increases the number of the allowed current levels of the tail currents Icn1 and Icn2 output from the tail current source circuit 13. When the variable current source 27.sub.1 includes a constant current sources 33.sub.1 and the current levels of the constant currents generated by the constant current sources 33.sub.1 are adjusted to I, 2×I, . . . , 2.sup.α-1×I, respectively, for I being a given current level, the number of the allowed current levels of the tail current Icn1 generated by the variable current source 27.sub.1 can be increased up to 2.sup.α. The similar goes for the tail current Icn2 generated by the variable current source 27.sub.2.
[0055] Next, a description is given of the operation of the semiconductor circuit 10 in this embodiment. Overall, the semiconductor circuit 10 of this embodiment is configured to output an analog output voltage V.sub.OUT having a voltage level corresponding to the value of the (m+n)-bit input digital data D.sub.IN. Additionally, the semiconductor circuit 10 of this embodiment achieves a low output impedance by performing impedance conversion with the differential amplifier circuit 5. This implies that the semiconductor circuit 10 of this embodiment is able to drive a load having a large capacitance. In the following, a description is given of exemplary operations of the respective circuits of the semiconductor circuit 10 in this embodiment.
[0056] The DA converter 1 selects the reference voltage V.sub.REFH from the reference voltages V.sub.REF1 to V.sub.REFq on the basis of the upper m bits of the input digital data D.sub.IN and the DA converter 2 selects the reference voltage V.sub.REFL from the reference voltages V.sub.REF1 to V.sub.REFq on the basis of the upper m bits of the input digital data D.sub.IN. The reference voltages V.sub.REFH and V.sub.REFL are selected so that the reference voltage V.sub.REFH is higher than the reference voltage V.sub.REFL. The DA converters 1 and 2 thus operated provide the function of m-bit digital analog conversion for the semiconductor circuit 10 of the present embodiment. The reference voltages V.sub.REFH and V.sub.REFL selected by the DA converters 1 and 2 are supplied to the selectors 3 and 4.
[0057] The selector 3 selects one of the reference voltages V.sub.REFH and V.sub.REFL in response to the lower n bits of the input digital data D.sub.IN and supplies the selected reference voltage to the differential input stage 11.sub.1 of the differential amplifier circuit 5 as the selected input voltage V.sub.IN1. The selector 4 selects one of the reference voltages V.sub.REFH and V.sub.REFL in response to the lower n bits of the input digital data D.sub.IN and supplies the selected reference voltage to the differential input stage 11.sub.2 of the differential amplifier circuit 5 as the selected input voltage V.sub.IN2. It should be noted that the selected input voltages V.sub.IN1 and V.sub.IN2 selected by the selectors 3 and 4 may be same.
[0058] When the selected input voltages V.sub.IN1 and V.sub.IN2 are same, the differential amplifier circuit 5 outputs the analog output voltage V.sub.OUT so that the analog output voltage V.sub.OUT has the same voltage level as the selected input voltages V.sub.IN1 and V.sub.IN2. When the selected input voltages V.sub.IN1 and V.sub.IN2 are different, the differential amplifier circuit 5 outputs the analog output voltage V.sub.OUT so that the analog output voltage V.sub.OUT has a voltage level between the selected input voltages V.sub.IN1 and V.sub.IN2 in response to the lower n bits of the input digital data D.sub.IN.
[0059] In detail, when the selected input voltages V.sub.IN1 and V.sub.IN2 are same, the differential amplifier circuit 5 operates as a commonly-used voltage follower and outputs the analog output voltage V.sub.OUT so that the analog output voltage V.sub.OUT has the same voltage level as the selected input voltages V.sub.IN1 and V.sub.IN2, as is understood from the circuit diagram illustrated in
[0060] When the selected input voltages V.sub.IN1 and V.sub.IN2 are different, on the other hand, the differential amplifier circuit 5 outputs the analog output voltage V.sub.OUT depending on the current levels of the tail currents Icp1, Icp2, Icn1 and Icn2, so that the analog output voltage V.sub.OUT has a voltage level between the selected input voltages V.sub.IN1 and V.sub.IN2. When the tail current Icp1 is larger than the tail current Icp2, the analog output voltage V.sub.OUT is generated to have a voltage level closer to the selected input voltage V.sub.IN1. When the tail current Icp2 is larger than the tail current Icp1, the analog output voltage V.sub.OUT is generated to have a voltage level closer to the selected input voltage V.sub.IN2. The similar goes for the tail currents Icn1 and Icn2. When the tail current Icn1 is larger than the tail current Icn2, the analog output voltage V.sub.OUT is generated to have a voltage level closer to the selected input voltage V.sub.IN1. When the tail current Icn2 is larger than the tail current Icn1, the analog output voltage V.sub.OUT is generated to have a voltage level closer to the selected input voltage V.sub.IN2.
[0061] In the present embodiment, the tail currents Icp1, Icp2, Icn1 and Icn2 are controlled in response to the lower n bits of the input digital data D.sub.IN by the tail current source control circuit 16 and therefore the number of allowed voltage levels of the analog output voltage V.sub.OUT output from the differential amplifier circuit 5 is 2.sup.n for a specific combination of the selected input voltages V.sub.IN1 and V.sub.IN2. This operation allows the semiconductor circuit 10 of the present embodiment to perform (m+n) bit digital-analog conversion as a whole.
[0062] In an alternative embodiment, one of the selected input voltages V.sub.IN1 and V.sub.IN2 may be fixed to the reference voltage V.sub.REFH or V.sub.REFL. Even when the selected input voltage supplied to one of the two differential input stages 11.sub.1 and 11.sub.2 is fixed, The selectors 3, 4 and the differential amplifier circuit 5 can achieve digital-analog conversion of the n-bit resolution by appropriately selecting the selected input voltage supplied to the other of the two differential input stages 11.sub.1 and 11.sub.2. When one of the selected input voltages V.sub.IN1 and V.sub.IN2 is fixed to the reference voltage V.sub.REFH or V.sub.REFL, the selector corresponding thereto (the selector 3 or 4) may be omitted. Such configuration is effective for circuit size reduction. It should be noted however that the configuration in which both of the selectors 3 and 4 are provided is preferable for flexibly controlling the voltage level of the analog output voltage V.sub.OUT output from the semiconductor circuit 10.
[0063]
[0064] In the present embodiment, the constant current sources 31.sub.1 and 31.sub.2 are adjusted to generate constant currents having the same current level and the constant current sources 33.sub.1 and 33.sub.2 are adjusted to generate constant currents having the same current level. In addition, the current levels of the tail currents Icp1, Icn1, Icp2 and Icn2 are controlled by controlling the number of the constant current sources 31.sub.1, 33.sub.1, 31.sub.2 and 33.sub.2 used to generate the tail currents Icp1, Icn1, Icp2 and Icn2.
[0065] The selectors 3 and 4 receives the reference voltages V.sub.REFH and V.sub.REFL from the DA converters 1 and 2 and selects the selected input voltages V.sub.IN1 and V.sub.IN2 in response to the lower two bits of the input digital data D.sub.IN.
[0066] More specifically, when the lower two bits of the input digital data D.sub.IN are “00”, the selectors 3 and 4 set both of the selected input voltages V.sub.IN1 and V.sub.IN2 to the reference voltage V.sub.REFL. In this case, the analog output voltage V.sub.OUT output from the differential amplifier circuit 5 is set to the reference voltage V.sub.REFL. In the meantime, the tail current source control circuit 16 sets the number of the constant current sources 31.sub.1 and 33.sub.1 respectively used to supply the tail currents Icp1 and Icn1 to two and also sets the number of the constant current sources 31.sub.2 and 33.sub.2 respectively used to supply the tail currents Icp2 and Icn2 to two. In other words, the tail current source control circuit 16 turns on two of the switches 32.sub.1, two of the switches 32.sub.2, two of the switches 34.sub.1 and two of the switches 34.sub.2.
[0067] When the lower two bits of the input digital data D.sub.IN are “01”, “10” or “11”, the selector 3 sets the selected input voltage V.sub.IN1 to the reference voltage V.sub.REFH and the selector 4 sets the selected input voltage V.sub.IN2 to the reference voltage V.sub.REFL. In the meantime, the tail current source control circuit 16 controls the current levels of the tail currents Icp1, Icn1, Icp2 and Icn2 in response to the lower two bits of the input digital data D.sub.IN. In the present embodiment, the tail current source control circuit 16 controls the number of constant current sources used to supply the tail currents Icp1, Icn1, Icp2 and Icn2, by controlling the number of turned-on switches out of the switches 32.sub.1, 34.sub.1, 32.sub.2 and 34.sub.2, and thereby controls the current levels of the tail currents Icp1, Icp1, Icp2 and Icn2.
[0068] In detail, when the lower two bits of the input digital data D.sub.IN are “01”, the tail current source control circuit 16 sets the number of the constant current sources 31.sub.1 and 33.sub.1 respectively used to supply the tail currents Icp1 and Icn1 to one and sets the number of the constant current sources 31.sub.2 and 33.sub.2 respectively used to supply the tail currents Icp2 and Icn2 to three. In other words, the tail current source control circuit 16 turns on one of the switches 32.sub.1, one of the switches 34.sub.1, three of the switches 32.sub.2 and three of the switches 34.sub.2. This allows adjusting the analog output voltage V.sub.OUT output from the differential amplifier circuit 5 to (V.sub.REFH V.sub.REFL×3)/4.
[0069] When the lower two bits of the input digital data D.sub.IN are “10”, the tail current source control circuit 16 sets the number of the constant current sources 31.sub.1 and 33.sub.1 respectively used to supply the tail currents Icp1 and Icn1 to two and sets the number of the constant current sources 31.sub.2 and 33.sub.2 respectively used to supply the tail currents Icp2 and Icn2 to two. In other words, the tail current source control circuit 16 turns on two of the switches 32.sub.1, two of the switches 34.sub.1, two of the switches 32.sub.2 and two of the switches 34.sub.2. This allows adjusting the analog output voltage V.sub.OUT output from the differential amplifier circuit 5 to (V.sub.REFH V.sub.REFL)/2.
[0070] When the lower two bits of the input digital data D.sub.IN are “11”, the tail current source control circuit 16 sets the number of the constant current sources 31.sub.1 and 33.sub.1 respectively used to supply the tail currents Icp1 and Icn1 to three and sets the number of the constant current sources 31.sub.2 and 33.sub.2 respectively used to supply the tail currents Icp2 and Icn2 to one. In other words, the tail current source control circuit 16 turns on three of the switches 32.sub.1, three of the switches 34.sub.1, one of the switches 32.sub.2 and one of the switches 34.sub.2. This allows adjusting the analog output voltage V.sub.OUT output from the differential amplifier circuit 5 to (V.sub.REFH×3 V.sub.REFL)/4.
[0071] Through the operation procedure described above, the analog output voltage V.sub.OUT is generated to have a voltage level corresponding to the lower two bits of the input digital data D.sub.IN from the reference voltages V.sub.REFH and V.sub.REFL, which are selected in response to the upper m bits of the input digital data D.sub.IN, in the operation of the semiconductor circuit 10 illustrated in
[0072] It should be noted that the selector 4 is not necessary when the operation illustrated in
[0073] It should be noted here that the semiconductor circuit 10 of this embodiment achieves the (m+n)-bit resolution although the number q of the reference voltages V.sub.REF1 to V.sub.REFq supplied thereto is 2.sup.m+1. A DA converter configured to simply select an analog output voltage from a plurality of reference voltages requires 2.sup.(m+n) different reference voltages for achieving the (m+n)-bit resolution. The configuration of the semiconductor circuit 10 of the present embodiment, which provides (m+n)-bit resolution, allows reducing the number q of the reference voltages V.sub.REF1 to V.sub.REFq to be supplied to the semiconductor circuit 10 down to 2.sup.m+1. This effectively reduces the circuit size. As thus discussed, the semiconductor circuit 10 of this embodiment achieves a higher resolution and a reduced circuit size at the same time, in performing digital-analog conversion and impedance conversion.
[0074] In the following, various modifications of the semiconductor circuit 10 of the present embodiment are described.
[0075] In the modification illustrated in
[0076] The tail current source circuit 13 is configured similarly to the tail current source circuit 12; the tail current source circuit 13 includes a plurality of constant current sources 38, a plurality of switches 39 and a plurality of switches 40. One switch 39 and one switch 40 are associated with each constant current source 38. The constant current sources 38 are connected to the negative-side line 20 in parallel, and each configured to generate a constant current. Each switch 39 is connected between the corresponding constant current source 38 and the node N21 of the differential input stage 11.sub.1 and each switch 40 is connected between the corresponding constant current source 38 and the node N22 of the differential input stage 11.sub.2. The switches 39 and 40 form a switch circuit configured to connect each of the constant current sources 38 to any one of the node N21 of the differential input stage 11.sub.1 and the node N22 of the differential input stage 11.sub.2, in response to the lower n bits of the input digital data D.sub.IN under the control of the tail current source control circuit 16. The switches 39 and 40 connected to each constant current source 38 have the function of electrically connecting each constant current source 38 to any one of the node N21 of the differential input stage 11.sub.1 and the node N22 of the differential input stage 11.sub.2.
[0077] The configuration illustrated in
[0078] The configuration of the tail current source circuit 12 illustrated in
[0079] The same discussion applies to the tail current source circuit 13. The configuration illustrated in
[0080] Although
[0081]
[0082] In another alternative embodiment, the differential input stages 11.sub.1 and 11.sub.2 may each include only an NMOS differential pair. Such configuration also reduces the circuit elements included in the differential input stages 11.sub.1 and 11.sub.2.
[0083]
[0084] Although
[0085]
[0086]
[0087] Each differential input stages 11; includes PMOS transistors MP1i, MP2i, and NMOS transistors MN1i and MN2i, where i is any integer from one to four.
[0088] The PMOS transistors MP1i and MP2i have commonly-connected sources and form a PMOS differential pair. The sources of the PMOS transistors MP1i and MP2i are commonly connected to the node N1i. The drain of the PMOS transistor MP1i is connected to the drain interconnection 21 and the drain of the PMOS transistor MP2i is connected to the drain interconnection 22.
[0089] The NMOS transistors MN1i and MN2i have commonly-connected sources and form an NMOS differential pair. The sources of the NMOS transistors MN1i and MN2i are commonly connected to the node N2i. The drain of the NMOS transistor MN1i is connected to the drain interconnection 23 and the drain of the NMOS transistor MN2i is connected to the drain interconnection 24.
[0090] The gate of the PMOS transistor MP1i of each differential input stage 11.sub.i is connected to the input node 17.sub.i to which the selected input voltage V.sub.INi is supplied from the selector 3.sub.i and the gate of the PMOS transistor MP2i of each differential input stage 11.sub.i is connected to the output node 18 from which the analog output voltage V.sub.OUT is output. Similarly, the gate of the NMOS transistor MN1i of each differential input stage 11.sub.i is connected to the input node 17.sub.i and the gate of the NMOS transistor MN2i of each differential input stage 11.sub.i is connected to the output node 18.
[0091] The tail current source circuit 12 includes four variable current sources 26.sub.1 to 26.sub.4, the number of which is equal to that of the differential input stages. Each variable current source 26.sub.i supplies a tail current Icpi to the node N1i of the corresponding differential input stage 11.sub.i. The current levels of the tail currents Icp1 to Icp4 are controlled on the lower n bits of the input digital data D.sub.IN.
[0092] Similarly, the tail current source circuit 13 includes four variable current sources 27.sub.1 to 27.sub.4, the number of which is equal to that of the differential input stages. Each variable current source 27; draws a tail current Icni from the node N2i of the corresponding differential input stage 11.sub.i. The current levels of the tail currents Icn1 to Icn4 are controlled on the lower n bits of the input digital data D.sub.IN.
[0093] The semiconductor circuit 10 configured as illustrated in
[0094] It should be noted that, also when the differential amplifier circuit 5 includes three or more differential input stages, the tail current source circuit 12 may be configured so that each of the constant current sources 35 included in the tail current source circuit 12 can be used for generating the tail currents in any of the three or more differential input stages, as is the case with the configuration illustrated in
[0095]
[0096] The tail current source circuit 13 is configured similarly to the tail current source circuit 12; the tail current source circuit 13 includes a plurality of constant current sources 38, and a plurality of switches 39.sub.1 to 39.sub.4. Although four constant current sources 38 are illustrated in
[0097] The configuration illustrated in
[0098] It should be noted that, also in the circuit configuration illustrated in
[0099] Also when the differential amplifier circuit 5 includes three or more differential input stages, each of the differential input stages may include only one of a PMOS differential pair and an NMOS differential pair. For example, all of the differential input stages may include only a PMOS differential pair or include only an NMOS differential pair. The configuration in which the differential input stages each include only one of a PMOS differential pair and an NMOS differential pair effectively reduces the number of circuit elements included in each of the differential input stages.
[0100] It should be noted however that, for enlarging the operable voltage range of the differential amplifier circuit 5, it is preferable that at least one of the differential input stages include a PMOS differential pair and at least another one of the differential input stages include an NMOS differential pair, when each of the differential input stages includes only one of a PMOS differential pair and an NMOS differential pair. For maintaining the circuit symmetry and enlarging the operable voltage range, it is preferable that the number of the differential input stages is even and a half of the differential input stages include only a PMOS differential pair and the remaining half of the differential input stages include only an NMOS differential pair.
[0101]
[0102] The differential input stage 11.sub.1 includes PMOS transistors MP11 and MP21, and the differential input stage 11.sub.2 includes PMOS transistors MP12 and MP22. The PMOS transistors MP11 and MP21 of the differential input stage 11.sub.1 have sources commonly connected to the node N11 and the PMOS transistors MP12 and MP22 of the differential input stage 11.sub.2 have sources commonly connected to the node N12. The drains of the PMOS transistor MP11 of the differential input stage 11.sub.1 and the PMOS transistor MP12 of the differential input stage 11.sub.2 are connected to the drain interconnection 21 and the drains of the PMOS transistor MP21 of the differential input stage 11.sub.1 and the PMOS transistor MP22 of the differential input stage 11.sub.2 are connected to the drain interconnection 22.
[0103] The differential input stage 11.sub.3 includes NMOS transistors MN13 and MP23, and the differential input stage 11.sub.4 includes NMOS transistors MN14 and MP24. The NMOS transistors MN13 and MN23 of the differential input stage 11.sub.3 have sources commonly connected to the node N13 and the NMOS transistors MN14 and MN24 of the differential input stage 11.sub.4 have sources commonly connected to the node N14. The drains of the NMOS transistor MN13 of the differential input stage 11.sub.3 and the NMOS transistor MN14 of the differential input stage 11.sub.4 are connected to the drain interconnection 23 and the drains of the NMOS transistor MN23 of the differential input stage 11.sub.3 and the NMOS transistor MN24 of the differential input stage 11.sub.4 are connected to the drain interconnection 24.
[0104] The gate of the PMOS transistor MP11 of the differential input stage 11.sub.1 is connected to the input node 17.sub.1 to which the selected input voltage V.sub.IN1 is supplied from the selector 3.sub.1 and the gate of the PMOS transistor MP12 of the differential input stage 11.sub.2 is connected to the input node 17.sub.2 to which the selected input voltage V.sub.IN2 is supplied from the selector 3.sub.2. The gates of the PMOS transistor MP21 of the differential input stage 11.sub.1 and the PMOS transistor MP22 of the differential input stage 11.sub.2 are connected to the output node 18 from which the analog output voltage V.sub.OUT is output.
[0105] Similarly, the gate of the NMOS transistor MN13 of the differential input stage 11.sub.3 is connected to the input node 17.sub.3 to which the selected input voltage V.sub.IN3 is supplied from the selector 3.sub.3 and the gate of the NMOS transistor MN14 of the differential input stage 11.sub.4 is connected to the input node 17.sub.4 to which the selected input voltage V.sub.IN4 is supplied from the selector 3.sub.4. The gates of the NMOS transistor MN23 of the differential input stage 11.sub.3 and the NMOS transistor MN24 of the differential input stage 11.sub.4 are connected to the output node 18.
[0106] The tail current source circuit 12 includes a variable current source 26.sub.1 which supplies a tail current Icp1 to the node N11 of the differential input stage 11.sub.1 and a variable current source 26.sub.2 which supplies a tail current Icp2 to the node N12 of the differential input stage 11.sub.2. The current levels of the tail currents Icp1 and Icp2 are controlled on the lower n bits of the input digital data D.sub.IN.
[0107] The tail current source circuit 13 includes a variable current source 27.sub.3 which supplies a tail current Icn3 to the node N23 of the differential input stage 11.sub.3 and a variable current source 27.sub.4 which supplies a tail current Icn4 to the node N24 of the differential input stage 11.sub.4. The current levels of the tail currents Icn3 and Icn4 are controlled on the lower n bits of the input digital data D.sub.IN.
[0108] The configuration of the differential amplifier circuit 5 illustrated in
[0109] Next, a description is given of preferred applications of the semiconductor circuit 10 of the present embodiment described above. The semiconductor circuit 10 of the present embodiment, which has the function of digital-analog conversion and impedance conversion, is preferably used in a display driver which drives the source lines of a display panel (e.g., a liquid crystal display panel and an OLED (organic light emitting diode) display panel) in a panel display device.
[0110]
[0111] The display driver 52 drives the source lines of the display panel 51 in response to image data and control data received from a host 53.
[0112]
[0113] The interface 61 communicates with the host 53 to exchange various data required for operating the display driver 52. More specifically, the interface 61 receives image data from the host 53 and forwards the received image data to the display memory 62. Additionally, the interface 61 receives control data from the host 53 and supplies control commands and control parameters to the control logic circuit 65 in response to the contents of the received control data.
[0114] The display memory 62 temporarily stores the image data received from the interface 61 and forwards the image data to the image IP core 63. The image IP core 63 performs desired image processing on the image data received from the display memory 62 and outputs image data obtained through the image processing to the drive circuitry 64.
[0115] The drive circuitry 64 is connected to the image IP core 63 via a data bus 66 and drives the source lines of the display panel 51 connected to source outputs S1 to Sx in response to the image data received from the image IP core 63, where x is an integer of two or more. The configuration of the drive circuitry 64 will be described later in detail.
[0116] The control logic circuit 65 controls the respective circuits of the display driver 52 in response to the control commands and control parameters received from the interface 61. The control logic circuit 65 also operates as a timing controller which generates timing control signals (including a vertical sync signal and a horizontal sync signal) used for timing control of the respective circuits of the display driver 52.
[0117]
[0118] The data latches 67.sub.1 to 67.sub.x receive image data D1 to Dx corresponding to the source outputs S1 to Sx from the image IP core 63 via the data bus 66. The image data D1 to Dx are (m+n)-bit data. The data latches 67.sub.1 to 67.sub.x supplies the image data D1 to Dx to the semiconductor circuits 10.sub.1 to 10.sub.x.
[0119] The semiconductor circuits 10.sub.1 to 10.sub.x perform digital-analog conversion on the image data D1 to Dx received from the data latches 67.sub.1 to 67.sub.x, respectively, to output the analog output voltages V.sub.OUT1 to V.sub.OUTx from the outputs of the differential amplifier circuits 5. The reference voltages V.sub.REF1 to V.sub.REFq (where q=2.sup.m+1) supplied to the semiconductor circuits 10.sub.1 to 10.sub.x from the reference voltage bus 6 are used for this digital analog conversion. The analog output voltages V.sub.OUT1 to V.sub.OUTx output from the semiconductor circuits 10.sub.1 to 10.sub.x are supplied to the source outputs S1 to Sx and used as the source voltages to drive the source lines.
[0120] Although not illustrated in
[0121] In the configuration illustrated in
[0122] The resistor string 71 is connected between a positive-side line 79 and a negative-side line 80 and used to generate voltages V.sub.1 to V.sub.r at respective positions thereof through voltage dividing. In the present embodiment, an analog power supply voltage VSP is supplied to the positive-side line 79 and a negative-side line 80 is connected to the circuit ground.
[0123] The tournament circuit 72 receives the voltages V.sub.1 to V.sub.r from the resistor string 71 and supplies selected ones of the voltages V.sub.1 to V.sub.r to the preamplifiers 73.sub.1 to 73.sub.p, respectively. The voltages supplied to the preamplifiers 73.sub.1 to 73.sub.p are controlled in response to reference voltage control data D.sub.REF.sub._.sub.CTRL1 to D.sub.REF.sub._.sub.CTRLp, respectively. The reference voltage control data D.sub.REF.sub._.sub.CTRL1 to D.sub.REF.sub._.sub.CTRLp are each (s+t)-bit digital data used to control the voltage levels of the reference voltages V.sub.REF1 to V.sub.REFq. The reference voltage control data D.sub.REF.sub._.sub.CTRL1 to D.sub.REF.sub._.sub.CTRLp are associated with the preamplifiers 73.sub.1 to 73.sub.p, respectively, and the voltages supplied from the tournament circuit 72 to the preamplifiers 73.sub.1 to 73.sub.p are selected in response to the reference voltage control data D.sub.REF.sub._.sub.CTRL1 to D.sub.REF.sub._.sub.CTRLp.
[0124] The preamplifiers 73.sub.1 to 73.sub.p respectively generates the standard voltages V.sub.STD1 to V.sub.STDp from the voltages received from the tournament circuit 72 and supply the standard voltages V.sub.STD1 to V.sub.STDp to the resistor string 74. The standard voltages V.sub.STD1 to V.sub.STDp are generated so as to satisfy the following requirement (1):
V.sub.STD1<V.sub.STD2< . . . <V.sub.STD(p-1)<V.sub.STDp. (1)
[0125] The resistor string 74 receives the standard voltages V.sub.STD1 to V.sub.STDp from the preamplifiers 73.sub.1 to 73.sub.p and generates the reference voltages V.sub.REF1 to V.sub.REFq through voltage dividing. In detail, the standard voltage V.sub.STD1 is supplied to one end of the resistor string 74 and the standard voltage V.sub.STDp is supplied to the other end of the resistor string 74. The reference voltages VSTD.sub.2 to V.sub.STD(p-1) are supplied to intermedium positions of the resistor string 74. The reference voltages V.sub.REF1 to V.sub.REFq are generated at predefined positions of the resistor string 74 and the reference voltages V.sub.REF1 to V.sub.REFq thus generated are supplied to the DA converters 1 and 2 of each of the semiconductor circuits 10.sub.1 to 10.sub.x via the reference voltage bus 6. The display driver 52 of the present embodiment, which is configured as illustrated in
[0126] The semiconductor circuit 10 of this embodiment may be used as the tournament circuit 72 and preamplifiers 73.sub.1 to 73.sub.p of the gamma circuit 70.
[0127] The tournament circuit 72 includes DA converters 75, 76 and selectors 77 and 78. The preamplifier 73.sub.i is connected to the outputs of the selectors 77 and 78 and configured similarly to the differential amplifier circuit 5 illustrated in
[0128] More specifically, the DA converters 75 and 76 are each configured to select any one of the voltages V.sub.1 to V.sub.r received from the resistor string 71 in response to the upper s bits of the reference voltage control data D.sub.REF.sub._.sub.CTRLi and output the selected voltage, where r, which is the number of the voltages V.sub.1 to V.sub.r supplied to the DA converters 75 and 76, is 2.sup.s+1. In the following, the voltage selected and output by the DA converter 75 is referred to as the selected voltage V.sub.STDH and the voltage selected and output by the DA converter 76 is referred to as the selected voltage V.sub.STDL. It should be noted that the selected voltages V.sub.STDH and V.sub.STDH selected by the DA converters 75 and 76 are different from each other and the selected voltage V.sub.STDH is higher than the selected voltage V.sub.STDL.
[0129] The selectors 77 and 78 each select one of the selected voltages V.sub.STDH and V.sub.STDH in response to the lower t bits of the reference voltage control data D.sub.REF.sub._.sub.CTRLi and output the selected voltage. The voltage selected and output by the selector 77 is used as the selected input voltage V.sub.IN1 supplied to the preamplifier 73.sub.i and the voltage selected and output by the selector 78 is used as the selected input voltage V.sub.IN2 supplied to the preamplifier 73.sub.i.
[0130] The preamplifier 73.sub.i is configured to receive the selected input voltages V.sub.IN1 and V.sub.IN2 from the selectors 77 and 78 and generate the standard voltage V.sub.STDi from the selected input voltages V.sub.IN1 and V.sub.IN2. The preamplifier 73.sub.i is configured similarly to the above-described differential amplifier circuit 5 and the voltage level of the standard voltage V.sub.STDi is adjusted in response to the value of the lower t bits of the reference voltage control data D.sub.REF.sub._.sub.CTRLi.
[0131] The configurations of the tournament circuit 72 and the preamplifier 73.sub.i illustrated in
[0132] Although various embodiments of the present disclosure have been specifically described in the above, a person skilled in the art would appreciate that the present disclosure may be implemented with various modifications.