LOW PASSIVE INTERMODULATION COAXIAL CONNECTOR TEST INTERFACE

Abstract

A coaxial RF test connector comprises an inner conductor and an outer conductor arranged coaxially with respect to a center axis. The outer conductor includes a groove dimensioned to hold a circularly shaped contact spring. The contact spring includes a base portion and a plurality of arc-shaped contact fingers extending from the base with gaps between the individual contact fingers. The base has a radius larger than that at which the contact fingers are bent. The contact fingers have first contact section for contacting the outer conductor of a compatible coaxial connector in a direction radial to the center axis, and a second contact section for capacitively coupling to a sidewall of the groove.

Claims

1. A coaxial RF test connector having a center axis and an opening configured to receive a compatible coaxial connector in an inward direction, the coaxial RF test connector comprising: an inner conductor and an outer conductor, both arranged coaxially to a center axis of said RF test connector, a circularly shaped contact spring held within a groove of the outer conductor, wherein the contact spring includes a base and a plurality of arc-shaped contact fingers extending from the base with gaps between individual contact fingers, at least one of the contact fingers having a first contact section configured to contact the outer conductor of a compatible coaxial connector in a direction radial to the center axis, a second contact section between the base and the first contact section, the second contact section being configured to contact a sidewall of the groove, and an insulation disc of a dielectric material between the second contact section and the sidewall.

2. The coaxial RF test connector according to claim 1, wherein the contact spring is connected to the outer conductor in a radial direction via at least one of soldering or welding.

3. The coaxial RF test connector according to claim 1, wherein the second contact section forms a capacitive contact with the sidewall. The coaxial RF test connector according to claim 1, further comprising an insulation disc of a dielectric material between the second contact section and the sidewall.

4. The coaxial RF test connector according to claim 1, wherein the second contact section is in galvanic contact with the sidewall.

5. The coaxial RF test connector according to claim 1, wherein the sidewall is oriented in an outward direction.

6. The coaxial RF test connector according to claim 1, wherein the base is radially enclosing the contact fingers.

7. The coaxial RF test connector according to claim 1, wherein the outer conductor comprises a spring holder configured to hold the contact spring.

8. The coaxial RF test connector according to claim 7, wherein the spring holder comprises a first thread counteracting with a second thread at the outer conductor of the test connector, said first thread configured to screw the spring holder onto the outer conductor.

9. The coaxial RF test connector according to claim 1, wherein the contact spring comprises at least one of copper-beryllium, brass, and steel.

10. The coaxial RF test assembly comprising a coaxial RF test connector according to claim 1, further comprising a connecting line held by a mounting suspension, wherein the connecting line is disposed to connect the coaxial RF test connector and the internal connector.

Description

BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In the following portion of the disclosure, the invention will be described without limitation of the general inventive concept, with the use of examples of embodiments and with reference to the following drawings.

[0025] FIG. 1 shows an embodiment of a test connector assembly.

[0026] FIG. 2 shows an embodiment of a test connector assembly with attached compatible coaxial connector.

[0027] FIG. 3 shows a portion of the test connector in detail.

[0028] FIG. 4 is a sectional view of a test connector with a mated compatible coaxial connector.

[0029] FIG. 5 shows a side view of a section of a contact spring.

[0030] FIG. 6 is a top view of the contact spring.

[0031] FIG. 7 shows a modified contact spring.

[0032] FIG. 8 shows the contact spring in a mated state of the connectors in detail.

[0033] FIG. 9 is a simplified version of FIG. 8.

[0034] FIG. 10 shows details of the contact area.

[0035] FIG. 11 shows details of a modified contact area.

[0036] Various modifications and alternative forms can be introduced to the examples of embodiments discussed below without limiting the scope of the invention to the particular discussed example. To the contrary, the scope of the intention is intended to cover all modifications, equivalents and alternatives falling within the spirit and scope defined by the appended claims.

DETAILED DESCRIPTION

[0037] In FIG. 1, a preferred embodiment of a test connector assembly is shown. A test connector 30 is connected to an internal connector 20 by means of a connecting line component 25, which has a center axis 29, and which is held by a mounting suspension 10. The mounting suspension 10 is configured to optionally allow tilting of the connecting line component 25 and further allow a displacement thereof along the center axis 29. The test connector assembly is further structured to allow the application of force to the test connector 30 to simplify establishing a contact between a compatible coaxial connector 100, as will be shown in the next figure. Preferably, the test connector 30 comprises an inner conductor 40 and an outer conductor 50. It is further preferred, if the test connector 30 comprises a connector guide 60 configured to guide a compatible coaxial connector 100 when mating the connectors.

[0038] In FIG. 2, a preferred embodiment of a test connector assembly is shown with a compatible coaxial connector 100 attached in an inward direction (from the bottom of the page to the top of the page or the left side of the drawing to the right side). The compatible coaxial connector 100 may either be connected to a cable or to a housing of a device to be tested. The compatible coaxial connector 100 preferably comprises an inner conductor 110 and an outer conductor 120. It is further preferred, if the compatible coaxial connector 100 has an outer housing 130, which further preferably has an outer thread. The outer housing preferably encloses the outer conductor.

[0039] In FIG. 3, a detail of the test connector 30 is shown in a sectional view. Aligned with the center axis 29, an inner conductor 40 is arranged. In this embodiment, the inner conductor 40 is of a male type, but it may also be of a female type. The specific type of the inner conductor is independent of the contacting of the outer conductor, as will be shown later. The inner conductor 40 may be held by a holding disk 41 which may be of a plastic or ceramic material. It centers the inner conductor 40 within the outer conductor 50. Furthermore, it is preferred, if the center conductor 40 has a slot 42 or a hex drive or any similar means for simplifying assembly of the center conductor to the test connector. The outer conductor 50 comprises a contact spring 55 configured to radially contact the outer conductor of a compatible coaxial connector 100. The contact spring as shown in this preferred embodiment comprises a base 222 holding a plurality of contact fingers 56 with gaps 57 in-between the individual contact fingers. The contact fingers may have additional contact elements or contact points at their outer sides to improve contacting of the compatible coaxial connector 100. Preferably, there is a spring holder 51 which forms a groove, preferably together with the inner side 32, to hold the contact spring 55 at its position at the outer conductor 50. The contact spring 55 is preferably soldered and/or welded to the spring holder 51. The spring holder 51 may either be pressed, welded, soldered or attached by means of the thread 33 to the base 31 of the center conductor.

[0040] In an alternate embodiment, the spring holder 51 may be one part with the outer conductor base 31. In this case, it forms a groove 45 configured to hold the contact spring 55. It is further preferred, if the outer conductor 50 has at least one mechanical contacting surface. Most preferably, there is at least one axially oriented mechanical contact section 53. There may be a further mechanical contact section 54 which is oriented radially.

[0041] In FIG. 4, a sectional view of a test connector 30 with a mated compatible coaxial connector 100 is shown. The center conductor 110 of the compatible coaxial connector 100 preferably has a center conductor contact element 111 which may be a cylindrical sleeve having slots to provide spring-elastic properties at its end and configured to contact the center conductor 40 at a contact section 43 by its inner contact section 113. The center conductor 110 may enclose an inner space 112 which may be hollow.

[0042] The compatible coaxial connector's outer conductor 120 preferably has a hollow end section 121 which is contacted in a radial direction by the contact spring 55 in a contact area 122.

[0043] Mechanical alignment of the compatible coaxial connector 100 to the test connector 30 is done by mechanical contact sections at the outer conductor of the test connector and of the compatible coaxial connector 100. For radial alignment, an outer section 123 of the outer conductor of the compatible coaxial connector 100 may contact a radial mechanical contact section 54 of the outer conductor of the test connector. Axial alignment may be done by an axial contact section 133 of the compatible coaxial connector 100 contacting the axially mechanical contact section 53 of the outer conductor of the test connector. Preferably, the axial contact section 133 is part of the housing 130. There may be a chamfer 134 at the edge of the axial contact section 133. Such independent radial and axial alignments ensure proper and reproducible alignment of the connectors. To simplify mating of the connectors, the outer side of the outer conductor 50 may have a chamfer 52. To provide an early alignment during mating of the connectors, a connector guide 60 at the test connector 30 preferably has a cone 61 with an interface section 65 to interface and/or guide the housing 130 and/or an outer thread 131 at the housing.

[0044] In FIG. 5, a side view of a section of a preferred embodiment of a contact spring 55 is shown. The contact spring has a base 222 and a plurality of contact fingers 56, 221 extending therefrom. Preferably, the contact fingers are arc-shaped and provide a first contact section 221 close to the end of the arc and a second contact section 223 between the base and the first contact section. The arcuate shape of the contact fingers allows for smooth insertion and removal of a compatible coaxial connector 100 into and out of the test connector, as shown in FIG. 4. Each of a plurality of the contact fingers acts as an individual spring element and provides a force to the outer conductor of the compatible coaxial connector 100, thus providing an electrical contact. Preferably, the arc has an opening averted to the compatible coaxial connector 100.

[0045] In FIG. 6, a top view of the contact spring 55 is shown in a straight, extended state. The base 222 holds a plurality of contact fingers 56 extending therefrom with gaps 57 in between. The base preferably has no gaps or slits. Preferably, the contact spring comprises at least one of the following materials: copper-beryllium, brass, steel.

[0046] In FIG. 7, a modified contact spring 55 is shown in a straight, extended state. Here, the base 222 is sectioned, which increases flexibility and bendability of the spring.

[0047] In FIG. 8, the contact spring 55 is shown in detail in a mated state of the connectors. As previously mentioned, the contact spring 55 is enclosed between the spring holder 51 and the base 31 of the outer conductor, forming a groove for the contact spring. The contact spring 55 is soldered and/or welded with its base 222 to the spring holder 51. Here, solder 59 is shown radially outside of the base 222 of the contact spring 55. For best intermodulation characteristics, there is only one metallurgical connection (the solder connection) between the contact spring 55 and the spring holder 51. To prevent any galvanic contact and to provide a capacitive contact in an axial direction, an insulating disk 230 may be provided between the second contact section 223 of the contact spring and the sidewall 58 of the spring holder 51. If a galvanic contact is desired, this disc may be omitted. The first contact sections 221 are in contact with the outer conductor 120 of the compatible coaxial connector 100 and generate a highly conductive electrical path thereto. Due to the design of the contact spring 55, high contact forces can be generated towards the outer conductor base 31 of the test connector and towards the outer conductor 120 of the compatible coaxial connector 100, resulting in low passive intermodulation. Preferably, the base 222 of the contact spring 55 is at a larger radius than the contact fingers 221, 223. Therefore, the contact fingers are oriented inwards from the base.

[0048] FIG. 9 is a simplified version of FIG. 7, where some edge lines have been removed to clarify the individual components.

[0049] FIG. 10 is based on FIG. 9 and shows a further enlarged detail of the contact area. Here, the area 240 forming a current loop by the current flowing from the outer conductor 120 of the compatible connector is marked. It forms a parallel resonance circuit with the capacitance between the surfaces 54 and 123 together with the inductance of the current loop, limiting the bandwidth of the connectors. Due to the capacitive contact by the second contact section 223 to the sidewall 58, the area of this loop can be decreased significantly, which further increases bandwidth of the connector.

[0050] FIG. 11 shows an embodiment without the capacitive contact by the second contact section 223 to the sidewall 58 resulting in large current loop area 241. A connector with such contacts has significantly less bandwidth than a connector according to FIG. 10.

[0051] It will be appreciated to those skilled in the art having the benefit of this disclosure that this invention is believed to provide RF coaxial test connectors. Further modifications and alternative embodiments of various aspects of the invention will be apparent to those skilled in the art in view of this description. Accordingly, this description is to be construed as illustrative only and is for the purpose of teaching those skilled in the art the general manner of carrying out the invention. It is to be understood that the forms of the invention shown and described herein are to be taken as the presently preferred embodiments. Elements and materials may be substituted for those illustrated and described herein, parts and processes may be reversed, and certain features of the invention may be utilized independently, all as would be apparent to one skilled in the art after having the benefit of this description of the invention. Changes may be made in the elements described herein without departing from the spirit and scope of the invention as described in the following claims.

LIST OF REFERENCE NUMERALS

[0052] 10 mounting suspension [0053] 20 internal connector [0054] 25 connecting line [0055] 29 center axis [0056] 30 test connector [0057] 31 outer conductor base [0058] 32 inner side [0059] 33 thread [0060] 40 inner conductor [0061] 41 holding disk [0062] 42 slot [0063] 43 conductor contact section [0064] 45 groove [0065] 50 outer conductor [0066] 51 spring holder [0067] 52 chamfer [0068] 53 axial mechanical contact section [0069] 54 radial mechanical contact section [0070] 55 contact spring [0071] 56 contact fingers [0072] 57 gap [0073] 58 sidewall [0074] 59 solder [0075] 60 connector guide [0076] 61 cone [0077] 65 interface section [0078] 100 compatible coaxial connector [0079] 110 inner conductor [0080] 111 center conductor contact element [0081] 112 inner space [0082] 113 contact section [0083] 120 outer conductor of a compatible connector [0084] 121 cylindrical contact section [0085] 122 contact area [0086] 123 outer section [0087] 130 housing [0088] 131 outer thread [0089] 133 axial contact section [0090] 134 chamfer [0091] 221 first contact section [0092] 222 base [0093] 223 second contact section [0094] 230 insulating disk [0095] 240 small area of current loop [0096] 241 large area of current loop