Processing Apparatus

20170322186 · 2017-11-09

    Inventors

    Cpc classification

    International classification

    Abstract

    A processing apparatus includes a processing quality prediction unit capable of outputting workpiece surface processing signal, a storage unit capable of storing workpiece surface processing signal, and a workpiece surface information management unit capable of interpreting workpiece surface processing signal. The workpiece surface information management unit can convert the surface processing signal into data of workpiece surface quality. The workpiece surface information management unit can be utilized to respectively interpret the surface processing signals provided by the processing quality prediction unit and to convert them into data of the roughness degree of the workpiece surface texture, so as to clearly provide information regarding the quality of the workpiece surface and completely utilize the signals detected during the processing for increasing the value added of the processing apparatus and enhancing the efficiency of use of the processing apparatus.

    Claims

    1. A processing apparatus, comprising: a processing quality prediction unit outputting at least a workpiece surface processing signal; a storage unit storing at least a workpiece surface processing signal; and a workpiece surface information management unit interpreting said workpiece surface processing signal, wherein said workpiece surface information management unit converts said surface processing signal into data of workpiece surface quality.

    2. The processing apparatus, as recited in claim 1, wherein said processing quality prediction unit outputs signals selected from the group consisting of vibration, current and image, wherein said workpiece surface information management unit interprets said signal with artificial intelligence program.

    Description

    BRIEF DESCRIPTION OF THE DRAWINGS

    [0008] FIG. 1 is a block diagram illustrating a processing apparatus according to the present invention.

    DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

    [0009] The following description is disclosed to enable any person skilled in the art to make and use the present invention. Preferred embodiments are provided in the following description only as examples and modifications will be apparent to those skilled in the art. The general principles defined in the following description would be applied to other embodiments, alternatives, modifications, equivalents, and applications without departing from the spirit and scope of the present invention.

    [0010] Referring to FIG. 1, the processing apparatus according to a preferred embodiment of the present invention is for processing a workpiece and organizing the workpiece surface processing information output during the processing, so as for the processor's or buyer's reference. The processing apparatus 1 comprises a processing quality prediction unit 2, a processing unit 3, a storage unit 4, and a workpiece surface information management unit 5. The processing quality prediction unit 2 is connected with both the processing unit 3 and the storage unit 4 electronically. The workpiece surface information management unit 5 is connected with the storage unit 4 electronically.

    [0011] The processing quality prediction unit 2 utilizes the technology disclosed in Taiwan Patent Number TWI481978B, entitled “Method for predicting machining quality of machine tool.” It mainly applies Computer-Aided dDsign (CAD) to produce the outline, dimensions, and tolerance of the workpiece and uses Computer Aided Manufacturing (CAM) to generate processing path on the above dimensions and tolerance as well as the characteristics of the processing unit 3. Also, at least a product accuracy category has to be assigned. The product accuracy category comprises roughness and/or dimension deviation, and etc. The dimension deviation comprises straightness, angularity, perpendicularity, parallelism, and/or roundness, etc. The product accuracy category is associated with the processing path so as to provide a plurality of relevancies between the product accuracy category and the processing path. Then, the processing unit 3 will be utilized to process multiple workpieces according to the processing path to produce workpiece samples and to collect multiple sets of sample detection information of the multiple workpiece samples that relate to the processing path during the processing period. After the operation of sampling, it utilizes algorithm to control the noise of the detection information and convert the detection information of workpiece sample into sample characteristic data in correspondence with characteristic format. After the processing of workpiece sample is finished, the metrology machine is utilized to measure the product accuracy category(ies) of the workpiece sample so as to obtain a set of quality sample data (value of accuracy). Then the quality sample data and the characteristic data of the workpiece sample are utilized to predict the interrelation between the algorithm and processing path and the product accuracy category, in order to build a prediction model for the product accuracy category. That is to say, the characteristic data, quality sample data, and accuracy of workpiece, which are obtained when the processing unit 3 processed the workpiece sample, are utilized to form a prediction model.

    [0012] In short, the processing quality prediction unit 2 generates a workpiece processing path for the target workpiece according to the predetermined dimensions, tolerance, and parameters and virtually predicts the processing quality of the workpiece and outputs accurate data of workpiece surface quality. The data of workpiece surface quality may comprise electrical signal, workpiece processing vibration signal, and workpiece surface image signal. In the case of electrical signal, if the electrical signal turns stronger instantly, it indicates poor smoothness of the processing, which could be rendered by factors like blunt tool, improper depth of cut, etc. that can all increase roughness of the workpiece surface. On the contrary, if the electrical signal is within a certain value range, it means that the processing is smooth and the processing quality of the workpiece surface meets the requirements. Similarly, both strength of the vibration signal and workpiece surface image signal can also be converted into data of workpiece surface processing quality.

    [0013] The storage unit 4 is for storing all kinds of data of workpiece surface quality output by the processing quality prediction unit 2. In the present embodiment, the storage unit 4 can be a cloud storage device to establish big data for the processing signal.

    [0014] The workpiece surface information management unit 5 is to interpret and determine whether each signal in the storage unit 4 meets the processing surface quality requirements and to respectively convert the electrical signal, workpiece processing vibration signal, or workpiece surface image signal output by the processing quality prediction unit 2 into data of workpiece surface processing quality. The data include the information regarding roughness of the workpiece surface processing texture, which indicates the surface condition of the processed workpiece. In the present embodiment, the workpiece surface information management unit 5 utilizes programmed artificial intelligence device to interpret each signal from the storage unit 4, so as to rapidly and precisely reveal the data of workpiece surface processing quality for the designer or buyer to refer to.

    [0015] The processing apparatus according to the present invention utilizes the workpiece surface information management unit 5 to respectively interpret the surface processing signals provided by the processing quality prediction unit 2 and to convert them into data of the roughness degree of the workpiece surface texture, so as to clearly provide information regarding the quality of the workpiece surface and completely utilize the signals detected during the processing for increasing the value added of the processing apparatus 1 and enhancing the efficiency of use of the processing apparatus 1.

    [0016] One skilled in the art will understand that the embodiment of the present invention as shown in the drawings and described above is exemplary only and not intended to be limiting.

    [0017] It will thus be seen that the objects of the present invention have been fully and effectively accomplished. The embodiments have been shown and described for the purposes of illustrating the functional and structural principles of the present invention and is subject to change without departure from such principles. Therefore, this invention includes all modifications encompassed within the spirit and scope of the following claims.