Metal-foil-assisted fabrication of thin-silicon solar cell
09812592 · 2017-11-07
Assignee
Inventors
Cpc classification
H01L31/0682
ELECTRICITY
H01L31/022441
ELECTRICITY
Y02E10/547
GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
H01L31/02002
ELECTRICITY
International classification
H01L31/18
ELECTRICITY
H01L31/068
ELECTRICITY
Abstract
One embodiment relates to a method of fabricating a solar cell. A silicon lamina is cleaved from the silicon substrate. The backside of the silicon lamina includes the P-type and N-type doped regions. A metal foil is attached to the backside of the silicon lamina. The metal foil may be used advantageously as a built-in carrier for handling the silicon lamina during processing of a frontside of the silicon lamina. Another embodiment relates to a solar cell that includes a silicon lamina having P-type and N-type doped regions on the backside. A metal foil is adhered to the backside of the lamina, and there are contacts formed between the metal foil and the doped regions. Other embodiments, aspects and features are also disclosed.
Claims
1. A method of fabricating a solar cell, the method comprising: cleaving a silicon lamina from a silicon substrate, wherein a backside of the silicon lamina includes P-type and N-type doped regions; and positioning a metal foil between a secondary substrate and the backside of the silicon lamina; and forming contacts between the metal foil and the doped regions by transmitting a pulsed laser through the secondary substrate.
2. The method of claim 1, wherein an extended area of the metal foil extends beyond a perimeter of the silicon lamina, further comprising: using the metal foil as an integrated carrier for handling the silicon lamina.
3. The method of claim 1, further comprising: forming a first set of contacts between the metal foil and the P-type doped regions; and forming a second set of contacts between the metal foil and the N-type doped regions.
4. The method of claim 1, further comprising: forming a finger separation pattern in the metal foil.
5. The method of claim 4, wherein the finger separation pattern is pre-formed in the metal foil prior to attachment to the backside.
6. The method of claim 5, further comprising: attaching the metal foil to a secondary substrate prior to attachment to the backside, wherein the secondary substrate is transparent to a laser light.
7. The method of claim 1, wherein the metal foil is attached to the backside using an adhesive layer.
8. The method of claim 1, wherein the metal foil is attached to the backside at an array of contact spots between the metal foil and the backside of the silicon substrate, and wherein the contact spots are formed by spot melting of the metal foil.
9. The method of claim 1, wherein the metal foil comprises aluminum.
10. The method of claim 1, further comprising: texturing and passivating a frontside of the silicon lamina while using the metal foil as the carrier for handling the silicon lamina; and encapsulating the frontside of the silicon lamina.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
(1) A more complete understanding of the subject matter may be derived by referring to the detailed description and claims when considered in conjunction with the following figures, wherein like reference numbers refer to similar elements throughout the figures. The figures are not drawn to scale.
(2)
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DETAILED DESCRIPTION
(8) In the present disclosure, numerous specific details are provided, such as examples of apparatus, structures, materials, and methods, to provide a thorough understanding of embodiments of the invention. Persons of ordinary skill in the art will recognize, however, that the invention can be practiced without one or more of the specific details. In other instances, well-known details are not shown or described to avoid obscuring aspects of the invention.
(9) The present disclosure provides techniques for forming thin-silicon solar cells using a metal foil. Advantageously, the metal foil may be used as a built-in carrier for handling the otherwise fragile silicon lamina during processing of a frontside of the lamina. Subsequently, the metal foil may be re-used to form metal fingers and contacts to the P-type and N-type emitters on the backside of the lamina.
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(11) A thin dielectric layer 108 may be formed over the P+ and N+ regions on the backside for electrical insulation, passivation, and/or other purposes. The dielectric layer 108 may comprise, for example, silicon oxide and/or silicon nitride. Alternatively, the emitter surface may be passivated by means other than forming the dielectric layer 108, such as by chemical passivation, for example.
(12) The solar cell structure of
(13) As depicted in
(14) In one embodiment, an adhesive layer 304 may be used to adhere the metal foil 306 to the backside of the silicon lamina 302. The adhesive layer 304 may be a thin layer of epoxy, silicone, ethelyne vinyl acetate (EVA) or other encapsulant material which is applied to the backside of the substrate. In one implementation, the adhesive layer may be a coating pre-applied to the metal foil prior to the adhesion.
(15) In an alternate embodiment, the metal foil 306 may be adhered to the backside of the substrate using an array of contact spots between the metal foil 306 and the backside of the substrate. The contact spots may be formed by spot melting of the metal foil using a pulsed laser, for example. In this embodiment, the adhesion layer 304 is not needed. Air gaps beneath the foil between the contact spots may be removed by flattening the foil.
(16) As depicted in
(17) Thereafter, a glass encapsulation process may be performed on the frontside of the silicon lamina 302.
(18) As shown in
(19) In addition, a finger separation 608 pattern may be formed on the foil area to electrically separate the first set of metal contacts 604 from the second set of metal contacts 606. The finger separation 608 may be configured so that the fingers of the foil that lead to the contacts are interdigitated.
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(21) Per block 704, a thin silicon lamina may be cleaved from the silicon wafer. For example, the silicon lamina may be of a thickness between 10 microns to 100 microns. In one implementation, the cleaving may be performed using ion implantation and exfoliation as described above in relation to
(22) In block 706, metal foil may be adhered to the silicon lamina, as described above in relation to
(23) Per block 708, the metal foil may be used as an integrated carrier for handling the silicon lamina so that the frontside surface of the silicon lamina may be processed. The frontside surface processing may include texturing and passivation, as described above in relation to
(24) Per block 710, contacts may be formed from the metal foil to the emitter regions. As described above in relation to
(25) In an alternate embodiment, instead of adhering a continuous metal foil layer to the backside and subsequently creating the finger separation pattern while the foil is attached to the backside, the finger separation pattern may be pre-formed in the metal foil before the metal foil is applied to the backside of the silicon lamina.
(26) As shown in
(27)
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(30) The sacrificial layer may be composed of porous silicon, such as formed in a HF bath with bias. Alternatively, the sacrificial layer may be silicon with, for example, germanium doping and/or a carbon doping, either of which can be formed by epitaxial deposition or a chemical vapor deposition (CVD) process. The sacrificial layer may be thin, on the order of approximately 700 micrometers, although it may be slightly or significantly larger or smaller, as desired for a particular embodiment to perform the functions described herein. For example, in certain embodiments, the sacrificial layer may be as thin as 10 micrometers. Smaller thicknesses may also be used in certain instances.
(31) An epitaxial layer of silicon may then be grown over the sacrificial layer per block 1104. The emitter regions may be formed in the epitaxial layer per block 1106, and a dielectric layer may be formed over the emitter regions per block 1108.
(32) A metal foil may then be adhered over the emitter regions per block 1110. Subsequently, epitaxial lift-off per block 1112 may be performed by selective wet etching or otherwise removing the sacrificial layer. After lift-off, the epitaxial layer becomes the silicon lamina of the solar cell. A cross-sectional view of the structure at this point in the process corresponds to the view shown in
(33) Subsequently, the front surface may be processed per block 708. The contacts between the metal foil and the emitter regions may then be formed per block 710. In other words, after the epitaxial lift-off per block 1110, the processing may proceed as described above in relation to
(34) Techniques for forming thin-silicon solar cells using a metal foil have been disclosed. Advantageously, the metal foil may be used as a built-in carrier for handling the otherwise fragile silicon lamina during processing of a frontside of the lamina. Subsequently, the metal foil may be re-used to form the P-type and N-type emitter contacts and metal fingers on the backside of the lamina.
(35) While specific embodiments of the present invention have been provided, it is to be understood that these embodiments are for illustration purposes and not limiting. Many additional embodiments will be apparent to persons of ordinary skill in the art reading this disclosure.