RETRO-REFLECTION MEASURING DEVICE

Abstract

This invention relates to an apparatus for retro-reflection measurement. By using the one or more sampling devices each consists of a holed mirror and an circular aperture, and corresponding one or more measuring devices, it realize the retro-reflection measurement in one or more observation angles at one time. By flexibly selecting the size of the circular apertures and holed mirrors, it can accurately adjust the measuring annular bands and corresponding observation angles. Without any other intermediate devices, it can realize complete annular band of light measurement which ensures the measurement accuracy. At the same time, filters and monitor device can be set flexibly to realize various measurement functions. It has the advantages of speed measurement, high accuracy, small volume, wide application, comprehensive functions, and can be widely applied in laboratory, industrial production line and field measurement etc.

Claims

1. An apparatus for retro-reflection measurement, comprising: a light source, one or more sets of sampling devices for annular measurement, and one or more measurement devices corresponding to the sampling devices; one set of sampling device consists of a holed mirror and an circular aperture; the illumination light path is the light from the said light source goes to the test sample in a certain entrance angle, and the observation light path is the retro-reflect light from the test sample passes through the holed mirror and the circular aperture to form a annular band which meets the observation angle condition and is then received by the corresponding measurement device.

2. The apparatus for retro-reflection measurement according to claim 1, wherein the diameter of the open hole in the holed mirror is less than the diameter of the circular aperture, and the combination of the holed mirror and the circular aperture shape an annular band of light that the holed mirror reflects the light outer the inner diameter while the circular aperture cuts the light outer the external diameter of the annular band.

3. The apparatus for retro-reflection measurement according to claim 1, wherein the center of the holed mirror and the center of the circular aperture located in the optical axis.

4. The apparatus for retro-reflection measurement according to claim 1, there are two or more sampling devices; along the observation light path, the holed mirror of the rear sampling device is in front of the circular aperture of the front sampling device.

5. The apparatus for retro-reflection measurement according to claim 1, wherein the measuring annular bands shaped by the multi sets of sampling devices are sequentially arranged from small to large in the observation light path.

6. The apparatus for retro-reflection measurement according to claim 5, wherein the corresponding observation angle of the annular bands are 0.2°, 0.33° or 0.5°.

7. The apparatus for retro-reflection measurement according to claim 1, wherein the said light source comprises one or more programmable LEDs of different color; the said LEDs emit light independently or with combination, and the light goes to the test sample directly or indirectly.

8. The apparatus for retro-reflection measurement according to claim 7, wherein the LEDs is drove in pulse mode.

9. The apparatus for retro-reflection measurement according to claim 7, further comprising an integrating sphere, the light emitted for one or more LEDs independently or with combination goes into the integrating sphere, and then irradiates to the test sample.

10. The apparatus for retro-reflection measurement according to claim 1, further comprising one or more color filters which set in the observation light path and/or the illumination light path.

11. The apparatus for retro-reflection measurement according to claim 10, further comprising a color filter wheel with one or more color filters; a color filter is switch into the light path by rotating the color filter wheel.

12. The apparatus for retro-reflection measurement according to claim 10, wherein the observation light path includes the common observation light path of the two or more measuring annular band and the independent observation light path corresponding to each individual measuring annular band; the said color filter is set in the common observation light path or independent observation light path.

13. The apparatus for retro-reflection measurement according to claim 1, further comprising a monitor device for monitoring the fluctuation of the light source; the said monitor device receives the light from the light source.

14. The apparatus for retro-reflection measurement according to claim 1, further comprising one or more reflecting mirror; the said reflecting mirror is set in the observation light path and/or the illumination light path.

15. The apparatus for retro-reflection measurement according to claim 1, wherein the said measurement device is a photometer detector or a spectroradiometer.

Description

DRAWINGS

[0023] FIG. 1 is a schematic view of embodiment 1

[0024] FIG. 2 is a schematic view of embodiment 2

[0025] FIG. 3 is a schematic view of embodiment 3

[0026] FIG. 4 is a schematic view of filter wheel with color filter of the embodiment 3

[0027] FIG. 5 is a light source schematic view of embodiment 4

[0028] 1—light source; 2—sampling device; 21—holed mirror; 22—circular aperture; 3—measuring device; 4—test sample; 5—integrating sphere; 6—color filter; 7—filter wheel; 8—monitoring device; 9—reflecting mirror; 10—case; 11—color LED; 12—driving device.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT

Embodiment 1

[0029] As shown in FIG. 1, the embodiment realizes single observation angle for retro-reflection measurement, the apparatus comprises a light source 1, one set of sampling device 2, one measuring device 3 and a test sample 4. The sampling device 2 is composed of a holed mirror 21 and a circular aperture 22. Both centers of the holed mirror 21 and the circular aperture 22 are located in the optical axis of the observation light path. The light source 1, holed mirror 2, test sample 4, the circular aperture 22 and the measuring device 3 are arranged in sequence in the optical path.

[0030] The embodiment realizes 0.2° observation angle, that corresponds to 0.2°±0.05° annular band of light. The light emitted by light source 1 passes through the holed mirror 21 and irradiates to the test sample 4, and the retro-reflect light from the test sample 4 goes to the holed mirror 21 first, and the light whose beam angle larger than 0.15° was reflected to the circular aperture 22, and the light whose beam angle smaller than 0.25° passes through the circular aperture 22, and shapes a 0.2°±0.05° annular band of light, which is finally received by measurement device 3 behind circular aperture 22 to fulfill retro-reflection measurement in 0.2° observation angle.

[0031] The optical path in this embodiment is simple and ingenious, without supporting device, and can complete realization of 0.2°±0.05° annular band of retro-reflect light measurement. It has advantages of high measuring accuracy, simple system structure, compact, convenient operation, and fast test speed for producing line and on-site rapid measurement in industry.

Embodiment 2

[0032] As shown in FIG. 2, this embodiment comprises one light source 1, three sampling devices 2 and three measuring devices 3, a monitor device 8, a reflecting mirror 9 and a case 10. The reflecting mirror 9 is set in the light path between the light source 1 and the test sample 4. The light source, sampling devices 2, measuring devices 3, monitor device 8 and reflecting mirror 9 are all located in case 10. Different from embodiment 1, there are two reflecting mirrors 91, and 92 in the illumination light path to minimize of the apparatus; In addition, there are three sets of sampling devices 2 (211 and 221, 212 and 222, 213 and 223), it can achieve three annular bands of light for three observation angles' measurement.

[0033] Three sets of sampling devices in this embodiment has observation angles: 0.2°, 0.33° and 0.5° which corresponds to the bands of 0.2°±0.05°, 0.33°±0.05° and 0.5°±0.05° respectively. The different measuring annular bands are sequentially arranged from small to large in the observation light path. Along with the observation light path, the holed mirror 21 of later sampling device 2 is in front of circular aperture 22 of former sampling device 2. This means that the second holed mirror 212 of the second sampling device is in front of the first circular aperture 221 of first sampling device, and the third holed mirror 213 of the third sampling device is in front of the second circular aperture 222 of second sampling device.

[0034] The light emitted from the light source 1 passes through the holed mirror 211, and reflected by two reflecting mirrors 91 and 92, and then irradiates to the test sample 4. The retro-reflect light from the test sample 4 goes back to the holed mirror (211), and the light whose beam angle larger than 0.15 is reflected to the next holed mirror(212). One part of the light pass through holed mirror 212 with aperture size of 0.28°, and then sequently cut by a circular aperture 221 with aperture size of 0.25°; the corresponding measuring device 31 receives an annular band (0.15°˜0.25°) of light. The other part of light whose beam angle greater than 0.28° are reflected by the second holed mirror 222 along the observation light path to the third holed mirror 213. One part of the light pass through the third holed mirror 213 with aperture size of 0.45°, the second circular aperture 222 cut the light which beam angle greater than 0.38°, therefore, the second measuring device 32 receives 0.28°˜0.38° annular band of light. Another part of the light whose beam angle greater than 0.45° are reflected by third holed mirror 213 along the observation light path to the third circular aperture 223 which cut the light whose beam angle is greater than 0.55°, the third measuring device 33 receives annular band of light in the range from 0.45°˜0.55°. The retro-reflection measurement can be realized under the different observation angles at one time. It can greatly reduce the test time and improve test efficiency. This embodiment also comprises a monitor device 8 arranged at the side of the light source 1 to receive the light emitted from the light source 1. Both the measuring device 3 and the monitor device 8 are spectroradiometer. Make full use of the measured results, it obtains photometric, colorimetric and spectral quantities such as reflectivity, spectral reflectance and light emitting intensity coefficient.

Embodiment 3

[0035] As shown in FIG. 3, different from embodiment 2, this embodiment includes a color filter 6, the color filter 6 is set in the common observation light path between the second holed mirror 212 and the third holed mirror 213. Both the second measuring device 32 and the third measuring device 33 are photoprobes. The filter 6 matches the spectral responsivity of the photobrobes to the CIE spectral luminous efficiency function V(λ), because the filter is set in the common observation optical path C, the light received by measuring device 32 and measuring device 33 are functioned by filter 6 and photometric value in different observation angle can be obtained.

[0036] In addition, this embodiment includes a filter wheel 7, the filter wheel 7 is arranged between the first circular aperture 221 in first sampling device 2 and the first measuring device 31. As shown in FIG. 4, there are 4 filters 6 in filter wheel 7, the first measuring device 31 is a CCD, the spectral responsivity of three filters combined with the CCD are CIE tristimulus function x(λ), y(λ) and z(λ). The filter wheel under the driving of the driving device can realize retro-reflection tristimulus values measurement. The other combined spectral response is CIE spectral luminous efficiency function V(λ), it can get a retro-reflection photometric values under photopic luminance values.

Embodiment 4

[0037] Different from the above embodiments, this embodiment comprises an integrating sphere 5. Four color LEDs 11 are set in the wall of the integrating sphere 5, the color LED 11 are connected to a programmable driver 12 which controls each color LED 11 in pulse mode. The light from one or multi color LEDs 12 is mixed in the integrating sphere 5, and then irradiates to sample 4 uniformly, avoiding measurement error introduced by the non-uniformity of the illumination light.