VOLTAGE-CONTROLLED OSCILLATOR
20170257063 · 2017-09-07
Inventors
- Baudouin Martineau (Grenoble, FR)
- José-Luis GONZALEZ JIMENEZ (Voreppe, FR)
- Aurélien LARIE (Grenoble, FR)
Cpc classification
H01L21/84
ELECTRICITY
H03B2201/031
ELECTRICITY
H03L7/06
ELECTRICITY
H03B5/1278
ELECTRICITY
H03L1/00
ELECTRICITY
H03L7/04
ELECTRICITY
H03B5/1215
ELECTRICITY
H03B5/1212
ELECTRICITY
H03B2200/004
ELECTRICITY
H03B5/1243
ELECTRICITY
H03B5/1228
ELECTRICITY
International classification
Abstract
A voltage-controlled oscillator, including a voltage-controlled LC resonator including at least one first output node; an amplifier including at least one first dual-gate MOS transistor including first and second gates, coupling the first output node to a second node of application of a reference potential; and a regulation circuit capable of applying to the second gate of the first transistor a bias voltage variable according to the amplitude of the oscillations of a signal delivered on the first output node of the oscillator.
Claims
1. A voltage-controlled oscillator, comprising: a voltage-controlled LC resonator comprising at least one first output node; an amplifier comprising at least one first dual-gate MOS transistor comprising first and second gates, coupling the first output node to a second node of application of a reference potential; a regulation circuit capable of applying to the second gate of the first transistor a bias voltage variable according to the amplitude of the oscillations of a signal delivered on the first output node of the oscillator; and a circuit of application of a fixed bias voltage to the first gate of the first transistor, wherein the fixed and variable bias voltages are such that the amplifier has a class-A, -B, or -AB biasing during a start-up phase of the oscillator, and has a class-C biasing in steady state.
2. The oscillator of claim 1, wherein: the first transistor is a transistor having a negative threshold voltage variation; and the variable bias voltage decreases as the amplitude of the oscillations increases.
3. The oscillator of claim 2, wherein the fixed bias voltage is greater than or equal to the minimum threshold voltage of the first transistor, and is smaller than the maximum threshold voltage of the first transistor.
4. The oscillator of claim 1, wherein the regulation circuit comprises a first circuit capable of supplying a first voltage representative of the envelope of the oscillations, and a second circuit capable of generating the variable bias voltage from the first voltage.
5. The oscillator of claim 4, wherein the first circuit comprises a second diode-assembled MOS transistor in series with a first capacitive element between the first output node and the second node.
6. The oscillator of claim 5, wherein the second circuit comprises first and second resistors series-connected between first and second electrodes of the first capacitive element, and a third resistor series-connected with a third MOS transistor between a third node of application of a power supply voltage and the second node, the gate of the third transistor being coupled to the junction point of the first and second resistors, and the junction point of the third resistor and of the third transistor being coupled to the second gate of the first transistor.
7. The oscillator of claim 1, wherein the resonator comprises an inductance, and a series association of first and second variable-capacitance capacitive elements.
8. The oscillator of claim 1, wherein: the LC resonator is a differential resonator further comprising a fourth output node; the amplifier comprises at least one fourth dual-gate MOS transistor comprising first and second gates, coupling the fourth output node to the second node; and the regulation circuit is capable of applying said variable bias voltage to the second gate of the second transistor.
9. The oscillator of claim 8, wherein the amplifier comprises second and third capacitive elements respectively coupling the first gate of the first transistor to the fourth output node and the first gate of the fourth transistor to the first output node.
10. The oscillator of claim 1, wherein said at least one first dual-gate MOS transistor is an FDSOI transistor.
Description
BRIEF DESCRIPTION OF THE DRAWINGS
[0018]
[0019]
[0020]
[0021]
[0022]
DETAILED DESCRIPTION OF THE PRESENT EMBODIMENTS
[0023] The same elements have been designated with the same reference numerals in the different drawings. In the present description, term “connected” is used to designate a direct electric connection, with no intermediate electronic component, for example, by means of one or a plurality of conductive tracks, and term “coupled” or term “linked” is used to designate either a direct electric connection (then meaning “connected”) or a connection via one or a plurality of intermediate components (resistor, capacitor, transistor, etc.). Unless otherwise specified, expressions “approximately”, “substantially”, and “in the order of” mean to within 10%, preferably to within 5%.
[0024]
[0025] The oscillator of
[0026] The oscillator of
[0027] The oscillator of
[0028] The architecture of
[0029]
[0030] The oscillator of
[0031] Resonator 201 is for example identical to resonator 101 described in relation with
[0032] The oscillator of
[0033] The operation of the oscillator of
[0034] The class-C biasing of amplifier circuit 203 enables to decrease both the phase noise and the power consumption of the oscillator as compared with architectures having a class-A operation of the type described in relation with
[0035] The gain in terms of phase noise and of power consumption is all the higher as the bias voltage applied to the gates of transistors T1 and T2 is low. However, the application of too low a bias voltage to the gates of transistors T1 and T2 may prevent the starting of the oscillator.
[0036] To attempt satisfying these two contradictory aims (a) start-up robustness and b) decreased phase noise and power consumption), various class-C oscillator architectures with parallel LC resonators have been provided, particularly in articles “A 0.114-mW dual-conduction class-C CMOS VCO with 0.2-V power supply” of K. Okada et al. (IEEE Symp. VLSIC, 2009, pp. 228-229), “An improved dual-conduction class-C VCO using a tail resistor” of Y. Takeuchi et al. (IEEE EuMIC, 2011, pp. 204-207), “High-swing class-C VCO” of M. Tohidian et al. (IEEE ESSCIRC, 2011, pp. 49.5-498), “A low power, start-up ensured and constant amplitude class-C VCO in 0.18 mCMOS” of J. Chen et al. (IEEE Microwave. Wireless Compon. Lett., vol. 21, no. 8, pp. 427-429, August 2011), and “Class-C VCO With Amplitude Feedback Loop for Robust Start-Up and Enhanced Oscillation Swing” of Wei Deng et al. (IEEE Journal of Solid-State Circuits, vol. 48, no. 2, pp. 429-440, February 2013), as well as in U.S. Pat. No. 8,149,067 and U.S. Pat. No. 8,710,937.
[0037] The solutions described in these publications have the common point of applying to the gates of the MOS transistors of the amplifier circuit a first bias voltage for the start-up phase, and a second bias voltage smaller than the first voltage for the operation in steady state. The provided architectures are however complex. In particular, solutions providing a dynamic adjustment of the bias voltage applied to the gates of the MOS transistors of the amplifier circuit have the disadvantage of being invasive, since the gates of the MOS transistors of the amplifier circuit also receive the oscillating AC signal to be amplified. Thus, a malfunction of the circuits for controlling the bias voltage of the MOS transistors may cause a stopping of the oscillations and make the circuit unusable. Further, in the solutions described in the above-mentioned publications, to take into account, in particular, manufacturing and temperature dispersions, a security margin should be taken in the selection of the transistor bias point, to avoid risking an unwanted stopping of the oscillations. As a result, the optimal bias point in terms of phase noise and of power consumption cannot be reached.
[0038]
[0039] The oscillator of
[0040] The oscillator of
[0041] Dual-gate MOS transistor here means a transistor comprising a channel-forming region laterally bordered, on the one hand, with a source region and, on the other hand, with a drain region, and further comprising a first control gate or front gate (fg), arranged above the channel-forming region and insulated from the channel-forming region by a dielectric layer, and a second control gate or back gate (bg), arranged under the channel-forming region. In such a transistor, the current flowing between the drain and the source of the transistor is a function not only of the potential applied to the front gate of the transistor, but also of the potential applied to the back gate thereof. In particular, the threshold voltage of the transistor, that is, the minimum voltage to be applied between the front gate and the source of the transistor to turn on the transistor, depends on the potential applied to the back gate of the transistor.
[0042] Transistors T1 and T2 are for example SOI-type (“semiconductor on insulator”) transistors, the back gate being then insulated from the channel-forming region by a dielectric layer. Preferably, transistors T1 and T2 are FDSOI-type (“Fully Depleted Semiconductor On Insulator”) transistors, that is, SOI transistors where the channel-forming region is fully depleted when the transistor is not biased. Indeed, in a FDSOI transistor, the variations of the control potential applied to the back gate of the transistor cause significant variations of the transistor threshold voltage, which is particularly adapted to the implementation of the embodiments which will be described, as will more clearly appear from the following description. The described embodiments are however not limited to the case where transistors T1 and T2 are of SOI or FDSOI type. More generally, the described embodiments apply to any types of MOS transistors with two control gates respectively arranged on the front side and on the back side of the channel-forming region of the transistor. As an example, the described embodiments are compatible with “bulk”-type MOS transistors, comprising a semiconductor bulk region arranged under the channel-forming region, having its upper surface in contact with the lower surface of the channel-forming region. In this case, the back gate is formed by the transistor bulk region, and is not insulated from the channel-forming region. As a variation, transistors T1 and T2 may be FinFET-type transistors.
[0043] The assembly of transistors T1 and T2 of
[0044] The oscillator of
[0045] In operation, a fixed DC bias voltage is applied to the front gates of transistors T1 and T2, via node V.sub.gbias. Voltage V.sub.gbias is preferably selected to be greater than or equal to minimum threshold voltage V.sub.thmin of transistors T1 and T2, that is, the threshold voltage of transistors T1 and T2 when their back gates are biased to voltage V.sub.bgmax. Thereby, transistors T1 and T2 have a class-B, -AB, or -A biasing at the starting of the oscillator, that is, when the amplitude of the oscillations of the output signal is zero. This guarantees a robust start-up of the oscillator.
[0046] When the oscillator starts, an oscillating signal appears on its output nodes V.sub.out1, V.sub.out2. Circuit 305 then continuously modifies the bias voltage V.sub.bg applied to the back gates of transistors T1 and T2 according to the amplitude of the oscillations of the signal delivered to nodes V.sub.out1, V.sub.out2. In steady state, voltage V.sub.bg reaches its minimum value V.sub.bgmin, and the threshold voltage of transistors T1 and T2 accordingly reaches its maximum value V.sub.thmax. The fixed bias voltage V.sub.gbias applied to the front gates (fg) of transistors T1 and T2 is selected to be smaller than maximum threshold voltage V.sub.thmax of transistors T1 and T2, to obtain a class-C biasing of transistors T1 and T2 in steady state.
[0047] In the shown example, circuit 305 comprises a first sub-circuit 305.sub.1 connected, on the one hand, to node V.sub.out1 and, on the other hand, to the back gate (bg) of transistor T1, and a second sub-circuit 305.sub.2 connected, on the one hand, to node V.sub.out2 and, on the other hand, to the back gate (bg) of transistor T2. In this example, sub-circuit 305.sub.1 comprises a rectifying and filtering circuit 307.sub.1, or envelope detection circuit, connected to node V.sub.out1 and capable of delivering, on an output node N.sub.1, a voltage representative of the envelope of the oscillating signal present on node V.sub.out1. Sub-circuit 305.sub.1 further comprises a shaping circuit 309.sub.1 connected to node N.sub.1 and capable of applying, to the back gate (bg) of transistor T.sub.1, a bias voltage which is a function of the amplitude of the envelope signal delivered by envelope detector 307.sub.1 to node N.sub.1. Similarly, sub-circuit 305.sub.2 comprises a rectifying and filtering circuit 307.sub.2, or envelope detection circuit, connected to node V.sub.out2 and capable of delivering, on an output node N.sub.2, a voltage representative of the envelope of the oscillating signal present on node V.sub.out2. Sub-circuit 305.sub.2 further comprises a shaping circuit 309.sub.2 connected to node N.sub.2 and capable of applying, to the back gate (bg) of transistor T2, a bias voltage which is a function of the amplitude of the envelope signal delivered by envelope detector 307.sub.2 to node N.sub.2. Sub-circuits 305.sub.1 and 305.sub.2 are for example identical, to within manufacturing dispersions. In practice, the bias voltage applied to the back gate (bg) of transistor T1 is substantially identical to the bias voltage applied to the back gate (bg) of transistor T2. As a variation, only one of the two sub-circuits 305.sub.1 and 305.sub.2 may be provided, and the output of this sub-circuit may be connected both to the back gate (bg) of transistor T1 and to the back gate (bg) of transistor T2. The arrangement shown in
[0048]
[0049] In this example, envelope detection circuit 307.sub.1 of sub-circuit 305.sub.1 comprises a diode-assembled MOS transistor M11, which couples node V.sub.out1 to node N1. In this example, transistor M11 is an N-channel transistor, having its conduction nodes respectively connected to node V.sub.out1 and to node N1, and having its gate connected to node V.sub.out1. Transistor M11 may be a single-gate or a dual-gate transistor. In the shown example, transistor M11 is a dual-gate transistor having its back gate connected to ground (node GND) and having its front gate connected to node V.sub.out1. Envelope detection circuit 307.sub.1 further comprises a capacitive element C11, for example, a capacitor, connected between node N.sub.1 and node GND.
[0050] Shaping circuit 309.sub.1 comprises two resistors R11 and R12 series-connected between node N1 and node GND, in parallel with capacitive element C11 of circuit 307.sub.1. Resistors R11 and R12 form a first voltage dividing bridge lowering the level of the envelope voltage delivered by circuit 307.sub.1 on node N.sub.1. Circuit 309.sub.1 further comprises a resistor R13 series-connected with a MOS transistor M12 between nodes VDD and GND. More particularly, in the shown example, transistor M12 is an N-channel transistor having its drain coupled to node VDD via resistor R13 and having its source connected to node GND. The gate of transistor M12 is coupled to the output node of the voltage dividing bridge formed by resistors R11 and R12, that is, to the junction point of resistors R11 and R12. Transistor M12 may be a single-gate transistor or a dual-gate transistor. In the shown example, transistor M12 is a dual-gate transistor having its back gate connected to ground (node GND) and having its front gate connected to the junction point of resistors R11 and R12. Resistor R13 and transistor M12 form together a second resistive voltage dividing bridge delivering a voltage having a level which is all the lower as the resistance of transistor M12 is low, that is, as the voltage level on node N1 is high. The output node of the voltage dividing bridge formed by resistor R13 and transistor M12, that is, the junction point of resistor R13 and of transistor M12, is connected to the back gate (bg) of transistor T1.
[0051] Similarly, envelope detection circuit 307.sub.2 of sub-circuit 305.sub.2 comprises a diode-assembled MOS transistor M21, coupling node V.sub.out1 to node N.sub.2, and a capacitive element C21 connected between node N.sub.2 and node GND. Further, shaping circuit 309.sub.2 comprises two resistors R21 and R22 series-connected between node N.sub.2 and node GND, in parallel with capacitive element C21. Circuit 309.sub.2 further comprises a resistor R23 series-connected with a MOS transistor M22 between nodes VDD and GND, the gate of transistor M22 being coupled to the junction point of resistors R21 and R22, and the junction point of resistor R23 and of transistor M22 being coupled to the back gate (bg) of transistor T2.
[0052] An advantage of the embodiments described in relation with
[0053] Another advantage of the described embodiments is that the dynamic adjustment of the bias point of transistors T1 and T2 in order to, in a first phase, satisfy the oscillator start-up conditions and, in a second phase, obtain a class-C operation providing a good performance in terms of phase noise and of power consumption, is performed via the back gates of transistors T1 and T2. Thus, regulation circuit 305 is non-invasive, since the bias voltage dynamically modified by circuit 305 is not superimposed to the high-frequency oscillating signal to be amplified. Bias voltage V.sub.gbias applied to the front gate of transistors T1 and T2 remains constant during the oscillator operation.
[0054] Specific embodiments have been described. Various alterations, modifications, and improvements will occur to those skilled in the art. In particular, the described embodiments are not limited to the example of parallel LC resonators 301 shown in
[0055] Further, the described embodiments are not limited to the specific example of layout of amplifier circuit 303 shown in
[0056] Further, the described embodiments are not limited to the specific examples of implementation of regulation circuit 305 described in relation with
[0057] Further, the described embodiments may be adapted to the case where transistors T1 and T2 are transistors having a positive threshold voltage variation.
[0058] Further, embodiments of oscillators with a differential LC resonator have been described hereabove. The above-described embodiments may however be adapted to oscillators having a non-differential LC resonator, that is, where the output oscillating signal of the oscillator is referenced to ground.
[0059]
[0060] The oscillator of
[0061] The oscillator of
[0062] The oscillator of
[0063] The operation of the oscillator of
[0064] Such alterations, modifications, and improvements are intended to be part of this disclosure, and are intended to be within the spirit and the scope of the present invention. Accordingly, the foregoing description is by way of example only and is not intended to be limiting. The present invention is limited only as defined in the following claims and the equivalents thereto.