TUNGSTEN OXIDE SPUTTERING TARGET

Abstract

A W.sub.18O.sub.49 peak is confirmed by X-ray diffraction analysis of a sputtering surface and a cross section orthogonal to the sputtering surface, a ratio I.sub.S(103)/I.sub.S(010) of a diffraction intensity I.sub.S(103) of a (103) plane to a diffraction intensity I.sub.S(010) of a (010) plane of W.sub.18O.sub.49 of the sputtering surface is 0.38 or less, a ratio I.sub.C(103)/I.sub.C(010) of a diffraction intensity I.sub.C(103) of the (103) plane to a diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section is 0.55 or more, and an area ratio of W.sub.18O.sub.49 phase of a surface parallel to the sputtering surface is 37% or more.

Claims

1. A tungsten oxide sputtering target, wherein a W.sub.18O.sub.49 peak is confirmed by X-ray diffraction analysis of a sputtering surface and a cross section orthogonal to the sputtering surface, a ratio I.sub.S(103)/I.sub.S(010) of a diffraction intensity I.sub.S(103) of a (103) plane to a diffraction intensity I.sub.S(010) of a (010) plane of W.sub.18O.sub.49 of the sputtering surface is 0.38 or less, a ratio I.sub.C(103)/I.sub.C(010) of a diffraction intensity I.sub.C(103) of the (103) plane to a diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section is 0.55 or more, and an area ratio of a W.sub.18O.sub.49 phase of a surface parallel to the sputtering surface is 37% or more.

2. The tungsten oxide sputtering target according to claim 1 having a composition of WO.sub.X (2.1≤X≤2.9).

3. The tungsten oxide sputtering target according to claim 1, comprising: an oxide of any one or two or more additive metals of Nb, Ta, Ti, Zr, Y, Al and Si, wherein, as a metal component, in a case where a total amount of the additive metal is defined as M (atom %) and an amount of tungsten is defined as W (atom %), M/(W+M) is in a range of 0.1 or more and 0.67 or less.

4. The tungsten oxide sputtering target according to claim 2, comprising: an oxide of any one or two or more additive metals of Nb, Ta, Ti, Zr, Y, Al and Si, wherein, as a metal component, in a case where a total amount of the additive metal is defined as M (atom %) and an amount of tungsten is defined as W (atom %), M/(W+M) is in a range of 0.1 or more and 0.67 or less.

Description

BRIEF DESCRIPTION OF DRAWINGS

[0022] FIG. 1 is a diagram showing an X-ray diffraction analysis result of a sputtering surface of a tungsten oxide sputtering target and a cross section orthogonal to the sputtering surface according to an embodiment of the present invention.

[0023] FIG. 2 is a flowchart showing a method for manufacturing the tungsten oxide sputtering target according to an embodiment of the present invention.

[0024] FIG. 3 is an explanatory diagram of a machining process step of obtaining a sputtering target from a sintered body in the method for manufacturing the tungsten oxide sputtering target according to an embodiment of the present invention.

DESCRIPTION OF EMBODIMENTS

[0025] Hereinafter, the tungsten oxide sputtering target according to the embodiment of the present invention will be described with reference to the accompanying drawings.

[0026] In the tungsten oxide sputtering target according to the present embodiment, the W.sub.18O.sub.49 peak is confirmed by the X-ray diffraction analysis on the sputtering surface and the cross section orthogonal to the sputtering surface, and the area ratio of the W.sub.18O.sub.49 phase as a result of the cross section observation of the surface parallel to the sputtering surface is 37% or more.

[0027] In the tungsten oxide sputtering target according to the present embodiment, as shown in FIG. 1, as a result of the X-ray diffraction measurement, the ratio I.sub.S(103)/I.sub.S(010) of the diffraction intensity I.sub.S(103) of the (103) plane to the diffraction intensity I.sub.S(010) of the (010) plane of W.sub.18O.sub.49 of the sputtering surface is 0.38 or less.

[0028] In addition, the ratio I.sub.C(103)/I.sub.C(010) of the diffraction intensity I.sub.C(103) of the (103) plane to the diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface is 0.55 or more.

[0029] The tungsten oxide sputtering target of the present embodiment preferably has a composition of WO.sub.X (2.1≤X≤2.9).

[0030] It is preferable that, the tungsten oxide sputtering target of the present embodiment contains an oxide of any one or two or more additive metals of Nb, Ta, Ti, Zr, Y, Al and Si, and as a metal component, in a case where a total amount of the additive metal is defined as M (atom %) and an amount of tungsten is defined as W (atom %), M/(W+M) is in a range of 0.1 or more and 0.67 or less.

[0031] In the tungsten oxide sputtering target according to the present embodiment, regarding the ratio I.sub.S(103)/I.sub.S(010) of the diffraction intensity I.sub.S(103) of the (103) plane to the diffraction intensity I.sub.S(010) of the (010) plane of W.sub.18O.sub.49 of the sputtering surface, the ratio I.sub.C(103)/I.sub.C(010) of the diffraction intensity I.sub.C(103) of the (103) plane to the diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface, the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface, and the composition, the reasons for defining as described above will be described.

(Diffraction Intensity Ratio I.sub.S(103)/I.sub.S(010) of Sputtering Surface)

[0032] By strongly orienting the (010) plane of W.sub.18O.sub.49 on the sputtering surface, a sputtering rate is stabilized and the occurrence of abnormal discharge is suppressed.

[0033] Therefore, in the present embodiment, the ratio I.sub.S(103)/I.sub.S(010) of the diffraction intensity I.sub.S(103) of the (103) plane to the diffraction intensity I.sub.S(010) of the (010) plane of W.sub.18O.sub.49 of the sputtering surface is set as 0.38 or less.

[0034] The ratio I.sub.S(103)/I.sub.S(010) of the diffraction intensity I.sub.S(103) of the (103) plane to the diffraction intensity I.sub.S(010) of the (010) plane of W.sub.18O.sub.49 of the sputtering surface is preferably 0.29 or less and more preferably 0.20 or less. In addition, a lower limit of I.sub.S(103)/I.sub.S(010) is not particularly limited, and is preferably 0.14 or more.

(Diffraction Intensity Ratio I.sub.C(103)/I.sub.C(010) of Cross Section Orthogonal to Sputtering Surface)

[0035] As the sputtering proceeds, an erosion portion is formed on the sputtering surface. In a case where the orientation of the (103) plane of W.sub.18O.sub.49 is high on the cross section orthogonal to the sputtering surface, although the sputtering has proceeded, a state in which the (010) plane is strongly oriented on the sputtering surface is maintained. Accordingly, it is possible to suppress the occurrence of abnormal discharge even after the sputtering has proceeded.

[0036] Therefore, in the present embodiment, the ratio I.sub.C(103)/I.sub.C(010) of the diffraction intensity I.sub.C(103) of the (103) plane to the diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface is set as 0.55 or more.

[0037] The ratio I.sub.C(103)/I.sub.C(010) of the diffraction intensity I.sub.C(103) of the (103) plane to the diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface is preferably 1.18 or more and more preferably 1.41 or more. In addition, an upper limit of I.sub.C(103)/I.sub.C(010) is not particularly limited, and is preferably 2.54 or less.

(Area Ratio of W.sub.18O.sub.49 Phase on Surface Parallel to Sputtering Surface)

[0038] Since the W.sub.18O.sub.49 phase of tungsten oxide has high conductivity, it is possible to improve the conductivity by ensuring the area ratio of the W.sub.18O.sub.49 phase and to form a tungsten oxide film stably by the DC sputtering.

[0039] Therefore, in the present embodiment, the area ratio of the W.sub.18O.sub.49 phase on the surface parallel to the sputtering surface is set to 37% or more. The area ratio of the W.sub.18O.sub.49 phase on the surface parallel to the sputtering surface can be calculated from an image obtained by performing EPMA analysis on an observation surface of an observation sample. Even in a case where oxides of these additive metals of any one or two or more of Nb, Ta, Ti, Zr, Y, Al, and Si are contained in addition to tungsten oxide, the area ratio of the W.sub.18O.sub.49 phase may be 37% or more with respect to the entire surface parallel to the sputtering surface containing the oxides of these additive elements.

[0040] The area ratio of the W.sub.18O.sub.49 phase on the surface parallel to the sputtering surface is preferably 55% or more and more preferably 85% or more. In addition, an upper limit of the area ratio of the W.sub.18O.sub.49 phase on the surface parallel to the sputtering surface is not particularly limited, and is preferably 94% or less.

(Composition)

[0041] Since various phases such as a WO.sub.2 phase, a WO.sub.3 phase, and a W.sub.18O.sub.49 phase are mixed in tungsten oxide, a ratio of tungsten and oxygen is defined as WO.sub.X.

[0042] By setting X to 2.1 or more, the ratio of the WO.sub.2 phase can be suppressed, and the W.sub.18O.sub.49 phase having excellent conductivity can be sufficiently ensured. By setting X to 2.9 or less, the ratio of the WO.sub.3 phase can be suppressed, and the W.sub.18O.sub.49 phase having excellent conductivity can be sufficiently ensured. That is, by setting X to 2.1 or more and 2.9 or less, the W.sub.18O.sub.49 phase becomes a main phase (matrix), and the conductivity of the sputtering target can be ensured.

[0043] A lower limit of X is preferably 2.4 or more. In addition, an upper limit of X is preferably 2.82 or less.

(Oxide of Additive Metal)

[0044] In the formed oxide film, alkali is used as a resist peeling solution during patterning by an etching method. By containing the oxide of additive metal of any one or two or more of Nb, Ta, Ti, Zr, Y, Al, and Si in tungsten oxide, it is possible to improve the alkali resistance of tungsten oxide. Meanwhile, in a case where an amount of the oxide of the additive metal is extremely great, an abnormal discharge may occur during sputtering due to the oxide of the additive metal.

[0045] Therefore, in the present embodiment, in a case where an oxide of any one or two or more additive metals of Nb, Ta, Ti, Zr, Y, Al and Si is contained, in a case where a total amount of the additive metal is defined as M (atom %) and an amount of tungsten is defined as W (atom %) as the metal component, M/(W+M) is regulated in a range of 0.1 or more and 0.67 or less.

[0046] A lower limit of M/(W+M) is preferably 0.15 or more and more preferably 0.2 or more. On the other hand, an upper limit of M/(W+M) is preferably 0.5 or less and more preferably 0.4 or less.

[0047] Next, a method for manufacturing the tungsten oxide sputtering target according to the present embodiment will be described with reference to FIGS. 2 and 3.

[0048] As shown in FIG. 2, the method for manufacturing the tungsten oxide sputtering target according to the present embodiment includes a raw material powder preparation step S01, a sintering step S02 for sintering the raw material powder, and a machining process step S03 of machining the obtained sintered body.

(Raw Material Powder Preparation Step S01)

[0049] By reducing the WO.sub.3 powder, a WO.sub.X powder containing the WO.sub.2 powder and the W.sub.18O.sub.49 powder is obtained. This WO.sub.X powder may contain a WO.sub.3 powder. A purity of WO.sub.X powder is 99.9 mass % or more. The X of the WO.sub.X powder is controlled by adjusting the conditions of the reduction treatment.

[0050] As the reduction treatment, for example, the WO.sub.3 powder is heated in a hydrogen atmosphere for a predetermined time at a predetermined temperature to reduce hydrogen. In this hydrogen reduction, the reduction proceeds in the order of WO.sub.3 to WO.sub.2.9, WO.sub.2.72, WO.sub.2, and W. By controlling the proceeding situation of the reduction, it is possible to prepare powders in a mixed state having the composition having different reduction states, and to finely fluctuate an X value of the WO.sub.X powder.

[0051] In addition, as a method for controlling and finely adjusting the X value of the WO.sub.X powder, a powder formed of WO.sub.3, WO.sub.29, WO.sub.2.72, WO.sub.2, and W can be appropriately mixed with the powder subjected to the reduction treatment as described above.

[0052] In the quantitation of the X in WO.sub.X, the sampled WO.sub.X is weighed, then heat-treated at 800° C. for 1 hour in the atmosphere, and the weight is measured after the heat treatment. Then, it is confirmed that all of them are WO.sub.3 by X-ray diffraction analysis, and a W amount is calculated by the following formula. Then, a ratio of oxygen is calculated as the X from the obtained W amount.

Weight of W=Weight after heat treatment×M.sub.W/M.sub.WO3

W (mass %)=(weight of W/weight of WO.sub.X before heat treatment)×100

[0053] Mw: Atomic weight of W (183.85), M.sub.WO3: Atomic weight of WO.sub.3 (231.85)

[0054] The raw material powder is obtained by mixing the obtained WO.sub.X powder. As a mixing method, for example, a dry ball mill using zirconia balls can be used. The mixing method is not limited, and a mixer or a blender, specifically, Henschel, rocking, a recon, or the like can be applied.

[0055] An average particle diameter of the raw material powder is preferably in a range of 1 μm or more and 30 μm or less.

[0056] In a case where the oxide of additive metals of any one or two or more of Nb, Ta, Ti, Zr, Y, Al, and Si is added, various oxide powders are mixed with the WO.sub.X powder described above. As a mixing method, for example, a dry ball mill using zirconia balls can be used. The mixing method is not limited, and a mixer or a blender, specifically, Henschel, rocking, a recon, or the like can be applied.

[0057] In addition, the oxide powder of the additive metal preferably has a greater particle diameter than that of the WO.sub.X powder so as not to disturb the sintering of the WO.sub.X powders.

(Sintering Step S02)

[0058] Next, the raw material powder described above is sintered by pressurizing and heating to obtain a sintered body. In the present embodiment, the sintering was performed in vacuum using a hot press device.

[0059] A sintering temperature in the sintering step S02 is in a range of 850° C. or higher and 1,400° C. or lower, a holding time at the sintering temperature is in a range of 1 hour or longer and 4 hours or shorter, and a pressurizing pressure is in a range of 10 MPa or more and 35 MPa or less.

[0060] In the present embodiment, the crystal orientation of the sintered body is controlled by controlling the temperature as follows in the sintering step S02.

[0061] First, before starting the temperature rise, the pressurization is performed at the pressurizing pressure described above, and the temperature is raised at a temperature rise rate in a range of 5° C./min or more and 20° C./min or less. Then, it is held at an intermediate temperature in a range of 586° C. or higher and 750° C. or less in a range of 1 hour or longer and 2 hours or shorter. After that, the sintering is performed by raising the temperature to the sintering temperature described above and holding the temperature.

[0062] Accordingly, the (103) plane of W.sub.18O.sub.49 is strongly oriented on a pressurizing surface (surface orthogonal to a pressurizing direction), and the (010) plane of W.sub.18O.sub.49 is strongly oriented on a surface orthogonal to the pressurizing surface (surface along the pressurizing direction).

[0063] A lower limit of the intermediate temperature described above is preferably 600° C. or higher, and an upper limit of the intermediate temperature is preferably 700° C. or lower.

(Machining Process Step S03)

[0064] Next, the obtained sintered body is machined to have a predetermined dimension. At this time, the machining is performed so that the surface orthogonal to the pressurizing surface is a sputtering surface.

[0065] As shown in FIG. 3, for example, in a case of a plate-shaped tungsten oxide sputtering target, the sintered body is cut so as to be orthogonal to the pressurizing surface, and the surface orthogonal to the pressurizing surface is used as the sputtering surface. In addition, in a case of a cylindrical tungsten oxide sputtering target, a cylindrical surface orthogonal to the pressurizing surface becomes a sputtering surface by pressurizing along an axial direction of a cylinder to obtain a cylindrical sintered body.

[0066] Accordingly, the tungsten oxide sputtering target of the present embodiment is manufactured.

[0067] According to the tungsten oxide sputtering target of the present embodiment having the configuration described above, the W.sub.18O.sub.49 peak is confirmed by the X-ray diffraction analysis on the sputtering surface and the cross section orthogonal to the sputtering surface, and the area ratio of W.sub.18O.sub.49 phase is 37% or more. Accordingly, it is possible to ensure conductivity and stably perform DC sputtering. In addition, it is possible to ensure the hardness of the tungsten oxide sputtering target.

[0068] In the tungsten oxide sputtering target of the present embodiment, the ratio I.sub.S(103)/I.sub.S(010) of the diffraction intensity I.sub.S(103) of the (103) plane to the diffraction intensity I.sub.S(010) of the (010) plane of W.sub.18O.sub.49 of the sputtering surface is 0.38 or less, the ratio I.sub.C(103)/I.sub.C(010) of the diffraction intensity I.sub.C(103) of the (103) plane to the diffraction intensity I.sub.C(010) of the (010) plane of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface is 0.55 or more, and the (103) plane of W.sub.18O.sub.49 is strongly oriented on the cross section orthogonal to the sputtering surface. Accordingly, although the sputtering proceeds and the erosion portion is formed, it is possible to maintain the crystal orientation of the sputtering surface and suppress the occurrence of abnormal discharge. Therefore, it is possible to stably perform the DC sputtering for a long period of time and extend the service life.

[0069] Further, in the tungsten oxide sputtering target of the present embodiment, in a case where the composition is WO.sub.X (2.1≤X≤2.9), the presence of a large amount of WO.sub.2 phase or WO.sub.3 phase is suppressed, and it is possible to sufficiently ensure the W.sub.18O.sub.49 phase and more stably perform the DC sputtering. In addition, it is possible to sufficiently ensure the hardness of the tungsten oxide sputtering target.

[0070] In addition, the tungsten oxide sputtering target of the present embodiment contains an oxide of any one or two or more additive metals of Nb, Ta, Ti, Zr, Y, Al and Si, and in a case where a total amount of the additive metal is defined as M (atom %) and an amount of tungsten is defined as W (atom %), M/(W+M) is in a range of 0.1 or less 0.67 and less. In this case, it is possible to improve the alkali resistance of the formed oxide film and suppress the occurrence of abnormal discharge due to the oxide of the additive metal.

[0071] The embodiments of the present invention have been described as above, but the present invention is not limited thereto, and can be appropriately changed without departing from the technical ideas of the present invention.

Examples

[0072] Hereinafter, a result of an evaluation test for evaluating an action effect of the tungsten oxide sputtering target according to the present invention will be described.

[0073] First, the WO.sub.X powder was produced by hydrogen-reduction treatment of the WO.sub.3 powder described above. In this example, the WO.sub.X powders having different x values were prepared by adjusting a degree of reduction. An average particle diameter of the raw material powder was 2.4 μm.

[0074] In addition, as the oxide powders of various additive metals, a Nb.sub.2O.sub.5 powder (purity: 99.9 mass %, particle diameter D50: 4.6 nm), a Ta.sub.2O.sub.5 powder (purity: 99.9 mass %, particle diameter D50: 3.5 μm), a TiO.sub.2 powder (purity: 99.9 mass %, particle diameter D50: 2.6 μm), a ZrO.sub.2 powder (purity: 99.9 mass %, particle diameter D50: 11 μm), a Y.sub.2O.sub.3 powder (purity: 99.9 mass %, particle diameter D50: 2.3 μm), an Al.sub.2O.sub.3 powder (purity: 99.9 mass %, particle diameter D50: 0.2 μm), and a SiO.sub.2 powder (purity: 99.9 mass %, particle diameter D50: 1.9 μm) were prepared and mixed with the WO.sub.X powder in the formulations shown in Tables 1 and 2.

[0075] Using this raw material powder, a sintering step was carried out with an apparatus (method) and under conditions shown in Tables 1 and 2, to obtain a sintered body. In Tables 1 and 2, “HP” indicates hot pressing in a vacuum atmosphere, “HIP” indicates a hot isostatic pressing method, and “atmospheric firing” indicates uniaxial molding in an atmospheric atmosphere.

[0076] In “HP”, the sintering was carried out under the sintering conditions A to D shown below.

[0077] Under the sintering condition A, the temperature was raised at a temperature rise rate of 10° C./min while pressurizing under the pressurizing pressures shown in Tables 1 and 2, and the temperature was held at 600° C. (intermediate temperature) for 1 hour. Then, the temperature was raised to the sintering temperature shown in Tables 1 and 2 at a temperature rise rate of 10° C./min, and the temperature was held at the sintering temperature for 2 hours. After that, the pressure was released and the mixture was allowed to cool.

[0078] Under the sintering condition B, the temperature was raised at a temperature rise rate of 10° C./min while pressurizing under the pressurizing pressures shown in Tables 1 and 2, and the temperature was held at 700° C. (intermediate temperature) for 1 hour. Then, the temperature was raised to the sintering temperature shown in Tables 1 and 2 at a temperature rise rate of 10° C./min, and the temperature was held at the sintering temperature for 2 hours. After that, the pressure was released and the mixture was allowed to cool.

[0079] Under the sintering condition C, the temperature was raised to the sintering temperature without holding at the intermediate temperature, and the temperature was held at the sintering temperature for 2 hours. After that, the pressure was released and the mixture was allowed to cool.

[0080] Under the sintering condition D, the temperature was raised at a temperature rise rate of 10° C./min while pressurizing under the pressurizing pressures shown in Tables 1 and 2, and the temperature was held at 800° C. for 1 hour. Then, the temperature was raised to the sintering temperature shown in Tables 1 and 2 at a temperature rise rate of 10° C./min, and the temperature was held at the sintering temperature for 2 hours. After that, the pressure was released and the mixture was allowed to cool.

[0081] In “HIP”, a metal can filled with the raw material powder in a vacuum-sealed state was placed in a pressure vessel of a hot isostatic pressing device that carries out a hot isostatic pressing method, and it is held at the pressure, the sintering temperature shown in FIGS. 1 and 2 for 2 hours, and the sintering was performed.

[0082] In the “atmospheric firing”, a die was filled with raw material powder and compression molded by uniaxial molding to obtain a molded body. This molded body was charged into an atmosphere furnace and held at the sintering temperatures shown in Tables 1 and 2 for 20 hours to perform the sintering.

[0083] The obtained sintered body was machined, and a disc-shaped tungsten oxide sputtering target having a diameter of 152.4 nm and a thickness of 6 mm or a cylindrical tungsten oxide sputtering target having a length of 600 nm using four objects having an external diameter of 155 mm, an inner diameter of 135 mm, and a length in an axial direction of 150 mm, was manufactured. In the sintered body manufactured by the “HP”, the machining was performed so that the surface orthogonal to the pressurizing surface became a sputtering surface.

[0084] The obtained tungsten oxide sputtering target was evaluated for the following items.

(Composition of Tungsten Oxide Sputtering Target)

[0085] A measurement sample was collected from the obtained tungsten oxide sputtering target, this measurement sample was pulverized in a mortar, and X was confirmed by the method for quantifying X of the WO.sub.X described above. As a result, it was confirmed that there was no change in X from the blended WO, powder. The evaluation results are shown in Tables 1 and 2.

[0086] Regarding the measurement of the degree of oxidation of Examples 14 to 21 of the present invention to which the oxide of the additive metal is added, first, an observation sample was collected from the obtained tungsten oxide sputtering target, this was embedded in an epoxy resin so that the cross section parallel to the sputtering surface is an observation surface, a polishing treatment was performed, and then, an element distribution image showing composition distribution of the elements was observed by using a field emission type electron probe microanalyzer (EPMA). In addition, in the observation with EPMA, an image of an observation field of view of 0.005 mm.sup.2 (magnification: 500 times) was captured. In any five points of a region of the obtained element mapping image of W where W is detected, the quantitative analysis using standard samples of W and O was performed, and an average value of values obtained by measuring the degree of oxidation of W was shown in a column of WO.sub.X value of Tables 1 and 2.

[0087] In addition, in Examples 14 to 21 of the present invention in which the oxide of the additive metal was added, fragments of the obtained tungsten oxide sputtering target to which the oxide of the additive metal was added were ground in a Menou mortar, and the powder was dissolved with acid or alkali. After that, the amount of the additive metal was measured by an ICP emission analyzer.

(X-Ray Diffraction Analysis of Sputtering Surface and Cross Section Orthogonal to Sputtering Surface)

[0088] From the obtained tungsten oxide sputtering target, a measurement sample was collected so that the sputtering surface and the cross section orthogonal to the sputtering surface are measurement surfaces, and the measurement surfaces were wet-polished with SiC-Paper (grit180).

[0089] The X-ray diffraction analysis was performed under the following conditions by using RINT-ULtima/PC manufactured by Rigaku Denki Co., Ltd.

[0090] Tube: Cu

[0091] Tube voltage: 40 kV

[0092] Tube current: 50 mA

[0093] Scanning range (2θ): 5° to 80°

[0094] Slit size: divergence (DS) ⅔ degree, scattering (SS) ⅔ degree, light receiving (RS) 0.8 mm

[0095] Measurement step width: 0.02 degrees at 2θ

[0096] Scan speed: 2 degrees per minute

[0097] Sample table rotation speed: 30 rpm

[0098] A surface index of the obtained X-ray diffraction peak was confirmed using a PDF card number: 1-084-1516 (W.sub.18O.sub.49).

[0099] The ratio I.sub.S(103)/I.sub.S(010) of the diffraction intensity I.sub.S(103) of the (103) plane to the diffraction intensity I.sub.S(010) of the (010) plane of W.sub.18O.sub.49 of the sputtering surface and the ratio I.sub.C(103)/I.sub.C(010) of the diffraction intensity I.sub.C(103) of the (103) plane to the diffraction intensity I.sub.C(010), of the (010) plane of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface were calculated. The evaluation results are shown in Tables 3 and 4.

(Density)

[0100] A density at room temperature was measured from the dimension and weight of the measurement sample. The measurement results are shown in Tables 3 and 4.

(Area Ratio of W.sub.18O.sub.49 Phase)

[0101] First, an observation sample was collected from the obtained tungsten oxide sputtering target, this was embedded in an epoxy resin so that the cross section parallel to the sputtering surface is an observation surface, a polishing treatment was performed, and then, an element distribution image showing composition distribution of the elements was observed by using a field emission type electron probe microanalyzer (EPMA). In addition, in the observation with EPMA, five images of an observation field of view of 0.005 mm.sup.2 (magnification: 500 times) were captured, and the area of the W.sub.18O.sub.49 phase observed in the images was measured. The measurement results are shown in Tables 3 and 4.

[0102] The area ratio of the W.sub.18O.sub.49 phase can be measured by the following procedures (a) to (e).

[0103] (a) The generated phase on the observation surface of the observation sample is confirmed by X-ray diffraction analysis under the conditions described above.

[0104] (b) The phase analyzed as W.sub.18O.sub.49 phase in (a) is identified in the observation field of view by element analysis of EPMA.

[0105] (c) Five images of the observation field of view of COMPO image (60 μm×80 μm) having a magnification of 500 times were captured by EPMA.

[0106] (d) The W.sub.18O.sub.49 phase identified in (b) is extracted by commercially available image analysis software, and the captured image is converted into a monochrome image and binarized. As the image analysis software, for example, WinRoof Ver. 5.6.2 (manufactured by Mitani Corporation) and the like can be used.

[0107] (e) From all the binarized images, a total area of all W.sub.18O.sub.49 phase is calculated and divided by the area of all binarized regions, and the area ratio of the W.sub.18O.sub.49 phase with respect to the entire observation region is calculated.

(Occurrence State of Abnormal Discharge in Sputtering Test)

[0108] The sputtering was performed continuously for 1 hour using a DC magnetron sputtering apparatus under the conditions of ultimate vacuum degree of 5×10.sup.−5 Pa or less, a sputtering Ar gas pressure of 0.3 Pa, and a sputtering output of DC 300 W. At this time, the number of times of occurrences of abnormal discharge per hour of sputtering was counted using an arc counter attached to the power supply of the DC magnetron sputtering apparatus. The evaluation results are shown in Tables 3 and 4.

[0109] In Tables 3 and 4, “initial stage” is a result of a sputtering test after performing the pre-sputtering for 1 hour. A “middle stage” is a result of a sputtering test in a state where a depth of the erosion portion reaches ½ of a target thickness. A “final stage” is a result of a sputtering test in a state where a residual thickness of the target in the erosion portion is 1 mm.

(Alkali Resistance)

[0110] Using the DC magnetron sputtering device, a 100 nm film was formed on a glass substrate under the conditions of ultimate vacuum degree of 5×10.sup.−5 Pa or less, a sputtering Ar gas pressure of 0.3 Pa, a sputtering output of 300 W, Ar gas of 90 sccm, and oxygen gas of 10 sccm. The obtained film was immersed in a 2.38 mass % aqueous solution of tetramethylammonium hydroxide (TMAH), and the time until the film disappeared was measured and shown in Table 3. In a case where it was 60 seconds or longer, it was determined that the product has alkali resistance that can withstand the wiring step (development of the photoresist step).

TABLE-US-00001 TABLE 1 Raw material Sintering step powder Sintering Pressur- Sputtering target WO.sub.X temper- izing WO.sub.X Value Oxide of additive metal (mol %) Sintering ature pressure Value M/ of X Nb.sub.2O.sub.5 Ta.sub.2O.sub.5 T.sub.1O.sub.2 ZrO.sub.2 Y.sub.2O.sub.3 Al.sub.2O.sub.3 SiO.sub.2 Method condition ° C. MPa Shape of X (W + M) Examples  1 2.62 — — — — — — — HP A 1200 20 Plate 2.62 — of the  2 2.62 — — — — — — — HP A 1200 35 Plate 2.62 — present  3 2.62 — — — — — — — HP A 1200 10 Plate 2.62 — invention  4 2.62 — — — — — — — HP A 1200  8 Plate 2.62 —  5 2.40 — — — — — — — HP A 850 20 Plate 2.40 —  6 2.40 — — — — — — — HP A 900 20 Plate 2.40 —  7 2.40 — — — — — — — HP A 1200 20 Plate 2.40 —  8 2.10 — — — — — — — HP A 1200 35 Plate 2.10 —  9 2.10 — — — — — — — HP A 1200 10 Plate 2.10 — 10 2.82 — — — — — — — HP A 1200 20 Plate 2.82 — 11 2.62 — — — — — — — HP A 1200 20 Cylinder 2.62 — 12 2.62 — — — — — — — HP B 1200 20 Plate 2.62 — 13 2.90 — — — — — — — HP A 900 25 Plate 2.90 — 14 2.90 10 — — — — — — HP A 900 25 Plate 2.89* 0.18 15 2.90 25 — — — — — — HP A 900 25 Plate 2.58* 0.40 16 2.72 50 — — — — — — HP A 900 25 Plate 2.70* 0.67 17 2.90 — 15 — — — — — HP A 1200 35 Plate 2.61* 0.26 18 2.72 — — 20 — — — — HP A 1100 35 Plate 2.63* 0.15 19 2.90 — — — 10 — — — HP A 1100 35 Plate 2.60* 0.10 20 2.90 — — — — 5 — — HP A 1100 35 Plate 2.61* 0.11 21 2.90 — — — — — 15 — HP A 1100 35 Plate 2.62* 0.26 22 2.90 — — — — — — 15 HP A 1100 35 Plate 2.82* 0.14

TABLE-US-00002 TABLE 2 Raw material Sintering step powder Sintering Pressur- Sputtering target WO.sub.X temper- izing WO.sub.X Value Oxide of additive metal (mol %) Sintering ature pressure Value M/ of X Nb.sub.2O.sub.5 Ta.sub.2O.sub.5 T.sub.1O.sub.2 ZrO.sub.2 Y.sub.2O.sub.3 Al.sub.2O.sub.3 SiO.sub.2 Method condition ° C. MPa Shape of X (W + M) Compar-  1 2.62 — — — — — — — HP C 1200 20 Plate 2.62 — ative  2 2.62 — — — — — — — HIP — 1200 98 Plate 2.62 — example  3 2.62 — — — — — — — Atmo- — 1200 — Plate 3.00 — spheric firing  4 2.40 — — — — — — — HP C  850 20 Plate 2.40 —  5 2.40 — — — — — — — HP C 1200 10 Plate 2.10 —  6 2.06 — — — — — — — HP A 1200 20 Plate 2.06 —  7 2.86 — — — — — — — HP A 1200 20 Plate 2.86 —  8 2.62 — — — — — — — HP D 1200 20 Plate 2.62 —  9 2.62 — — — — — — — HIP — 1200 98 Plate 2.62 — 10 2.90 — — 70 — — — — HP A 1200 25 Plate 2.87* 0.70

TABLE-US-00003 TABLE 3 Number of times of occurrences of Alkali Area Diffraction intensity ratio abnormal discharge resistance ratio of I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 phase in sputtering test of film after W.sub.18O.sub.49 Sputtering Cross (time/hour) atmosphere phase surface section Density Initial Middle Final heat % I.sub.S(103)/I.sub.S(010) I.sub.C(103)/I.sub.C(010) g/cm.sup.3 stage stage stage treatment Examples of  1 85 0.17 2.12 8.18 1 3 2 20 the present  2 84 0.14 2.54 8.19 0 1 0 20 invention  3 86 0.36 1.31 8.02 0 3 0 21  4 85 0.37 0.65 8.01 0 1 1 19  5 56 0.32 1.45 6.85 2 1 4 24  6 55 0.29 1.44 7.53 2 1 3 22  7 56 0.31 1.41 8.68 3 3 0 20  8 38 0.29 1.18 9.02 1 1 1 27  9 37 0.38 0.55 8.82 3 2 3 29 10 94 0.18 2.02 7.82 6 4 8 19 11 85 0.23 1.81 8.18 1 3 2 18 12 85 0.20 1.99 8.17 0 1 0 19 13 88 0.30 0.69 6.13 0 0 0 21 14 80 0.35 0.61 4.05 1 0 0 465 15 58 0.38 0.62 3.52 0 1 2 >600 16 37 0.26 0.75 3.33 1 4 3 >600 17 64 0.15 2.28 7.39 4 4 6 >600 18 89 0.22 1.12 6.74 6 5 3 >600 19 92 0.25 1.35 7.03 0 0 0 64 20 84 0.23 1.23 5.76 0 0 1 392 21 74 0.20 1.10 5.57 0 2 1 >600 22 80 0.21 1.13 5.36 1 1 3 >600

TABLE-US-00004 TABLE 4 Number of times of occurrences of Alkali Area Diffraction intensity ratio abnormal discharge resistance ratio of I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 phase in sputtering test of film after W.sub.18O.sub.49 Sputtering Cross (time/hour) atmosphere phase surface section Density Initial Middle Final heat % I.sub.S(103)/I.sub.S(010) I.sub.C(103)/I.sub.C(010) g/cm.sup.3 stage stage stage treatment Comparative  1 86 1.32 1.33 8.19 0 267 422 — example  2 85 1.65 1.69 8.20 0 183 378 —  3  0 (No (No 6.98 Unable to perform — corresponding corresponding DC sputtering peak) peak) (no conductivity)  4 54 0.72 0.78 6.81 6 470 1991 —  5 35 0.45 0.50 8.83 1 173 163 —  6 28 0.36 0.88 8.99 258 468 328 —  7 23 0.18 2.02 7.32 Discharge stopped due to great abnormal discharge  8 85 0.87 1.30 5.57 103 682 1032 —  9 85 1.64 1.62 8.17 0 203 286 — 10 24 0.26 0.75 4.89 Discharge stopped — due to great abnormal discharge

[0111] In Comparative Example 1, the sintering was performed under the sintering condition C by hot pressing (HP), but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface was beyond the range of the present invention. In the sputtering test, the number of times of occurrence of abnormal discharge was 267 times at the middle stage and 422 times at the final stage, and DC sputtering could not be performed stably for a long period of time.

[0112] In Comparative Example 2, the sintering was performed by hot isostatic pressing method (HIP), but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface was beyond the range of the present invention. In the sputtering test, the number of times of occurrence of abnormal discharge was 183 times at the middle stage and 378 times at the final stage, and DC sputtering could not be performed stably for a long period of time.

[0113] In Comparative Example 3, as a result of the atmospheric firing, the W.sub.18O.sub.49 phase was not confirmed, and DC sputtering could not be performed.

[0114] In Comparative Example 4, the sintering was performed under the sintering condition C by hot pressing (HP), but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface was beyond the range of the present invention. In the sputtering test, the number of times of occurrence of abnormal discharge was 6 times at the initial stage, 470 times at the middle stage, and 1991 times at the final stage, and DC sputtering could not be performed stably.

[0115] In Comparative Example 5, the sintering was performed under the sintering condition C by hot pressing (HP), but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface and the diffraction intensity ratio I.sub.C(103)/I.sub.C(010) of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface were beyond the range of the present invention. In the sputtering test, the number of times of occurrence of abnormal discharge was 173 times at the middle stage and 163 times at the final stage, and DC sputtering could not be performed stably for a long period of time.

[0116] In Comparative Example 6, WO.sub.X (X=2.06) was obtained and the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface was low as 28%. In the sputtering test, the number of times of occurrence of abnormal discharge was 258 times at the initial stage, and DC sputtering could not be performed stably. It is surmised that it is because there was a large amount of WO.sub.2 phase.

[0117] In Comparative Example 7, WO.sub.X (X=2.86) was obtained, the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface was low as 23%, and abnormal discharge occurred frequently during DC sputtering and the discharge was stopped. Accordingly, the sputtering could not be performed. It is surmised that it is because there was a large amount of WO.sub.3 phase.

[0118] In Comparative Example 8, the sintering was performed under the sintering condition D by hot pressing (HP), but the density was low and sufficient sintering could not be performed. In addition, the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface was beyond the range of the present invention. In the sputtering test, the number of times of occurrence thereof was 103 times at the initial stage, 682 times at the middle stage, and 1032 times at the final stage, and DC sputtering could not be performed stably.

[0119] In Comparative Example 9, the sintering was performed by hot isostatic pressing method (HIP), but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface was beyond the range of the present invention. In the sputtering test, the number of times of occurrence thereof was 203 times at the middle stage and 286 times at the final stage, and DC sputtering could not be performed stably.

[0120] In Comparative Example 10, 70 mol % of TiO.sub.2 was contained, the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface was low as 24%, and abnormal discharge occurred frequently during DC sputtering and the discharge was stopped. Accordingly, the sputtering could not be performed.

[0121] In contrast, in Examples 1 to 10 and 13 of the present invention, as a result of the sintering performed under the sintering condition A by hot pressing (HP), the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface and the diffraction intensity ratio I.sub.C(103)/I.sub.C(010) of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface were in the ranges of the present invention, and the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface was also in the range of the present invention. In Examples 1 to 10 and 13 of the present invention, the number of times of occurrence of abnormal discharges was small at the initial, middle, and final stages of the sputtering test, and DC sputtering could be stably performed for a long period of time.

[0122] In addition, in Example 11 of the present invention, the sintering was performed under the sintering condition A by hot pressing (HP), the cylindrical tungsten oxide sputtering target was manufactured, but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface and the diffraction intensity ratio I.sub.C(103)/I.sub.C(010) of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface were in the ranges of the present invention, the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface was also in the range of the present invention, and the area ratio of the W.sub.18O.sub.49 phase was also in the range of the present invention. The number of times of occurrence of abnormal discharges was small at the initial, middle, and final stages of the sputtering test, and DC sputtering could be stably performed for a long period of time.

[0123] In addition, in Example 12 of the present invention, as a result of the sintering performed under the sintering condition B by hot pressing (HP), the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface and the diffraction intensity ratio I.sub.C(103)/I.sub.C(010) of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface were in the ranges of the present invention, and the area ratio of the W.sub.18O.sub.49 phase of the surface parallel to the sputtering surface was also in the range of the present invention. The number of times of occurrence of abnormal discharges was small at the initial, middle, and final stages of the sputtering test, and DC sputtering could be stably performed for a long period of time.

[0124] In addition, in Examples 14 to 22 of the present invention, the oxide of the additive metal was added, but the diffraction intensity ratio I.sub.S(103)/I.sub.S(010) of W.sub.18O.sub.49 of the sputtering surface and the diffraction intensity ratio I.sub.C(103)/I.sub.C(010) of W.sub.18O.sub.49 of the cross section orthogonal to the sputtering surface were in the range of the present invention and the area ratio of the W.sub.18O.sub.49 phase was also in the range of the present invention. The number of times of occurrence of abnormal discharges was small at the initial, middle, and final stages of the sputtering test, and DC sputtering could be stably performed for a long period of time. The alkali resistance was greatly improved, compared to Examples 1 to 13 of the present invention in which the oxide of the additive metal was not added.

[0125] As described above, according to the present invention, it was confirmed that it is possible to provide a tungsten oxide sputtering target capable of suppressing occurrence of abnormal discharge, although the sputtering proceeds, stably performing sputtering film formation for a long period of time.

INDUSTRIAL APPLICABILITY

[0126] According to the present invention, it is possible to provide a tungsten oxide sputtering target capable of suppressing occurrence of abnormal discharge, although the sputtering proceeds, stably performing sputtering film formation for a long period of time, and extending the service life.