Apparatus for carrying out polarization resolved Raman spectroscopy
11397109 · 2022-07-26
Assignee
Inventors
Cpc classification
G02B21/361
PHYSICS
International classification
Abstract
An apparatus for carrying out polarization resolved Raman spectroscopy on a sample (15), in particular a crystalline sample, comprises: at least one light source (11), in particular at least one laser, for providing excitation radiation to a sample (15), a spectrograph (31) for dividing light from the sample (15), in particular Raman scattered light from the sample (15), into at least one spectrum of spatially separated wavelength components and for directing at least a portion of the at least one spectrum to a detector (29), in particular a CCD detector, a polarization state control element (27) for the light from the sample (15), the polarization state control element (27) being arranged in a light path of at least one light beam (25) traveling from the sample (15) towards the detector (29), and the polarization state control element (27) comprising at least one polarization sensitive optical element (45, 47), in particular a Wollaston prism, the at least one polarization sensitive optical element being adapted to split the at least one light beam (25) into at least two, in particular orthogonally, polarized light beams (35a, 35b, 37a, 37b).
Claims
1. An apparatus for carrying out polarization resolved Raman spectroscopy on a sample, the apparatus comprising: at least one light source for providing excitation radiation to a sample, a spectrograph for dividing light from the sample into at least one spectrum of spatially separated wavelength components and for directing at least a portion of the at least one spectrum to a detector), a polarization state control element for the light from the sample, the polarization state control element being arranged in a light path of at least one light beam traveling from the sample towards the detector, and the polarization state control element comprising at least one polarization sensitive optical element, the at least one polarization sensitive optical element being adapted to split the at least one light beam into at least two polarized light beams.
2. The apparatus of claim 1, wherein the polarization state control element further comprises at least one beam splitter adapted to split the light beam into at least two split beams and at least two polarization sensitive optical elements arranged such that at least one of the at least two split beams is passing through one of the polarization sensitive optical elements and at least another one of the at least two split beams passes through the other one of the polarization sensitive optical elements.
3. The apparatus of claim 2, wherein a waveplate is arranged in at least one light path between the beam splitter and one of the polarization sensitive optical elements.
4. The apparatus of claim 1, wherein the polarization state control element comprises at least one beam splitter adapted to split the light beam into three split beams, and three polarization sensitive optical elements arranged such that a first one of the three split beams is passing through a first one of the polarization sensitive optical elements, a second one of the three split beams is passing through a second one of the three polarization sensitive optical elements, and a third one of the three split beams is passing through a third one of the three polarization sensitive optical elements.
5. The apparatus of claim 4, wherein a waveplate is arranged in at least one light path between the beam splitter and one of the three polarization sensitive optical elements.
6. The apparatus of claim 4, wherein a first waveplate is arranged in the light path between the beam splitter and the first polarization sensitive optical element.
7. The apparatus of claim 4, wherein a second waveplate is arranged in the light path between the beam splitter and the second polarization sensitive optical element.
8. The apparatus of claim 4, wherein no waveplate is arranged in the light path between the beam splitter and the third polarization sensitive optical element.
9. The apparatus of claim 1, wherein the polarization state control element is arranged in the light path between the sample and the spectrograph.
10. The apparatus of claim 1, wherein at least one beam splitter is arranged in the light path between the light source and the sample, the beam splitter being adapted to split a light beam from the light source into at least a first beam and a second beam.
11. The apparatus of claim 10, wherein a waveplate, preferably a half-wave plate or a quarter-wave plate, is arranged in the light path of at least the second beam in between the beam splitter and the sample, for generating a polarization manipulated second beam, and wherein, preferably, at least one beam combiner is provided to combine at least the first beam and the polarization manipulated second beam and to direct the combined beams onto the sample, preferably generating at least two spatially separated spots in the same focal plane on the sample.
12. The apparatus of claim 10, wherein the at least one beam splitter is adapted to split the light beam from the light source into a first beam, a second beam, and a third beam, wherein, preferably, a waveplate, preferably a half-wave plate or a quarter-wave plate, is arranged in the light path of the second beam in between the beam splitter and the sample, for generating a polarization manipulated second beam, and wherein, further preferably, a further waveplate, preferably a half-wave plate or a quarter-wave plate, is arranged in the light path of the third beam in between the beam splitter and the sample, for generating a polarization manipulated third beam.
13. The apparatus of claim 12, wherein at least one beam combiner is provided to combine the first beam, the polarization manipulated second beam and the polarization manipulated third beam and to direct the combined beams onto the sample, preferably generating three spatially separated spots in the same focal plane on the sample.
14. The apparatus of claim 1, wherein at least one beam combiner is provided to combine two or more light beams from two or more different light sources and to direct the combined beams onto the sample, preferably to separated spots in the same focal plane on the sample.
15. The apparatus of claim 14, wherein the light beam from at least one of the light sources is a polarization manipulated beam.
16. The apparatus of claim 1, wherein the sample is a crystalline sample, the at least one light source comprises at least one laser, the light from the sample is Raman scattered light, and the detector is a CCD detector.
17. The apparatus of claim 1, wherein the polarization sensitive optical element is a Wollaston prism.
18. The apparatus of claim 1, wherein the at least one polarization sensitive optical element is adapted to split the at least one light beam into at least two orthogonally polarized light beams.
19. The apparatus of claim 3, wherein the waveplate is a half-wave plate or a quarter-wave plate.
20. The apparatus of claim 4, wherein the beam splitter is adapted to split the light beam into three parallel beams.
Description
(1) One or more examples will hereinafter be described in conjunction with the following drawing figures, where like numerals denote like elements, and
(2)
(3)
(4)
(5)
(6) The apparatus shown in
(7) The orthogonally laser beams 13 are slightly deviating in their propagation direction and thus, the objective focuses them to two spatially separated spots 303, 305 as shown in the window 301 obtained from a photo of the focal plane on the sample 15.
(8) The optical setup is arranged in a backscattering geometry such that the objective 23 also serves for collecting the light scattered from the sample 15, in particular from the two illuminated spots 303, 305. The backscattered light beam 25, at least the spectral components of the backscattered light beam that are different from the spectral components of the laser beam 13, can pass through the dichroic mirror 17 and enter a polarization state control element 27 for the light beam 25 scattered from the sample 15.
(9) The polarization state control element 27 is arranged in the light path of the light beam 25 collected by the objective 23 and traveling towards a detector 29 and before the light path passes through a spectrograph 31. The polarization state control element 27 comprises a beam splitter 33 adapted to split the light beam 25 into a first split beam 35 and a second split beam 37, which are traveling in parallel to each other after the first split beam 35 is reflected by mirror 39.
(10) The first beam 35 passes through a half-wave plate 41 while the second beam 37 passes through an optical element 43, for example a quarter-wave plate, which may also chance the polarization state of the second beam 37.
(11) Subsequently, the first beam 35 passes through a first polarization sensitive optical element, here a first Wollaston prism 45, which splits the first beam 35 into two orthogonally polarized beams 35a, 35b which are depicted in
(12) The optical system of the apparatus of
(13) The spectrograph 31 comprises a collimation lens system 53 having a focus in the slit. The collimation lens system 53 transfers the beams 35a, 35b, 37a, 37b into collimated beams which may pass through an optional edge filter (not shown) and a transmission grating 55.
(14) The grating 55 divides each of the beams 35a, 35b, 37a, 37b into a respective spectrum of spatially separated wavelength components and directs at least a portion of each spectrum via a focusing lens system 57 on an array of pixels 59 of the detector 29 to detect the spectrum of each polarized beam 35a, 35b, 37a, 37b.
(15) Window 307 shows the spectra measured on the array of pixels 59. As can be seen, eight different spectra can be measured simultaneously. The spectra are separated from each other along the y-axis. The spots that are spatially distributed along the x-axis are associated with the different wavelengths contained in each spectrum.
(16) The eight spectra are due to the fact that the sample 15 is illuminated in 2 spots with 2 beams of different polarization. Therefore, the backscattered beam 25 comprises in fact two backscattered Raman beams due to the 2 spots 303, 305 and the different polarizations of the incident light. Sample responses from different incident laser polarization are therefore collected simultaneously. Furthermore, the beam splitter 33 splits each of the two backscattered Raman beams such that they pass through each Wollaston prism 45, 47. Hence, each of the polarized beams 35a, 35b, 37a, 37b comprises in fact two beams due to their origin from 2 spots illuminated with different laser polarization. Hence, in total 8 beams leave the Wollaston prisms and pass through the entrance slit 51 of the spectrograph 31. This is shown in window 309 which is derived from a photo of the plane of the slit 51 and which shows that eight beams travel through slit 51 where they are spatially separated from each other. This explains the eight spectra that are detectable on the array of pixels 59.
(17) The optical setup of the apparatus of
(18) The apparatus of
(19) As explained with respect to
(20) The optical setup of the apparatus of
(21) The path of the backscattered light corresponds in substance to the path as described above with respect to
(22) As an option, the optical setup of the apparatus of
(23) Thus, per incoming beam, the three Wollaston prisms generate six outgoing beams that travel towards the spectrograph 31. The three beams originating from Raman scattering in the spots 313, 315, 315 may therefore result in 18 beams which leave the three Wollaston prisms. Consequently, 18 spectra can be detected on the array of pixels of detector 29 as shown in window 319.
(24) The optical setup of the apparatus of
(25) Information obtained from the measured spectra can be used in an algorithm as described, for example, in the previously mentioned article of Ramabadran et al. The algorithm can be based on Raman tensor scattering theory. Thereby, crystallographic maps of the sample can be obtained, for example by using the same principles as in X-ray crystallography.
LIST OF REFERENCE SIGNS
(26) 11 light source, laser
(27) 11a laser
(28) 11b laser
(29) 11c laser
(30) 13 laser beam
(31) 15 sample
(32) 17 dichroic mirror
(33) 19 mirror
(34) 21 mirror
(35) 23 objective
(36) 25 light beam
(37) 27 polarization state control element
(38) 29 detector
(39) 31 spectrograph
(40) 33 beam splitter
(41) 35 first split beam
(42) 35a polarized beam
(43) 35b polarized beam
(44) 37 second split beam
(45) 37a polarized beam
(46) 37b polarized beam
(47) 39 mirror
(48) 41 half-wave plate
(49) 43 optical element
(50) 45 first Wollaston prism
(51) 47 second Wollaston prism
(52) 49 lens system
(53) 51 slit
(54) 53 collimation lens system
(55) 55 grating
(56) 57 focusing lens system
(57) 59 array of pixel
(58) 61 laser
(59) 63 beam splitter
(60) 65 beam
(61) 67 beam
(62) 69 half-wave plate
(63) 71 beam
(64) 73 mirror
(65) 75 beam splitter
(66) 77 optical element
(67) 79 optical element, line filter
(68) 81 optical element, polarizer
(69) 83 optical element, polarizer
(70) 85 mirror
(71) 87 beam splitter
(72) 89 beam
(73) 91 beam
(74) 93 beam
(75) 95 waveplate
(76) 97 waveplate
(77) 99 beam splitter
(78) 101 beam splitter
(79) 301 window
(80) 303 spot
(81) 305 spot
(82) 307 window
(83) 309 window
(84) 311 window
(85) 313 spot
(86) 315 spot
(87) 317 spot
(88) 319 window
(89) 321 window
(90) 323 window