INDUCTION DEVICE
20210410238 · 2021-12-30
Inventors
- Pablo Jesus Hernandez Blasco (Zaragoza, ES)
- Ignacio Lope Moratilla (Zaragoza, ES)
- Paul Muresan (La Cartuja, ES)
- Jose Manuel Palacios Gasos (Zaragoza, ES)
- Diego Puyal Puente (Zaragoza, ES)
- Francisco Villuendas Lopez (Zaragoza, ES)
Cpc classification
H05B6/1272
ELECTRICITY
H05B2213/03
ELECTRICITY
International classification
Abstract
An induction device includes an induction unit including a sensor unit which is arranged above the induction unit in a mounted position and includes a plurality of activity sensor elements arranged in a distributed manner and configured to detect a sensor parameter in the form of an activity parameter of the induction unit. A control unit is provided to analyze the sensor parameter.
Claims
1-14. (canceled)
15. An induction device, comprising: an induction unit including a sensor unit which is arranged above the induction unit in a mounted position and includes a plurality of activity sensor elements arranged in a distributed manner and configured to detect a sensor parameter in the form of an activity parameter of the induction unit; and a control unit configured to analyze the sensor parameter.
16. The induction device of claim 15, constructed in the form of an induction cooktop device.
17. The induction device of claim 15, wherein, when looking at a perpendicular projection of a placement surface, which is at least defined by the induction unit, onto one plane, the sensor unit extends over a surface portion of at least 50% of a surface spanned by the placement surface in the plane.
18. The induction device of claim 15, wherein the sensor unit includes a plurality of presence sensor elements arranged in a distributed manner and configured to detect a sensor parameter in the form of a presence parameter of an object.
19. The induction device of claim 18, wherein at least one of the activity sensor elements and at least one of the presence sensor elements are configured as a single piece with one another.
20. The induction device of claim 15, wherein at least one of the activity sensor elements includes an induction coil.
21. The induction device of claim 15, further comprising a unit, said sensor unit including a plurality of temperature sensor elements arranged in a distributed manner and configured to detect a sensor parameter in the form of a temperature parameter of the unit.
22. The induction device of claim 21, wherein at least one of the activity sensor elements and at least one of the temperature sensor elements are arranged on different layers of a substrate of the sensor unit.
23. The induction device of claim 21, wherein at least one of the activity sensor elements and at least one of the temperature sensor elements are connected electrically in series.
24. The induction device of claim 21, wherein at least one of the activity sensor elements and at least one of the temperature sensor elements are configured as a single piece with one another.
25. The induction device of claim 21, wherein, when looking at a perpendicular projection of the sensor unit onto one plane, at least one of the activity sensor elements and at least one of the temperature sensor elements are arranged so that they overlap at least in one section.
26. The induction device of claim 21, wherein at least one of the temperature sensor elements is configured as a thermistor or RTD.
27. The induction device of claim 21, wherein a number of activity sensor elements and a number of temperature sensor elements are identical.
28. The induction device of claim 15, wherein, when looking at a perpendicular projection of the sensor unit onto one plane, at least one of the activity sensor elements has a surface extension of maximum 25 cm.sup.2 in the plane.
29. An induction appliance, comprising an induction device, said induction device comprising an induction unit including a sensor unit which is arranged above the induction unit in a mounted position and includes a plurality of activity sensor elements arranged in a distributed manner and configured to detect a sensor parameter in the form of an activity parameter of the induction unit, and a control unit configured to analyze the sensor parameter.
30. The induction appliance of claim 29, constructed in the form of an induction cooktop
Description
IN THE DRAWING
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[0057] The induction device 10a has a placement plate 32a. In the present exemplary embodiment the placement plate 32a is in the form of a cooktop plate. In a mounted state the placement plate 32a forms part of a cooktop outer housing, in particular a cooktop outer housing in particular of the induction appliance 30a. The placement plate 32a is provided for the placement of cookware 38a (see
[0058] The induction device 10a has a plurality of induction units 12a for heating cookware 38a (see
[0059] In a mounted position the induction unit 12a is arranged below the placement plate 32a. The induction unit 12a is provided to heat cookware 38a positioned on the placement plate 32a above the induction unit 12a. In the present exemplary embodiment the induction unit 12a is configured as an induction heating unit.
[0060] The induction device 10a has an operator interface 34a for inputting and/or selecting operating parameters (see
[0061] The induction device 10a comprises a control unit 16a. The control unit 16a is provided to perform actions and/or change settings as a function of operating parameters input by means of the operator interface 34a. In an operating state the control unit 16a regulates an energy supply to the induction unit 12a.
[0062] The control unit 16a is provided to analyze and/or process at least one sensor parameter detected by a sensor unit 14a. The induction device 10a comprises the sensor unit 14a (see
[0063] When looking at a perpendicular projection of the placement surface 22a, which is defined at least by the induction unit 12a, onto one plane, the sensor unit 14a extends over a surface portion of substantially 100% of a surface spanned by the placement surface 22a in the plane. When the sensor unit 14a and placement surface 22a are extended in a perpendicular manner into one plane, in the present exemplary embodiment a surface spanned by the sensor unit 14a in the plane and a surface spanned by the placement surface 22a in the plane are substantially congruent.
[0064] The sensor unit 14a is provided to detect at least one sensor parameter. In the present exemplary embodiment the sensor unit 14a is provided to detect at least three different sensor parameters, in particular at least three different sorts and/or types of sensor parameter. To detect the three different sorts and/or types of sensor parameter the sensor unit 14a has three sensor elements 18a, 24a, 26a, each being provided to detect one of the different sorts and/or types of sensor parameter.
[0065] The sensor unit 14a has a substrate 36a (see
[0066] The sensor unit 14a has a plurality of presence sensor elements 18a arranged in a distributed manner (see
[0067] The presence sensor elements 18a are provided to detect at least one sensor parameter in the form of a presence parameter of at least one object 20a. The object 20a is part of the induction device 10a. In the present exemplary embodiment at least one object 20a is the cookware 38a. The presence sensor elements 18a are provided to detect at least one sensor parameter in the form of a presence parameter of the cookware 38a. In the operating state the presence sensor elements 18a detect at least one sensor parameter in the form of a presence parameter of the object 20a and/or the cookware 38a.
[0068] Each of the presence sensor elements 18a has at least one induction coil. In the operating state the presence sensor elements 18a detect the sensor parameter in the form of a presence parameter of the object 20a and/or the cookware 38a by means of a change in an impedance and/or a resonant frequency of the induction coil.
[0069] The sensor unit 14a has a plurality of activity sensor elements 24a arranged in a distributed manner (see
[0070] The activity sensor elements 24a are provided to detect at least one sensor parameter in the form of an activity parameter of the induction unit 12a. In the operating state the activity sensor elements 24a detect at least one sensor parameter in the form of an activity parameter of the induction unit 12a. Each of the activity sensor elements 24a has at least one induction coil.
[0071] A number of activity sensor elements 24a and a number of presence sensor elements 18a are identical. The activity sensor elements 24a and the presence sensor elements 18a are configured as a single piece with one another. One of the activity sensor elements 24a and one of the presence sensor elements 18a respectively are configured as a single piece with one another.
[0072] The sensor unit 14a has a plurality of temperature sensor elements 26a arranged in a distributed manner (see
[0073] The temperature sensor elements 26a are provided to detect at least one sensor parameter in the form of a temperature parameter of at least one unit 28a. In the operating state the temperature sensor elements 26a detect at least one sensor parameter in the form of a temperature parameter of at least one unit 28a.
[0074] The unit 28a is part of the induction device 10a. In the present exemplary embodiment at least one unit 28a is the placement plate 32a. The temperature sensor elements 26a are provided to detect at least one sensor parameter in the form of a temperature parameter of the placement plate 32a. In the operating state the temperature sensor elements 26a detect at least one sensor parameter in the form of a temperature parameter of the unit 28a and/or the placement plate 32a. Each of the temperature sensor elements 26a is configured as a thermistor or RTD. In the operating state the temperature sensor elements 26 detect the sensor parameter in the form of a temperature parameter of the unit 28a and/or the placement plate 32a by means of a change in an electrical resistance of the respective temperature sensor element 26a as a function of a temperature.
[0075] A number of activity sensor elements 24a and a number of temperature sensor elements 26a are identical. A number of presence sensor elements 18a and a number of temperature sensor elements 26a are identical.
[0076] One of the presence sensor elements 18a and one of the temperature sensor elements 26a respectively are configured differently from one another. One of the activity sensor elements 24a and one of the temperature sensor elements 26a respectively are configured differently from one another. Each of the presence sensor elements 18a and each of the temperature sensor elements 26a are configured differently from one another. Each of the activity sensor elements 24a and each of the temperature sensor elements 26a are configured differently from one another.
[0077] In the present exemplary embodiment one of the presence sensor elements 18a and one of the temperature sensor elements 26a respectively are arranged on different layers of the substrate 36a of the sensor unit 14a. One of the activity sensor elements 24a and one of the temperature sensor elements 26a respectively are arranged on different layers of the substrate 36a of the sensor unit 14a. Each of the presence sensor elements 18a and each of the temperature sensor elements 26a are arranged on different layers of the substrate 36a of the sensor unit 14a. Each of the activity sensor elements 24a and each of the temperature sensor elements 26a are arranged on different layers of the substrate 36a of the sensor unit 14a.
[0078] When looking at a perpendicular projection of the sensor unit 14a onto one plane, one of the activity sensor elements 24a and one of the temperature sensor elements 26a respectively are arranged so that they overlap in sections and advantageously completely (see
[0079] In the present exemplary embodiment, when looking at a perpendicular projection of the sensor unit 14a onto one plane, each of the presence sensor elements 18a has a surface extension of substantially 9 cm.sup.2 in the plane. When looking at a perpendicular projection of the sensor unit 14a onto one plane, each of the presence sensor elements 18a has a surface extension of substantially 3×3 cm.sup.2 in the plane.
[0080] In the present exemplary embodiment, when looking at a perpendicular projection of the sensor unit 14a onto one plane, each of the activity sensor elements 24a has a surface extension of substantially 9 cm.sup.2 in the plane. When looking at a perpendicular projection of the sensor unit 14a onto one plane, each of the activity sensor elements 24a has a surface extension of substantially 3×3 cm.sup.2 in the plane.
[0081] In the present exemplary embodiment, when looking at a perpendicular projection of the sensor unit 14a onto one plane, each of the temperature sensor elements 26a has a surface extension of substantially 9 cm.sup.2 in the plane. When looking at a perpendicular projection of the sensor unit 14a onto one plane, each of the temperature sensor elements 26a has a surface extension of substantially 3×3 cm.sup.2 in the plane.
[0082] The sensor unit 14a has a plurality of electrical resonant circuits 50a (see
[0083] The sensor unit 14a in particular has one resonant capacitance 54a per resonant circuit 50a. The resonant capacitance 54a and the presence sensor element 18a, in particular the induction coil of the presence sensor element 18a, are connected electrically in series. In the present exemplary embodiment the resonant capacitance 54a is configured as a capacitor.
[0084] The sensor unit 14a has one oscillator 52a, in particular per resonant circuit 50a. In the present exemplary embodiment the oscillator 52a comprises a Clapp oscillator.
[0085] One of the presence sensor elements 18a, the resonant capacitance 54a and the oscillator 52a are part of the resonant circuit 50a. When an object 20a approaches the presence sensor element 18a, the presence sensor element 18a detects the object 20a, in particular by means of a change, advantageously by means of an increase, in an inductance of the induction coil.
[0086] The sensor unit 14a has a plurality of electrical driver circuits 56a (see
[0087] The sensor unit 14a has one electrical resistance 58a, in particular per driver circuit 56a. The electrical resistance 58a and the presence sensor element 18a, in particular the induction coil of the presence sensor element 18a, are connected electrically in series. In the present exemplary embodiment the electrical resistance 58a is configured as an electrical cross resistance.
[0088] The sensor unit 14a has one energy source 60a, in particular per driver circuit 56a. The energy source 60a is provided to supply electrical energy for the presence sensor element 18a. In the operating state the control unit 16a operates the presence sensor element 18a, in particular by means of the energy source 60a, at a fixed frequency. In the operating state the control unit 16a detects an impedance of the presence sensor element 18a.
[0089] When an object 20a approaches the presence sensor element 18a, the presence sensor element 18a detects the object 20a in particular by means of a change, advantageously by means of an increase, in an inductance of the induction coil.
[0090] In the operating state the control unit 16a detects an electric voltage at a first measurement point 62a, which is located on a side of the presence sensor element 18a facing the resistance 58a. In the operating state the control unit 16a detects an electric voltage at a second measurement point 64a, which is located on a side of the presence sensor element 18a facing away from the resistance 58a. In the operating state the control unit 16a calculates an impedance of the presence sensor element 18a from the detected electric voltages and from the electrical resistance 58a.
[0091] It is assumed in the following that the electric voltage at the first measurement point 62a is V1 and the electric voltage at the second measurement point 64a is V2 and Rs is the electrical resistance 58a. In the operating state the control unit 16a determines an impedance Z of the presence sensor element 18a using the following formula:
Z=Rs (V2−V1)/V1 1.
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[0093] A continuous progression curve 48a shows a progression of the normalized inductance of one of the induction coils. A broken progression curve 46a shows a progression of the normalized frequency of one of the induction coils.
[0094] It can be seen from
[0095] It can be seen from
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[0098] One of the presence sensor elements 18b and one of the temperature sensor elements 26b respectively are configured differently from one another. One of the activity sensor elements 24b and one of the temperature sensor elements 26b respectively are configured differently from one another. Each of the presence sensor elements 18b and each of the temperature sensor elements 26b are configured differently from one another. Each of the activity sensor elements 24b and each of the temperature sensor elements 26b are configured differently from one another.
[0099] In the present exemplary embodiment one of the presence sensor elements 18b and one of the temperature sensor elements 26b respectively are connected electrically in series. One of the activity sensor elements 24b and one of the temperature sensor elements 26b respectively are connected electrically in series.
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REFERENCE CHARACTERS
[0101] 10 Induction device [0102] 12 Induction unit [0103] 14 Sensor unit [0104] 16 Control unit [0105] 18 Presence sensor element [0106] 20 Object [0107] 22 Placement surface [0108] 24 Activity sensor element [0109] 26 Temperature sensor element [0110] 28 Unit [0111] 30 Induction appliance [0112] 32 Placement plate [0113] 34 Operator interface [0114] 36 Substrate [0115] 38 Cookware [0116] 40 First y-axis [0117] 42 Second y-axis [0118] 44 x-axis [0119] 46 Progression curve [0120] 48 Progression curve [0121] 50 Resonant circuit [0122] 52 Oscillator [0123] 54 Resonant capacitance [0124] 56 Driver circuit [0125] 58 Resistance [0126] 60 Energy source [0127] 62 First measurement point [0128] 64 Second measurement point