FILL LEVEL MEASUREMENT DEVICE

Abstract

Disclosed are methods for checking the operational reliability of a radar-based fill level measurement device, which operates according to the pulse time-of-flight method. The methods include detecting controlled variables of the fill level measurement device, such as the signal amplification or the sampling rate. By comparing the controlled variable with a corresponding limit value, it can be determined whether the fill level measurement device is operationally reliable or whether the operational reliability of the fill level measurement device has been lost with increasing operating times because of the degradation of electrical components. It is also advantageous that, on the basis of the methods according to the invention, it is possible to make a prediction according to the principle of “predictive maintenance” regarding how much remaining operating time is estimated to be left until a possible functional failure of the fill level measurement device.

Claims

1-9. (canceled)

10. A method for checking the operational reliability of a radar-based fill level measurement device which is used to measure a fill level of a filling material located in a container, the method comprising: emitting microwave pulses in a clocked manner in a direction of the filling material at a defined clock rate; receiving reflected microwave pulses after reflection at a surface of the filling material; generating an evaluation signal by sampling the received microwave pulses at a defined sampling rate; measuring a ratio of the clock rate to the sampling rate; adjusting the ratio to a target ratio by regulating the sampling rate by means of a controlled variable in relation to the target ratio such that the ratio corresponds to the target ratio; and rating the fill level measurement device as operationally reliable when the controlled variable does not exceed or fall below a defined limit value.

11. The method according to claim 10, further comprising: when the controlled variable does not exceed the limit value, ascertaining a change function of the controlled variable over progressing fill level measurement cycles; and calculating on the basis of the current controlled variable and on the basis of the change function a remaining operating time until the limit value is reached.

12. A method for checking the operational reliability of a radar-based fill level measurement device which is used to measure a fill level of a filling material located in a container, the method comprising: emitting microwave pulses in a clocked manner in a direction of the filling material at a defined clock rate; receiving reflected microwave pulses after reflection at a surface of the filling material; generating an evaluation signal by sampling the received microwave pulses at a defined sampling rate; measuring an amplitude and/or an amplitude offset of the evaluation signal, the amplitude and/or the amplitude offset being regulated by means of a first controlled variable or a second controlled variable; and rating the fill level measurement device as operationally reliable when the first controlled variable and/or the second controlled variable do not exceed/fall below a defined first limit value or a second limit value.

13. The method according to claim 12, further comprising: when the first controlled variable does not exceed the first limit value, ascertaining a first change function of the first controlled variable over progressing fill level measurement cycles; and calculating on the basis of the current first controlled variable and on the basis of the first change function a remaining operating time until the first limit value is reached.

14. The method according to claim 12, further comprising: when the second controlled variable does not exceed the second limit value, ascertaining a second change function of the second controlled variable over progressing fill level measurement cycles; and calculating on the basis of the current second controlled variable and on the basis of the second change function a remaining operating time until the second limit value is reached.

15. The method according to claim 13, wherein a suitable function type of the first change function is ascertained by means of a least squares method.

16. The method according to claim 14, wherein a suitable function type of the second change function is ascertained by means of a least squares method.

17. The method according to claim 12, further comprising: measuring a temperature at the fill level measurement device, wherein the first limit value and/or the second limit value are defined as a temperature-dependent function.

18. A radar-based fill level measurement device, comprising: a pulse generating unit designed to generate high-frequency electrical pulses at a defined clock rate; a transceiver unit designed to: emit the high-frequency pulses as microwave pulses in a direction of a filling material; and receive reflected microwave pulses after reflection at a surface of the filling material; a sampling unit designed to generate electrical sampling pulses at a defined sampling rate; a mixer designed to: mix the received microwave pulses with the sampling pulses to generate an evaluation signal; and control an amplitude offset of the evaluation signal; a detector designed to measure a ratio of the sampling rate of the sampling pulses to the clock rate of the high-frequency pulses; and an evaluation unit designed to: adjust the ratio to a target ratio by regulating the sampling rate by means of a first controlled variable in relation to the target ratio such that the ratio corresponds to the target ratio; measure the amplitude or the amplitude offset of the evaluation signal, the amplitude and/or the amplitude offset being compensated by means of a second controlled variable or a third controlled variable in the evaluation signal; determine the fill level on the basis of the evaluation signal; and rate itself as not operationally reliable when the first controlled variable, the second controlled variable, or the third controlled variable exceeds or falls below the corresponding limit value.

19. The radar-based fill level measurement device according to claim 18, wherein the evaluation unit is designed to transmit a potential lack of operational reliability to a higher-level unit.

Description

[0045] The invention is explained in more detail with reference to the following figures. The following is shown:

[0046] FIG. 1: a typical arrangement of a radar-based fill level measurement device,

[0047] FIG. 2: a circuit design of the fill level measurement device,

[0048] FIG. 3: an evaluation curve generated by the fill level measurement device, and

[0049] FIG. 4: a calculation of the remaining operating time of the fill level measurement device.

[0050] For a basic understanding of the invention, FIG. 1 shows a typical arrangement of a freely radiating, radar-based fill level measurement device 1 on a container 2. In the container 2 is a filling material 3, whose fill level L is to be determined by the fill level measurement device 1. For this purpose, the fill level measurement device 1 is mounted on the container 2 above the maximum permissible fill level L. Depending on the field of application, the height h of the container 2 can be up to 125 m.

[0051] As a rule, the fill level measurement device 1 is connected via a bus system, such as “Ethernet,” “PROFIBUS,” “HART,” or “Wireless HART,” to a higher-level unit 4, such as a process control system or a decentralized database. On the one hand, information about the operating status of the fill level measurement device 1 can thus be communicated. On the other hand, information about the fill level L can also be transmitted via the bus system in order to control any inflows or outflows that may be present at the container 2.

[0052] Since the fill level measurement device 1 shown in FIG. 1 is designed as freely radiating radar, it comprises a corresponding antenna 121. As indicated, the antenna 121 can be designed as a horn antenna, for example. Regardless of the design, the antenna 121 is oriented in such a way that corresponding microwave pulses S.sub.HF are emitted in the direction of the filling material 3 according to the pulse time-of-flight method.

[0053] The microwave pulses E.sub.HF are reflected at the surface of the filling material 3 and, after a corresponding signal time-of-flight, are received as electrical reception signals e.sub.HF at the antenna 121. The signal time-of-flight of the microwave pulses S.sub.HF, E.sub.HF depends on the distance d=h−L of the fill level measurement device 1 from the filling material surface.

[0054] A circuit design of the fill level measurement device 1 with which the microwave pulses S.sub.HF can be generated and with which the fill level L can be determined on the basis of the electrical reception signals e.sub.HF is shown in FIG. 2:

[0055] In order to generate the microwave pulses S.sub.HF, the circuit of the fill level measurement device 1 shown in FIG. 2 comprises a pulse generating unit. The pulse generating unit is designed to generate high-frequency electrical pulses s.sub.HF at a defined clock rate f.sub.c. For this purpose, the pulse generating unit in the shown exemplary embodiment comprises a first pulse generator 110, which actuates a first high-frequency oscillator 111. The frequency of the microwave pulses S.sub.HF, E.sub.HF is established by the oscillation frequency of the high-frequency oscillator 111. In the simplest case, the high-frequency oscillator 111 can be designed as an oscillating crystal. A VCO (voltage-controlled oscillator) can also be used. In this case, the high-frequency oscillator 111 is actuated by the pulse generator 110 by means of a DC voltage signal. The pulse generator 110 thereby defines the pulse duration of the individual microwave pulses S.sub.HF and the clock rate f.sub.c at which the microwave pulses S.sub.HF are emitted. As standard, a semiconductor-based digital resonant circuit is used as the high-frequency oscillator 111. In practice, the clock rate is between 100 KHz and 1 MHz.

[0056] The high-frequency pulses s.sub.HF thereby generated by the high-frequency oscillator 111 are supplied to the antenna 121 via a duplexer 120 so that they are correspondingly emitted as microwave pulses S.sub.HF. Since the reflected microwave pulses E.sub.HF are additionally received via the antenna 121, the duplexer 120 supplies the corresponding electrical reception signal e.sub.HF to a mixer 14.

[0057] In contrast to the shown embodiment variant, an electrically conductive probe, such as a waveguide or a coaxial cable, which extends toward the container bottom can be used instead of the antenna 121. In contrast to the circuit shown in FIG. 2, in the implementation of this embodiment variant known by the term TDR (time-domain reflectometry), the high-frequency oscillators 111, 131 are not required.

[0058] By means of the mixer 14, the undersampling of the reception signal e.sub.HF characteristic of the pulse time-of-flight method is carried out. For this purpose, the reception signal e.sub.HF is mixed with electrical sampling pulses s′.sub.HF by the mixer 14. In the process, the sampling rate f′.sub.c at which the sampling pulses s′.sub.HF are generated deviates by a defined, low ratio φ of much less than 0.1 per thousand from the clock rate f.sub.c of the generated high-frequency pulses s.sub.HF. Depending on the type of the mixer 14, it can be designed such that a potential amplitude offset ΔA of the evaluation signal ZF can be set or compensated by means of a corresponding second control signal v.sub.ΔA. Depending on the design of the mixer 14, an analog voltage or current signal or a digital signal is to be applied as the second control signal v.sub.ΔA. In the circuit of the fill level measurement device 1 shown in FIG. 2, the amplitude offset ΔA of the evaluation signal ZF at the mixer 14 is regulated by an evaluation unit 16.

[0059] The sampling pulses s′.sub.HF are generated by a sampling unit, which analogously to the pulse generating unit, comprises a second pulse generator 130 and second high-frequency oscillator 131. Thus, correspondingly to the high-frequency pulses s.sub.HF, the frequency f.sub.HF of the sampling pulses s′.sub.HF is defined by the second high-frequency oscillator 131. The second pulse generator 130 controls the sampling rate f′.sub.c at which the sampling pulses s′.sub.HF are generated.

[0060] For the correct determination of the fill level L on the basis of the evaluation signal ZF, it is essential for the sampling rate f′.sub.c of the sampling unit to correspond exactly to its target sampling rate: This means that the relation φ to clock rate f.sub.c of the pulse generating unit corresponds to a required target relation φ.sub.ref. In order to ensure that the sampling rate f′.sub.c does not drift therefrom, it is accordingly regulated. In the exemplary embodiment shown in FIG. 2, the regulation takes place by a detector 15, which measures the ratio (p of the clock rate f.sub.c to the sampling rate f′.sub.c downstream of the first pulse generator 110 or the second pulse generator 130. This can be technically implemented, for example, by the detector 15 measuring, over a plurality of phases, a change in the time shift between the positive edge at the first pulse generator 110 and the positive edge at the second pulse generator 130.

[0061] From the change in the time shift, the evaluation unit 16 calculates the ratio φ of the clock rate f.sub.c to the sampling rate f′.sub.c. The evaluation unit 16 additionally adjusts the ascertained ratio φ of the clock rate of f.sub.c to the sampling rate f′.sub.c to a stored target ratio φ.sub.ref. This allows the evaluation unit 16 to regulate the sampling rate f′.sub.c at the second pulse generator 130 as a function of the measured ratio φ in such a way that the ratio φ coincides with the target ratio φ.sub.ref, of, for example, 1.0001.

[0062] In the embodiment variant shown in FIG. 2, the evaluation unit 16 regulates the second pulse generator 130 by means of a corresponding first control signal v.sub.R. Depending on the design of the second pulse generator 130, the first control signal v.sub.R can again be an analog voltage or current signal or a digital signal.

[0063] By mixing the reception signal e.sub.RF with the electrical sampling pulses s′.sub.HF by means of the mixer 14, an evaluation signal ZF is generated, which represents the reception signal e.sub.HF in a time-expanded manner. In the process, the time expansion factor changes proportionally to the ratio φ of the clock rate f.sub.c to the sampling rate f′.sub.c.

[0064] The advantage of the time expansion is that the evaluation signal ZF can be evaluated considerably more easily from a technical point of view due to the time expansion in comparison with the pure reception signal e.sub.HF: The reason for this is that the reception signal e.sub.HF, due to the high speed of propagation of the microwave pulses S.sub.HF, E.sub.HF at the speed of light, has an accordingly short time scale in the nanosecond range. As a result of the time expansion, the evaluation signal ZF is given a time scale between 100 kHz and 5 MHz.

[0065] In order to adjust the evaluation signal in terms of the level, an amplifier 17 is arranged between the mixer 14 and the evaluation unit 16 in the shown exemplary embodiment in order to adapt the signal amplitude A of the evaluation signal ZF as a whole. The regulation can again be carried out by the evaluation unit 16 in that the amplification factor x is readjusted as a function of the evaluation signal ZF detected by the evaluation unit 16. As an alternative or in addition to an external regulation of the amplitude gain x or of the amplitude offset ΔA by means of the amplifier 17 or by means of the mixer 14, the evaluation unit 16 can also be designed to correct the evaluation signal ZF only internally or digitally by the amplitude gain x or the amplitude offset ΔA, without external readjustment of the incoming evaluation signal ZF taking place.

[0066] A schematic evaluation curve ZF is shown in FIG. 3: The evaluation unit 16 of the fill level measurement device 1 determines the fill level L on the basis of the evaluation signal ZF in that the evaluation unit 16 ascertains the maximum of the evaluation signal ZF which was caused by the surface of the filling material 3 (for illustration, only this amplitude maximum is shown in the schematic evaluation signal ZF illustrated in FIG. 3). After the maximum has been ascertained, the distance d corresponding to the maximum is determined. Thus, the evaluation unit 16 can determine the fill level L according to the relationship L=h−d.

[0067] As the operation of the fill level measurement device 1 continues, the risk of individual components of the respective circuit units 11, 12, 13, 14, 15, 16, 17 degrading increases. For example, oscillators 111, 131 may be detuned, impedances may change, or capacitances of capacitors may decrease. Depending on the circuit unit 11, 12, 13, 14, 15, 16, 17, this can result in either an erroneous evaluation curve ZF being generated or no evaluation curve ZF being able to be generated at all. In both cases, the fill level measurement device 1 is thus no longer operationally reliable.

[0068] The idea according to the invention for checking the operational reliability is based on assessing the operational reliability of the fill level measurement device 1 on the basis of the first controlled variable v.sub.R, the second controlled variable v.sub.x, or the third controlled variable v.sub.ΔA: If none of the controlled variables v.sub.R, v.sub.x, v.sub.ΔA exceeds or falls below a corresponding, previously defined limit value v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max, the fill level measurement device 1 is rated as operationally reliable. In the process, the checking can be carried out by the evaluation unit 16, i.e., the fill level measurement device 1 itself, by measuring the value of the respective controlled variable v.sub.R, v.sub.x, v.sub.ΔA (for example as a voltage value or as a binary value in the present case) and comparing it to the corresponding limit value v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max. If the evaluation unit 16 detects that the limit value v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max has been exceeded or fallen below, depending on the sign of the limit value v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max, and thus detects the lack of operational reliability, the evaluation unit 16 can, for example, report this to the higher-level unit 4.

[0069] Since the controlled variables v.sub.R, v.sub.x, v.sub.ΔA, in addition to a potential degradation of the electrical components 11, 12, 13, 14, 15, 16, 17, are also dependent on the temperature at the fill level measurement device 1, it is advantageous in those cases if the respective limit values v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max are defined as a function that is dependent on the temperature and are stored in the evaluation unit 16. In this case, the evaluation unit 16 is to be equipped with a corresponding temperature sensor, so that, on the basis of the temperature-dependent function and the currently measured temperature, the respectively suitable limit value v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max can be used to assess the operational reliability.

[0070] The method according to the invention can also be developed in such a way that a prediction can be made as to when the fill level measurement device 1 is expected to no longer be operationally reliable. A precondition for this is that the limit value v.sub.R,max, v.sub.x,mas, v.sub.ΔA,max is currently not yet exceeded, i.e., the fill level measurement device 1 is still operationally reliable at present. Such a prediction can be used to be able to schedule maintenance or a replacement of the fill level measurement device 1 at an early stage on the part of the plant operator according to the principle of “predictive maintenance.”

[0071] It is possible to calculate an anticipated remaining operating time Δt until a lack of operational reliability occurs in that the evaluation unit 16, over progressing fill level measurement cycles, i.e., with increasing operating time of the fill level measurement device 1, continuously records at least one of the controlled variables v.sub.R, v.sub.x, v.sub.ΔA and, based thereon, ascertains a corresponding change function dv.sub.R/dt, dv.sub.x/dt, dv.sub.ΔA/dt of the respective controlled variable v.sub.R, v.sub.x, v.sub.ΔA. On the basis of the value of the current controlled variable v.sub.R, v.sub.x, v.sub.ΔA and on the basis of the respective change function dv.sub.R/dt, dv.sub.x/dt, dv.sub.ΔA/dt, the evaluation unit 16 is able to calculate a corresponding remaining operating time Δt until the first limit value v.sub.R,max, v.sub.x,max, v.sub.ΔA,max is likely reached. In the event that for two or all of the controlled variables v.sub.R, v.sub.x, v.sub.ΔA, a different remaining operating time Δt is calculated, the evaluation unit 16 can, for example, define the shortest of the ascertained remaining operating times Δt as the applicable remaining operating time Δt.

[0072] The determination of the remaining operating time Δt is shown schematically in FIG. 4: For illustrative purposes, an approximately linear increase in the controlled variable v.sub.R, v.sub.x, v.sub.ΔA is shown with increasing operating time of the fill level measurement device 1. Accordingly, a linear function can be used in FIG. 4 as the function type of the change function dv.sub.R/dt, dv.sub.x/dt, dv.sub.ΔA/dt in the exemplary embodiment shown. In general, the change function dv.sub.R/dt, dv.sub.x/dt, dv.sub.ΔA/dt, however, can possibly not be optimally approximated by a linear function so that, for example, a polynomial function supplies an improved approximation to the progression of the respective controlled variable v.sub.R, v.sub.x, v.sub.ΔA over the past measurement cycles. Accordingly, the evaluation unit 16 can be programmed, for example, in such a way that it ascertains a suitable function type of the corresponding change function dv.sub.R/dt, dv.sub.x/dt, dv.sub.ΔA/dt by means of the least squares method. In this way, the remaining operating time Δt can be predicted with even greater precision.

LIST OF REFERENCE SIGNS

[0073] 1 Fill level measurement device

[0074] 2 Container

[0075] 3 Filling material

[0076] 4 Higher-level unit

[0077] 14 Mixer

[0078] 15 Detector

[0079] 16 Evaluation unit

[0080] 17 Amplifier

[0081] 110 First pulse generator

[0082] 111 First high-frequency oscillator

[0083] 120 Duplexer

[0084] 121 Antenna

[0085] 130 Second pulse generator

[0086] 131 Second high-frequency oscillator

[0087] A Amplitude

[0088] d Distance

[0089] E.sub.HF Reflected microwave pulses

[0090] e.sub.HF Reception signal

[0091] f.sub.c Clock rate

[0092] f′.sub.c Sampling rate

[0093] f.sub.HF Frequency of microwave pulses

[0094] h Installation height

[0095] L Fill level

[0096] S.sub.HF Microwave pulses

[0097] s.sub.HF High-frequency pulses

[0098] s′.sub.HF Sampling pulses

[0099] v.sub.R First controlled variable

[0100] v.sub.x Second controlled variable

[0101] v.sub.ΔA Third controlled variable

[0102] v.sub.R,max First limit value

[0103] v.sub.x,max Second limit value

[0104] v.sub.ΔA,max Third limit value

[0105] ZF Evaluation signal

[0106] ΔA Amplitude offset

[0107] Δt Remaining operating time

[0108] φ Ratio of the clock rate to the sampling rate

[0109] φ.sub.ref Target ratio

[0110] dv.sub.R/dt First change function

[0111] dv.sub.x/dt Second change function

[0112] dv.sub.ΔA/dt Third change function